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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

T-Ellipsometry - a new method for characterization of thin film properties

 
: Kahle, O.; Uhlig, C.; Bauer, M.

Institute of Materials, London:
Adhesion '99. 7th International Conference on Adhesion and Adhesives
London, 1999
pp.147-148
International Conference on Adhesion and Adhesives <7, 1999, Cambridge>
English
Conference Paper
Fraunhofer IZM, Einrichtung Polymermaterialien und Composite ( PYCO) ()

: http://publica.fraunhofer.de/documents/B-63002.html