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Mechanical stress on the nanoscale

Simulation, material systems and characterization techniques
 
: Hanbücken, M.; Müller, P.; Wehrspohn, R.B.

:

Weinheim: Wiley-VCH, 2011, XXI, 358 pp.
ISBN: 3-527-41066-X
ISBN: 978-3-527-41066-8
ISBN: 978-3-527-63956-4
ISBN: 978-3-527-63954-0
ISBN: 978-3-527-63955-7
English
Book
Fraunhofer IWM ( IMWS) ()

Abstract
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.

: http://publica.fraunhofer.de/documents/H-55661.html