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  4. Modular approach of a high current MOS compact model for ESD circuit level simulation
 
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1999
Conference Paper
Title

Modular approach of a high current MOS compact model for ESD circuit level simulation

Title Supplement
Including transient gate coupling behavior
Author(s)
Mergens, M.
Wilkening, W.
Mettler, S.
Wolf, H.
Fichtner, W.
Mainwork
IEEE International Reliability Physics Symposium 1999. Proceedings  
Conference
International Reliability Physics Symposium 1999  
DOI
10.1109/RELPHY.1999.761609
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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