• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Size analysis of nanocrystals in semiconductor doped glasses with anomalous small-angle X-ray and raman scattering
 
  • Details
  • Full
Options
2000
Journal Article
Title

Size analysis of nanocrystals in semiconductor doped glasses with anomalous small-angle X-ray and raman scattering

Author(s)
Irmer, G.
Monecke, J.
Verma, P.
Goerigk, G.
Herms, M.
Journal
Journal of applied physics  
DOI
10.1063/1.1305462
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024