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| 2018 | Determination of boron and hydrogen in materials for multicrystalline solar cell production with prompt gamma activation analysis
Stieghorst, C.; Hampel, G.; Karches, B.; Krenckel, P.; Kudějová, P.; Plonka, C.; Révay, Z.; Riepe, S.; Welter, K.; Wiehl, N. | Zeitschriftenaufsatz |
| 2017 | Determination of impurity distributions in ingots of solar grade silicon by neutron activation analysis
Karches, B.; Schön, J.; Gerstenberg, H.; Hampel, G.; Krenckel, P.; Plonka, C.; Ponsard, B.; Riepe, S.; Stieghorst, C.; Wiehl, N. | Zeitschriftenaufsatz |
| 2017 | Instrumental determination of phosphorus in silicon for photovoltaics by β spectroscopy: A new approach
Karches, B.; Welter, K.; Stieghorst, C.; Wiehl, N.; Reich, T.; Riepe, S.; Krenckel, P.; Gerstenberg, H.; Plonka, C. | Zeitschriftenaufsatz |
| 2016 | Improving the material quality of silicon ingots by aluminum gettering during crystal growth
Schön, J.; Krenckel, P.; Karches, B.; Schindler, F.; Giesecke, J.; Stieghorst, C.; Wiehl, N.; Schubert, M.C.; Riepe, S. | Zeitschriftenaufsatz |
| 2013 | HCl gas gettering of low-cost silicon
Hampel, J.; Ehrenreich, P.; Wiehl, N.; Kratz, J.V.; Reber, S. | Zeitschriftenaufsatz |
| 2013 | MicroSISAK: Continuous liquid-liquid extractions of radionuclides at 0.2 mL/min
Hild, D.; Eberhardt, K.; Even, J.; Kratz, J.V.; Wiehl, N.; Löb, Patrick; Werner, Bernd; Hofmann, Christian | Zeitschriftenaufsatz |
| 2011 | Fast determination of impurities in metallurgical grade silicon for photovoltaics by instrumental neutron activation analysis
Hampel, J.; Boldt, F.M.; Gerstenberg, H.; Hampel, G.; Kratz, J.V.; Reber, S.; Wiehl, N. | Zeitschriftenaufsatz |
| 2011 | HCl gas gettering for crystalline silicon thin film solar cells
Hampel, J.; Boldt, F.M.; Wiehl, N.; Hampel, G.; Kratz, J.V.; Reber, S. | Konferenzbeitrag |
| 2010 | Cubic boron nitride: A new prospective material for ultracold neutron application
Sobolev, Y.; Lauer, T.; Borisov, Y.; Daum, V.; Fresne, N. du; Göltl, L.; Hampel, G.; Heil, W.; Knecht, A.; Keunecke, M.; Kratz, J.V.; Lang, T.; Meister, M.; Plonka-Spehr, C.; Pokotilovski, Y.; Reichert, P.; Schmidt, U.; Krist, T.; Wiehl, N.; Zenner, J. | Zeitschriftenaufsatz |
| 2010 | Use of HCL gas gettering in the epitaxial wafer equivalent concept
Hampel, J.; Boldt, F.M.; Wiehl, N.; Hampel, G.; Kratz, J.V.; Reber, S. | Konferenzbeitrag |
| 2009 | Gettering of metallurgical grade silicon by HCl gas
Hampel, J.; Schmich, E.; Boldt, F.M.; Wiehl, N.; Hampel, G.; Kratz, J.V.; Reber, S. | Konferenzbeitrag |