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Advanced defect characterisation by combining temperature- and injection-dependent lifetime spectroscopy (TDLS and IDLS)

 
: Rein, S.; Lichtner, P.; Warta, W.; Glunz, S.W.

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IEEE Electron Devices Society:
29th IEEE Photovoltaic Specialists Conference 2002. Proceedings : May 20-24, 2002 Hyatt Regency New Orleans New Orleans, Louisiana
New York, NY: IEEE, 2002
ISBN: 0-7803-7471-1
pp.190-193
Photovoltaic Specialists Conference <29, 2002, New Orleans/La.>
English
Conference Paper
Fraunhofer ISE ()

: http://publica.fraunhofer.de/documents/B-82652.html