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Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation
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1994
Conference Paper
Titel
Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation
Author(s)
Gläser, U.
Vierhaus, H.T.
Kley, M.
Wiederhold, A.
Hauptwerk
IEEE/ACM International Conference on Computer-Aided Design 1994. Digest of technical papers
Konferenz
International Conference on Computer-Aided Design (ICCAD) 1994
Language
English
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