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Laterally graded multilayer optics for X-ray analysis

 
: Bahr, D.; Brügemann, L.; Burgäzy, F.; Dietsch, R.; Göbel, H.; Holz, T.; Mai, H.; Michaelsen, C.; Ricardo, P.; Schuster, M.; Strömmer, M.

MacDonald, C.A. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
EUV, X-Ray, and neutron optics and sources
Bellingham/Wash.: SPIE, 1999 (SPIE Proceedings Series 3767)
ISBN: 0-8194-3253-9
pp.183-198
Conference on EUV, X Ray, and Neutron Optics and Sources <1999, Denver/Colo.>
English
Conference Paper
Fraunhofer IWS ()

: http://publica.fraunhofer.de/documents/B-62769.html