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Size analysis of nanocrystals in semiconductor doped glasses with anomalous small-angle X-ray and raman scattering
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2000
Journal Article
Titel
Size analysis of nanocrystals in semiconductor doped glasses with anomalous small-angle X-ray and raman scattering
Author(s)
Irmer, G.
Monecke, J.
Verma, P.
Goerigk, G.
Herms, M.
Zeitschrift
Journal of applied physics
DOI
10.1063/1.1305462
Language
English
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Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP