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Modular approach of a high current MOS compact model for ESD circuit level simulation
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1999
Conference Paper
Title
Modular approach of a high current MOS compact model for ESD circuit level simulation
Title Supplement
Including transient gate coupling behavior
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Author(s)
Mergens, M.
Wilkening, W.
Mettler, S.
Wolf, H.
Fichtner, W.
Mainwork
IEEE International Reliability Physics Symposium 1999. Proceedings
Conference
International Reliability Physics Symposium 1999
DOI
10.1109/RELPHY.1999.761609
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM