Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2008VF-TLP round robin study, analysis and results
Muhonen, K.; Ashton, R.; Barth, J.; Chaine, M.; Gieser, H.; Grund, E.; Henry, L.G.; Meuse, T.; Peachey, N.; Prass, T.; Stadler, W.; Voldman, S.H.
Konferenzbeitrag
2006Transient analysis of ESD protection elements by time domain transmission using repetitive pulses
Wolf, H.; Gieser, H.; Stadler, W.; Wilkening, W.; Rose, P.; Qu, N.
Konferenzbeitrag
2005Capacitively coupled transmission line pulsing cc-TLP - a traceable and reproducible stress method in the CDM-domain
Wolf, H.; Gieser, H.; Stadler, W.; Wilkening, W.
Zeitschriftenaufsatz
2005Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, N.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; Heyn, V. de; Natarajan, M.; Groeseneken, G.; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M.
Zeitschriftenaufsatz
2005Transient latch-up: Experimental analysis and device simulation
Bargstädt-Franke, S.; Stadler, W.; Esmark, K.; Streibl, M.; Domanski, K.; Gieser, H.; Wolf, H.; Bala, W.
Zeitschriftenaufsatz
2004Capacitively Coupled Transmission Line Pulsing CC-TLP - A Traceable and Reproducible Stress Method in the CDM-Domain
Wolf, H.; Gieser, H.; Stadler, W.; Wilkening, W.
Zeitschriftenaufsatz
2004Characterization and modeling of transient device behavior under CDM ESD stress
Willemen, J.; Andreini, A.; Heyn, V. de; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, G.; Mettler, S.; Morena, E.; Qu, N.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L.
Konferenzbeitrag, Zeitschriftenaufsatz
2004A Traceable Method for the Arc-free Characterization and Modeling of CDM testers and Pulse Metrology Chains
Gieser, H.A.; Wolf, H.; Soldner, W.; Reichl, H.; Andreini, Antonio; Natarajan, Mahadeva Iyer; Stadler, Wolfgang
Konferenzbeitrag
2003Investigation of ESD protection elements under high current stress in CDM-like time domain using backside laser interferometry
Bychikhin, S.; Dubec, V.; Litzenberger, M.; Pogany, D.; Gornik, E.; Groos, G.; Esmark, K.; Stecher, M.; Stadler, W.; Gieser, H.; Wolf, H.
Konferenzbeitrag, Zeitschriftenaufsatz
2003Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, N.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; Heyn, M. de; Natarajan, M.I.; Groeseneken, G.; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M.
Konferenzbeitrag
2003A traceable method for the arc-free characterization and modeling of CDM-testers and pulse metrology chains
Gieser, H.; Wolf, H.; Soldner, W.; Reichl, H.; Andreini, A.; Natarajan, M.I.; Stadler, W.
Konferenzbeitrag
2002ESD circuit simulation for the prevention of ESD failures. Application to products in a 0.18 µm CMOS technology
Wolf, H.; Gieser, H.; Stadler, W.; Esmark, K.
Konferenzbeitrag
1999Bipolar model extension for MOS transistors considering gate coupling effects in the HBM ESD domain
Wolf, H.; Gieser, H.; Stadler, W.
Zeitschriftenaufsatz