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| 2018 | Development of 4 nm-Thin PECVD aluminium oxide using plasma analysis and its application to PERC solar cells and modules
Hofmann, Marc; Wagenmann, Dirk; Teßmann, Christopher; Jäcklein, Martin; Saint-Cast, Pierre; Eberlein, Dirk; Kraft, Achim; Dippell, Torsten; May, Frank; Dörr, Manfred; Cord, Bernhard; Schütte, Thomas; Neiß, Peter; Eichhorn, Lutz; Klick, Michael; Richter, Uwe; Siemers, Michael; Wiedemuth, Peter | Konferenzbeitrag |
| 2013 | Potential-induced degradation on cell level: The inversion model
Saint-Cast, P.; Nagel, H.; Wagenmann, D.; Schön, J.; Schmitt, P.; Reichel, C.; Glunz, S.W.; Hofmann, M.; Rentsch, J.; Preu, R. | Konferenzbeitrag |
| 2012 | Analysis of phosphorus doped silicon oxide layers deposited by means of PECVD as a dopant source in diffusion processes
Fallisch, A.; Wagenmann, D.; Keding, R.; Trogus, D.; Hofmann, M.; Rentsch, J.; Reinecke, H.; Biro, D. | Zeitschriftenaufsatz |
| 2010 | Inkjet structured EWT silicon solar cells with evaporated aluminum metallization and laser-fired contacts
Fallisch, A.; Stüwe, D.; Neubauer, R.; Wagenmann, D.; Keding, R.; Nekarda, J.; Preu, R.; Biro, D. | Konferenzbeitrag |
| 2009 | Firing stable passivation with a-Si/SiNx stack layers for crystalline silicon solar cells
Saint-Cast, P.; Hofmann, M.; Dimitrova, T.; Wagenmann, D.; Rentsch, J.; Preu, R. | Konferenzbeitrag |
| 2009 | Industrial negatively charged c-Si surface passivation by inline PECVD AlOx
Kania, D.; Saint-Cast, P.; Wagenmann, D.; Hofmann, M.; Rentsch, J.; Preu, R. | Konferenzbeitrag |
| 2009 | Overview on crystalline silicon solar cells using PECVD rear passivation and laser-fired contacts
Hofmann, M.; Saint-Cast, P.; Suwito, D.; Seiffe, J.; Schmidt, C.; Kambor, S.; Gautero, L.; Kohn, N.; Nekarda, J.-F.; Leimenstoll, A.; Wagenmann, D.; Erath, D.; Catoir, J.; Wolke, W.; Janz, S.; Biro, D.; Grohe, A.; Rentsch, J.; Glunz, S.W.; Preu, R. | Konferenzbeitrag |
| 2009 | Towards a-Si:H rear passivated industrial-type silicon solar cells
Hofmann, M.; Saint-Cast, P.; Bareis, D.; Wagenmann, D.; Rentsch, J.; Preu, R. | Konferenzbeitrag |