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Structural characterisation of (GaAs) surface wire structure by triple axis (X-ray) grazing incidence diffraction
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1998
Journal Article
Titel
Structural characterisation of (GaAs) surface wire structure by triple axis (X-ray) grazing incidence diffraction
Author(s)
Darowski, N.
Paschke, K.
Pietsch, U.
Wang, K.
Baumbach, G.
Forchel, A.
Lübbert, D.
Baumbach, T.
Zeitschrift
Physica. B
DOI
10.1016/S0921-4526(98)00212-9
Language
English
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Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP