Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2010Atmospheric-pressure plasma amination of polymer surfaces
Klages, C.-P.; Hinze, A.; Willich, P.; Thomas, M.
Zeitschriftenaufsatz
2009Quantitative CD ATR-FTIR and CD SEM-EDX analyses of locally amino-functionalized polymer surfaces
Hinze, A.; Lucas, N.; Büttgenbach, S.; Schiffmann, K.; Willich, P.; Franke, R.; Frank, R.; Klages, C.-P.
Konferenzbeitrag
2006Investigations on oxygen diffusion in annealing processes of non-stoichiometric amorphous indium tin oxide thin films
Neubert, T.; Neumann, F.; Schiffmann, K.; Willich, P.; Hangleiter, A.
Zeitschriftenaufsatz
2004Oxygen grain-boundary diffusion in polycrystalline mullite ceramics
Fielitz, P.; Borchardt, G.; Schmücker, M.; Schneider, H.; Willich, P.
Zeitschriftenaufsatz
2003Analytical characterization of thin carbon films
Ohr, R.; Schug, C.; Wahl, M.; Wienss, A.; Hilgers, H.; Mahrholz, J.; Willich, P.; Jung, T.
Zeitschriftenaufsatz
2003Influence of aluminum additions on phase-formation in boron- nitride films deposited by magnetron sputtering
Pfeifer, T.; Richter, F.; Welzel, T.; Kupfer, H.; Willich, P.
Zeitschriftenaufsatz
2003Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling
Fielitz, P.; Borchardt, G.; Schmücker, M.; Schneider, H.; Willich, P.
Zeitschriftenaufsatz
2003Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling
Fielitz, P.; Borchardt, G.; Schmücker, M.; Schneider, H.; Willich, P.
Zeitschriftenaufsatz
2001SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components
Willich, P.; Steinberg, C.
Zeitschriftenaufsatz
2000Comparative analysis of a solar control coating on glass by AES, EPMA, SNMS and SIMS
Pidun, M.; Lesch, N.; Richter, S.; Karduck, P.; Bock, W.; Kopnarski, M.; Willich, P.
Zeitschriftenaufsatz
2000EPMA and quantitative MCs+-SIMS of metal-DLC coating materials
Willich, P.; Wischmann, U.
Zeitschriftenaufsatz
2000Quantitative SIMS of diamond films and coatings of diamond-carbide compound materials
Willich, P.; Wischmann, U.
Konferenzbeitrag
2000SIMS profiling and TEM of CVD films on multi-filament samples
Dietrich, D.; Willich, P.; Stöckel, S.; Weise, K.; Marx, G.
Zeitschriftenaufsatz
2000Surface oxidation of decorative hard coatings with enriched carbon content
Fleischer, W.; Trinh, T.; Kolk, G.J. van der; Hurkmans, T.; Willich, P.
Konferenzbeitrag
1999In situ boron doping of chemical-vapor-deposited diamond films
Jiang, X.; Willich, P.; Paul, M.; Klages, C.-P.
Zeitschriftenaufsatz
1999Qualitätssicherung von dünnen Schichten mittels Präzisionsverschleißmessung
Bethke, R.; Willich, P.; Runge, M.; Lutansieto, M.
Konferenzbeitrag
1998Electron probe microanalysis at low electron energies
Willich, P.
Konferenzbeitrag
1998Quantitative analysis of BN (C,O,Ar,H)-coatings using EPMA and SIMS
Willich, P.; Wischmann, U.
Zeitschriftenaufsatz
1998Quantitative depth profiling of Ti-N-C-O coating materials using MCs+-Sims
Willich, P.; Bethke, R.
Konferenzbeitrag
1997Quantitative SIMS of hydrogen in a-C:H and Metal-C:H coatings utilizing Hcs. and Ccs+
Willich, P.; Bethke, R.
Konferenzbeitrag
1996Practical aspects and applications of EPMA at low electron energies
Willich, P.; Bethke, R.
Zeitschriftenaufsatz
1995Performance and limitations of electron probe microanalysis applied to the characterization of coatings and layered structures
Willich, P.; Bethke, R.
Zeitschriftenaufsatz
1994Material selection for thin film thermocouples operating at extremely high temperatures
Bewilogua, K.; Hübsch, H.; Bethke, R.; Willich, P.; Dieckmann, M.; Bugeat, J.-P.
Konferenzbeitrag
1994Material selection for thin films thermocouples operating at extremely high temperatures
Bewilogua, K.; Hübsch, H.; Bethke, R.; Willich, P.; Dieckmann, M.; Bugeat, J.-P.
: Hecht, G.
Buch
1994Practical aspects of modern electron probe microanalysis
Willich, P.
Konferenzbeitrag
1994Quantitative Analysis of W-C:H coatings by EPMA, RBS (ERD) and SIMS
Willich, P.; Wang, M.; Wittmaack, K.
Zeitschriftenaufsatz
1994Strategy for applying microanalytical techniques
Willich, P.
Konferenzbeitrag
1994Thin surface layer (1nm-1mym) analysis with EPMA or SEM plus EDS - the principle and examples
Willich, P.; Bethke, R.
Konferenzbeitrag
1993Electron probe microanalysis of submicron coatings containing ultralight elements
Willich, P.; Bethke, R.
Konferenzbeitrag
1993Elektronenstrahl-Mikroanalyse zur Charakterisierung dünner Schichten
Willich, P.; Bethke, R.; Schiffmann, K.I.
Zeitschriftenaufsatz
1992Programs for data processing of electron probe microanalysis applied to thin films and multilayers
Willich, P.; Schiffmann, K.I.
Konferenzbeitrag
1991Characterization of thin films and multilayers by use of electron beam excited X-ray spectrometry
Willich, P.
Buch
1991Electron probe microanalysis of Y-Ba-Cu-O superconducting materials
Willich, P.
Buch
1991EPMA - A versatile technique for the characterization of thin films and layered structures
Willich, P.
Konferenzbeitrag
1991EPMA of surface oxide films
Willich, P.; Schiffmann, K.I.
Konferenzbeitrag