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Automatic generation of efficient fault lists for the defect-oriented design and test of analogue circuits

 

Institute of Electrical and Electronics Engineers -IEEE-:
5th IEEE International Mixed Signal Testing Workshop 1999 : 15 - 18 June, 1999, Delta Whistler Resort, Whistler, British Columbia, Canada
New York, NY: IEEE, 1999
pp.161-164
International Mixed Signal Testing Workshop (IMSTW) <5, 1999, Whistler/Canada>
English
Conference Paper
Fraunhofer IIS A ( IIS) ()

: http://publica.fraunhofer.de/documents/B-60909.html