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Analysis of the DC-arc behavior of a novel 3D-active fuse

: Dorp, J. vom; Berberich, S.E.; Bauer, A.J.; Ryssel, H.


Ashburn, P.:
Papers selected from the 38th European Solid-State Device Research Conference, ESSDERC 2008 : Held in Edinburgh, UK in September 2008
Amsterdam: Elsevier, 2009 (Solid-state electronics 53.2009, Nr.7)
ISSN: 0038-1101
European Solid State Device Research Conference (ESSDERC) <38, 2008, Edinburgh>
Conference Paper, Journal Article
Fraunhofer IISB ()

In this work, the DC-arc behavior of an active fuse integrated into a CMOS process is described. The purpose of this fuse is to prevent serious hazards in power electronics in the case of a malfunction of a single power-transistor. The focus of this work is on the characterization of functionality and reliability of the "cutout-bridge". Different cutout-bridge geometries and the DC-arc behavior during fuse release are analyzed. It is shown that a significant increase in release time occurs, when a DC-arc across the cutout-bridge is ignited at voltages above 20V. By integrating a snubber device into the circuit, the DC-arc behavior will be clearly reduced and the release time of the fuse will be decreased significantly.