Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Analyzing the Precision of Frequency Modulated Continuous Wave Distance and Thickness Measurements
Schreiner, N.S.; Sauer-Greff, W.; Urbansky, R.; Friederich, F.
Konferenzbeitrag
2019Multilayer Thickness Measurements below the Rayleigh Limit Using FMCW Millimeter and Terahertz Waves
Schreiner, N.S.; Sauer-Greff, W.; Urbansky, R.; Freymann, G. von; Friederich, F.
Zeitschriftenaufsatz
2017Application of the phase coherence method for imaging with sparse multistatic line arrays
Baccouche, B.; Sauer-Greff, W.; Urbansky, R.; Friedrich, F.
Konferenzbeitrag
2017Comparison of digital beamforming algorithms for 3D terahertz imaging with sparse multistatic line arrays
Baccouche, B.; Agostini, P.; Schneider, F.; Sauer-Greff, W.; Urbansky, R.; Friederich, F.
Zeitschriftenaufsatz
2017Enhanced 3D CW terahertz imaging with ultra sparse arrays using a phase coherence method
Baccouche, B.; Sauer-Greff, W.; Urbansky, R.; Friederich, F.
Konferenzbeitrag
2017High-resolution FMCW millimeter-wave and terahertz thickness measurements
Schreiner, N.; Baccouche, B.; Sauer-Greff, W.; Urbansky, R.; Friederich, F.
Konferenzbeitrag
2017Three-dimensional terahertz imaging with sparse multistatic line arrays
Baccouche, B.; Agostini, P.; Mohammadzadeh, S.; Kahl, M.; Weisenstein, C.; Jonuscheit, J.; Keil, A.; Loeffler, T.; Sauer-Greff, W.; Urbansky, R.
Zeitschriftenaufsatz
2017A transfer matrix modification for accurate terahertz FMCW thickness measurements
Schreiner, N.; Baccouche, B.; Molter, D.; Sauer-Greff, W.; Urbansky, R.; Friederich, F.
Konferenzbeitrag
2016Fast thickness measurements with frequency modulated continuous wave terahertz radiation
Schreiner, Nina S.; Baccouche, Bessem; Sauer-Greff, Wolfgang; Urbansky, Ralph; Friederich, Fabian
Konferenzbeitrag
2016Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology
Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph; Beigang, René
Zeitschriftenaufsatz
2016Illumination aspects of sparse line arrays for 3D terahertz imaging
Baccouche, Bessem; Mohammadzadeh, Shiva; Keil, Andreas; Kahl, Matthias; Haring Bolivar, Peter; Loeffler, Torsten; Jonuscheit, Joachim; Sauer-Greff, Wolfgang; Urbansky, Ralph; Friederich, Fabian
Konferenzbeitrag
2016Self-calibrating approach for terahertz thickness measurements of ceramic coatings
Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph; Beigang, René
Konferenzbeitrag
2015An evolutionary algorithm based approach to improve the limits of minimum thickness measurements of multilayered automotive paints
Krimi, Soufiene; Klier, Jens; Ellrich, Frank; Jonuscheit, Joachim; Urbansky, R.; Beigang, René; Freymann, Georg von
Konferenzbeitrag
2001Entwurf und Realisierung einer Werkzeugunterstützung für die Sicherheitsüberprüfung von Cisco-Routern
Simon, K.
: Urbansky, R. (Prüfer); Schwarz, R. (Prüfer)
Diplomarbeit