Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2011Direct density-ratio estimation with dimensionality reduction via least-squares hetero-distributional subspace search
Sugiyama, M.; Yamada, M.; Bünau, P. von; Suzuki, T.; Kanamori, T.; Kawanabe, M.
Zeitschriftenaufsatz
2005Sites and regulation of auxin biosynthesis in Arabidopsis roots
Ljung, K.; Hull, A.K.; Celenza, J.; Yamada, M.; Estelle, M.; Nonmanly, J.; Sandberg, G.
Zeitschriftenaufsatz
2001Raman studies on gaas1-xbix and inas1-xbix
Verma, P.; Oe, K.; Yamada, M.; Harima, H.; Herms, M.; Irmer, G.
Zeitschriftenaufsatz
20003D-Analyse von Eigenspannungen in einkristallinen Halbleiterwafern mittels Infrarot-Raster-Polariskopie und hochaufgelöster Röntgenbeugung
Herms, M.; Melov, V.G.; Schreiber, J.; Fukuzawa, M.; Yamada, M.
Konferenzbeitrag
2000Micro-raman investigation of InAsBi epilayers grown by MOVPE
Verma, P.; Herms, M.; Irmer, G.; Okamoto, H.; Oe, K.; Yamada, M.
Konferenzbeitrag
2000Residual strain in annealed GaAs single crystal wafers measured by scanning infrared polariscopy and x-ray diffraction
Herms, M.; Fukuzawa, M.; Melov, V.G.; Schreiber, J.; Yamada, M.
Konferenzbeitrag
2000Residual strain in annealed GaAs single crystal wafers measured by scanning infrared polariscopy and x-ray diffraction and topography
Herms, M.; Fukuzawa, M.; Melov, V.G.; Schreiber, J.; Möck, P.; Yamada, M.
Zeitschriftenaufsatz
2000Spatially Resolved Analysis of Residual Strain in Semiconductor Single Crystal Wafers by Scanning Infrared Polariscopy and High Resolution X-Ray Diffraction
Schreiber, J.; Herms, M.; Fukuzawa, M.; Yamada, M.
Konferenzbeitrag
1999Characterization of GaAs(1-x) Bi(x) Epilayers by Raman Scattering and X-ray Diffraction
Herms, M.; Melov, V.G.; Verma, P.; Irmer, G.; Okamoto, H.; Fukuzawa, M.; Oe, K.; Yamada, M.
Konferenzbeitrag
1999Dislocation Bundles in GaAs Substrates: Assessed by X-Ray and Makyoh Topography, X-Ray Diffraction, Scanning Infrared Polariscopy, Light Interferometry and Nomarski Microscopy
Möck, P.; Fukuzawa, M.; Laczik, Z.; Smith, G.W.; Brooker, G.; Yamada, M.; Herms, M.
Konferenzbeitrag
1999Photoelastic Characterization of Residual Strain in GaAs Wafers Annealed in Holders of Different Geometry
Herms, M.; Fukuzawa, M.; Yamada, M.; Klöber, J.; Zychowitz, G.; Niklas, J.
Zeitschriftenaufsatz
1999Residual Strain in Semi-Insulating InP Wafers Treated by Multiple-Step Wafer Annealing
Fukuzawa, M.; Herms, M.; Uchida, M.; Oda, O.; Yamada, M.
Zeitschriftenaufsatz