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Recombination lifetimes of iron-contaminated silicon wafers: Characterization using a single set of capture cross-sections

 
: Rommel, M.; Zoth, G.; Ullrich, M.; Ryssel, H.

:

Diffusion and defect Data. B, Solid State Phenomena 82/84 (2002), pp.373-380
ISSN: 1012-0394
ISSN: 0377-6883
English
Journal Article
Fraunhofer IIS B ( IISB) ()

: http://publica.fraunhofer.de/documents/B-85759.html