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Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near- infrared scanning near-field optical microscopy (NIR-SNOM)
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1999
Journal Article
Titel
Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near- infrared scanning near-field optical microscopy (NIR-SNOM)
Author(s)
Dziomba, T.
Sulzbach, T.
Ohlsson, O.
Lehrer, C.
Frey, L.
Danzebrink, H.U.
Zeitschrift
Surface and Interface Analysis
DOI
10.1002/(SICI)1096-9918(199905/06)27:5/6<486::AID-SIA498>3.0.CO;2-6
Language
English
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