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Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near- infrared scanning near-field optical microscopy (NIR-SNOM)

 

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Surface and Interface Analysis 27 (1999), No.5/6, pp.486 ff
ISSN: 0142-2421
English
Journal Article
Fraunhofer IIS B ( IISB) ()

: http://publica.fraunhofer.de/documents/B-62412.html