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Gate delay test generation for non-scan circuits
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1995
Conference Paper
Title
Gate delay test generation for non-scan circuits
Author(s)
Brakel, G. van
Gläser, U.
Kerkhoff, H.
Vierhaus, H.T.
Mainwork
The European Design and Test Conference, ED&TC 1995. Proceedings
Conference
European Design and Test Conference (ED&TC) 1995
Language
English
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