Characterization device for diode-laser-stack beam propagation

High beam quality can be achieved by accurate adjustment of the mechanical and microoptical components in the manufacturing process of high power diode laser stacks. A characterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization.