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Components and methods for highest resolution computed tomography

: Uhlmann, N.; Salamon, M.; Burtzlaff, S.; Nachtrab, F.; Hanke, R.; Porsch, F.; Johansson, W.

Deutsche Gesellschaft für Zerstörungsfreie Prüfung e.V. -DGZfP-, Berlin:
International Symposium on NDT in Aerospace : December 3rd to 5th, 2008, Fürth, Germany
Berlin: DGZfP, 2008 (DGZfP-Berichtsbände 114)
ISBN: 978-3-940283-12-2
International Symposium on NDT in Aerospace <2008, Fürth>
Conference Paper
Fraunhofer IIS ()
Fraunhofer IZFP ()

For structural and material characterisation and analysis of biological and technical specimen with resolutions below the micrometer scale level a big effort is required in experimental setup e.g. at synchrotron sources or in test object preparation including destructive methods like grinding for the investigation within an electron microscope. Two concepts to enable X-ray imaging for material and structural investigation with real sub-µm resolution are presented: a sub-µm computed tomography (CT) setup and a radioscopy system with resolutions below the 200 nm range.