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Characterization device for diode-laser-stack beam propagation

: Roehner, M.; Muentz, H.; Schroeder, O.; Boucke, K.; Poprawe, R.


Exarhos, G.J. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.; Lawrence Livermore National Laboratory; Wissenschaftliche Gesellschaft Lasertechnik -WLT-:
Laser-induced damage in optical materials 2002. Proceedings : 34th Boulder Damage Symposium, 16 - 18 September 2002, Boulder, Colorado, 7th International Workshop on Laser Beam and Optics Characterization, 18 - 19 September 2002, Boulder, Colorado
Bellingham/Wash.: SPIE, 2003 (SPIE Proceedings Series 4932)
ISBN: 0-8194-4727-7
International Workshop on Laser Beam and Optics Characterization (LBOC) <7, 2002, Boulder/Colo.>
Annual Boulder Damage Symposium <34, 2002, Boulder/Colo.>
Symposium on Optical Materials for High-Power Lasers <34, 2002, Boulder/Colo.>
Conference Paper
Fraunhofer ILT ()
high power diode laser; stack; beam quality; propagation; characterization

High beam quality can be achieved by accurate adjustment of the mechanical and microoptical components in the manufacturing process of high power diode laser stacks. A characterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization.