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OCM 2013, Optical characterization of materials. Conference proceedings

Held in Karlsruhe, Germany from March 6 - 7, 2013
: Beyerer, Jürgen; Puente Leon, Fernando; Längle, Thomas

Fulltext urn:nbn:de:0072-321434 (12 MByte PDF)
MD5 Fingerprint: c84596130e86f15017a977f31d8049ec
Created on: 24.9.2013


Karlsruhe: KIT Scientific Publishing, 2013, X, 285 pp.
Conference "Optical Characterization of Materials" (OCM) <2013, Karlsruhe>
ISBN: 978-3-86644-965-7
ISBN: 978-3-86644-956-7 (Falsche ISBN!)
Conference Proceedings, Electronic Publication
Fraunhofer IOSB ()

The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.