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Microscopic Techniques for Characterization of Magnetic Layers

 
: Meyendorf, N.; Altpeter, I.; Netzelmann, U.; Hoffmann, J.; Nichtl-Pecher, W.; Grimm, H.; Netzelmann, U.; Matikas, T.

Baaklini, G.Y.; Meyendorf, N.; Matikas, T.; Gilmore, R. ; Materials Research Society -MRS-:
Nondestructive Methods for Materials Characterization
Pittsburgh, Pa.: MRS, 2000 (Materials Research Society symposia proceedings 591)
ISBN: 1-55899-499-8
pp.145-150
Symposium "Nondestructive Methods for Materials Characterization" <1999, Boston/Mass.>
English
Conference Paper
Fraunhofer IZFP ()
micro-magnetic technique; layer; magnetic properties

Abstract
In recent years increasing interest in magnetic materials especially amorphous and nanocrystalline layers has arised. Due to the magnetostrictive and magnetoresistive properties magnetic materials obtained high importance in sensor, actuator and memory applications. Therefore new methods to characterize magnetic and mechanical porperties of magnetic materials are required. Two new microscopic techniques will be presented in this paper.

: http://publica.fraunhofer.de/documents/N-1012.html