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T-Ellipsometry - a new method for characterization of thin film properties
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1999
Conference Paper
Titel
T-Ellipsometry - a new method for characterization of thin film properties
Author(s)
Kahle, O.
Uhlig, C.
Bauer, M.
Hauptwerk
Adhesion '99. 7th International Conference on Adhesion and Adhesives
Konferenz
International Conference on Adhesion and Adhesives 1999
Language
English
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