Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales
Sheremet, E.; Meszmer, P.; Blaudeck, T.; Hartmann, S.; Wagner, C.; Ma, B.; Hermann, S.; Wunderle, B.; Schulz, S.E.; Hietschold, M.; Rodriguez, R.D.; Zahn, D.R.T.
Zeitschriftenaufsatz
2019Computationally efficient simulation method for conductivity modeling of 2D-based conductors
Rizzi, L.; Zienert, A.; Schuster, J.; Köhne, M.; Schulz, S.E.
Zeitschriftenaufsatz
2019Electroforming-free resistive switching in yttrium manganite thin films by cationic substitution
Rayapai, V.R.; Bürger, D.; Du, N.; Patra, R.; Skorupa, I.; Blaschke, D.; Stöcker, H.; Matthes, P.; Schulz, S.E.; Schmidt, H.
Zeitschriftenaufsatz
2019Exchange bias and diffusion processes in laser annealed CoFeB/IrMn thin films
Sharma, A.; Hoffmann, M.A.; Matthes, P.; Busse, S.; Selyshchev, O.; Mack, P.; Exner, H.; Horn, A.; Schulz, S.E.; Zahn, D.R.T.; Salvan, G.
Zeitschriftenaufsatz
2019Iron(III) β-diketonates: CVD precursors for iron oxide film formation
Pousaneh, E.; Korb, M.; Assim, K.; Rüffer, T.; Dzhagan, V.; Noll, J.; Zahn, D.R.T.; Schulz, S.E.; Lang, H.
Zeitschriftenaufsatz
2019Magnetic tunnel junctions: Laser annealing versus oven annealing
Sharma, A.; Hoffmann, M.A.; Matthes, P.; Koehler, N.; Busse, S.; Mueller, M.; Exner, H.; Schulz, S.E.; Zahn, D.R.T.; Salvan, G.
Zeitschriftenaufsatz
2019Photosensitive Field‐Effect Transistors Made from Semiconducting Carbon Nanotubes and Non‐Covalently Attached Gold Nanoparticles
Blaudeck, T.; Preuß, A.; Scharf, S.; Notz, S.; Kossmann, A.; Hartmann, S.; Kasper, L.; Mendes, R.G.; Gemming, T.; Hermann, S.; Lang, H.; Schulz, S.E.
Zeitschriftenaufsatz
2019Synthesis of Mg and Zn diolates and their use in metal oxide deposition
Frenzel, P.; Preuß, A.; Bankwitz, J.; Georgi, C.; Ganss, F.; Mertens, L.; Schulz, S.E.; Hellwig, O.; Mehring, M.; Lang, H.
Zeitschriftenaufsatz
2018Application of quantum cascade laser absorption spectroscopy for correlation studies in plasma etching processes in the semiconductor industry
Lang, N.; Zimmermann, S.; Zimmermann, H.; Macherius, U.; Uhlig, B.; Schaller, M.; Schulz, S.E.; Röpcke, J.; Helden, J.H. van
Konferenzbeitrag
2018β-Ketoiminato-based copper(II) complexes as CVD precursors for copper and copper oxide layer formation
Pousaneh, E.; Korb, M.; Dzhagan, V.; Weber, M.; Noll, J.; Mehring, M.; Zahn, D.R.T.; Schulz, S.E.; Lang, H.
Zeitschriftenaufsatz
2018Electroforming-free resistive switching in polycrystalline YMnO3 thin films
Rayapati, V.R.; Du, N.; Bürger, D.; Patra, R.; Skorupa, I.; Matthes, P.; Stöcker, H.; Schulz, S.E.; Schmidt, H.
Zeitschriftenaufsatz
2018Fabrication and operation of protein-powered biocomputation using nanostructured networks
Meinecke, C.; Reuter, D.; Schulz, S.E.; Korten, T.; Heldt, G.; Diez, S.
Konferenzbeitrag
2018Integration of covalent and non-covalent functionalized SWCNTs in FETs
Kossmann, A.; Adner, D.; Blaudeck, T.; Hermann, S.; Schulz, S.E.; Lang, H.
Abstract
2018Magnesium β-ketoiminates as CVD precursors for MgO formation
Pousaneh, E.; Rüffer, T.; Assim, K.; Dzhagan, V.; Noll, J.; Zahn, D.R.T.; Mertens, L.; Mehring, M.; Schulz, S.E.; Lang, H.
Zeitschriftenaufsatz
2018Magneto-optical spectroscopy and spectroscopic ellipsometry of Co60Fe20B20 thin films
Sharma, A.; Almeida, M.; Matthes, P.; Ecke, R.; Zahn, D.R.T.; Schulz, S.E.; Salvan, G.
Abstract
2018Polymer-based doping control for performance enhancement of wet-processed short-channel CNTFETs
Hartmann, M.; Schubel, R.; Claus, M.; Jordan, R.; Schulz, S.E.; Hermann, S.
Zeitschriftenaufsatz
2018The role of plasma analytics in leading-edge semiconductor technologies
Zimmermann, S.; Haase, M.; Lang, N.; Röpcke, J.; Schulz, S.E.; Otto, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2018Scaling up integration of carbon nanotubes into Micro-Electro-Mechanical systems
Böttger, S.; Jöhrmann, N.; Bonitz, J.; Wunderle, B.; Schulz, S.E.; Hermann, S.
Konferenzbeitrag
2018Tetranuclear yttrium and gadolinium 2-acetylcyclopentanoate clusters: Synthesis and their use as spin-coating precursors for metal oxide film formation for field-effect transistor fabrication
Pousaneh, E.; Preuß, A.; Assim, K.; Rüffer, T.; Korb, M.; Tittmann-Otto, J.; Hermann, S.; Schulz, S.E.; Lang, H.
Zeitschriftenaufsatz
2018Tuning of diameter and electronic type of CCVD grown SWCNTs
Jafarpour, S.M.; Schulz, S.E.; Hermann, S.
Zeitschriftenaufsatz
20173D wafer level packaging by using Cu-through silicon vias for thin MEMS accelerometer packages
Hofmann, L.; Schubert, I.; Wuensch, D.; Ecke, R.; Vogel, K.; Gottfried, K.; Reuter, D.; Rennau, M.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2017Approaches for wafer level packaging and heterogeneous system integration for CMOS and MEMS sensors
Dempwolf, Sophia; Hofmann, L.; Bowers, Christopher; Guenther, Daniela; Knechtel, Roy; Schulz, S.E.; Gerbach, Ronny
Konferenzbeitrag
2017Effects of catalyst configurations and process conditions on the formation of catalyst nanoparticles and growth of single-walled carbon nanotubes
Jafarpour, S.M.; Kini, M.; Schulz, S.E.; Hermann, S.
Zeitschriftenaufsatz
2017Low-temperature chemical vapor deposition of cobalt oxide thin films from a dicobaltatetrahedrane precursor
Melzer, M.; Nichenametla, Charan K.; Georgi, Colin; Lang, Heinrich; Schulz, S.E.
Zeitschriftenaufsatz
2017Multiparameter and Parallel Optimization of ReaxFF Reactive Force Field for Modeling the Atomic Layer Deposition of Copper
Hu, X.; Schuster, J.; Schulz, S.E.
Zeitschriftenaufsatz
2017Scalable fabrication of carbon nanotube field-effect transistors (CNT-FETs) implementing wafer-level electron-beam lithography and dielectrophoretic CNT assembly
Blaudeck, T.; Hermann, S.; Hartmann, M.; Böttger, S.; Tittmann-Otto, J.; Heldt, G.; Reuter, D.; Schulz, S.E.
Abstract
2017A test device for in situ TEM investigations on failure behaviour of carbon nanotubes embedded in metals under tensile load
Jöhrmann, N.; Hartmann, S.; Jacob, K.; Bonitz, J.; MacArthur, K.E.; Hermann, S.; Schulz, S.E.; Wunderle, B.
Konferenzbeitrag
2016Atomic layer deposition of ultrathin Cu2O and subsequent reduction to Cu studied by in situ x-ray photoelectron spectroscopy
Dhakal, D.; Assim, K.; Lang, H.; Bruener, P.; Grehl, T.; Georgi, C.; Waechtler, T.; Ecke, R.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2016Bis(β-diketonato)-and allyl-(β-diketonato)-palladium(II) complexes: Synthesis, characterization and MOCVD application
Assim, K.; Melzer, M.; Korb, M.; Rüffer, T.; Jakob, A.; Noll, J.; Georgi, C.; Schulz, S.E.; Lang, H.
Zeitschriftenaufsatz
2016CF3Br plasma cryo etching of low-k porous dielectric
Clemente, I.; Koehler, N.; Miakonkikh, A.; Zimmermann, S.; Schulz, S.E.; Rudenko, K.
Zeitschriftenaufsatz, Konferenzbeitrag
2016Characterisation of the barrier formation process of self-forming barriers with CuMn, CuTi and CuZr alloys
Franz, M.; Ecke, R.; Kaufmann, C.; Kriz, J.; Schulz, S.E.
Zeitschriftenaufsatz, Konferenzbeitrag
2016Chemical vapor deposition of ruthenium-based layers by a single-source approach
Jeschke, J.; Möckel, S.; Korb, M.; Rüffer, T.; Assim, K.; Melzer, M.; Herwig, G.; Georgi, C.; Schulz, S.E.; Lang, H.
Zeitschriftenaufsatz
2016Competitive impact of nanotube assembly and contact electrodes on the performance of CNT-based FETs
Toader, M.; Hermann, S.; Scharfenberg, L.; Hartmann, M.; Mertig, M.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2016Effect of cleaning procedures on the electrical properties of carbon nanotube transistors - a statistical study
Tittmann-Otto, J.; Hermann, S.; Kalbacova, J.; Hartmann, M.; Toader, M.; Rodriguez, R.D.; Schulz, S.E.; Zahn, D.R.T.; Gessner, T.
Zeitschriftenaufsatz
2016Enhancement of carbon nanotube FET performance via direct synthesis of poly (sodium 4-styrenesulfonate) in the transistor channel
Toader, M.; Schubel, R.; Hartmann, M.; Scharfenberg, L.; Jordan, R.; Mertig, M.; Schulz, S.E.; Gessner, T.; Hermann, S.
Zeitschriftenaufsatz
2016Experimental and computational studies on the role of surface functional groups in the mechanical behavior of interfaces between single-walled carbon nanotubes and metals
Hartmann, S.; Sturm, H.; Blaudeck, T.; Hölck, O.; Hermann, S.; Schulz, S.E.; Gessner, T.; Wunderle, B.
Zeitschriftenaufsatz
2016Exploitation of giant piezoresistivity - CNT sensors fabricated with a wafer-level technology
Böttger, S.; Schulz, S.E.; Hermann, S.
Zeitschriftenaufsatz, Konferenzbeitrag
2016High-resolution inkjet printing of conductive carbon nanotube twin lines utilizing evaporation-driven self-assembly
Dinh, Nghia Trong; Sowade, Enrico; Blaudeck, T.; Hermann, S.; Rodriguez, Raul D.; Zahn, Dietrich R.T.; Schulz, S.E.; Baumann, R.R.; Kanoun, Olfa
Zeitschriftenaufsatz
2016An in situ tensile test device for thermo-mechanical characterisation of interfaces between carbon nanotubes and metals
Hartmann, S.; Bonitz, J.; Heggen, M.; Hermann, S.; Hölck, O.; Schulz, S.E.; Gessner, T.; Wunderle, B.
Konferenzbeitrag
2016Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube-field-effect transistors
Böttger, S.; Hermann, S.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2016Manganese half-sandwich complexes as metal-organic chemical vapor deposition precursors for manganese-based thin films
Assim, K.; Jeschke, J.; Jakob, A.; Dhakal, D.; Melzer, M.; Georgi, C.; Schulz, S.E.; Gessner, T.; Lang, H.
Zeitschriftenaufsatz
2016A MEMS test stage for in situ testing of interfaces between carbon nanotubes and metals
Hartmann, S.; Hermann, S.; Bonitz, J.; Heggen, M.; Schulz, S.E.; Gessner, T.; Wunderle, B.
Konferenzbeitrag
2016Metal nanoparticles reveal the organization of single-walled carbon nanotubes in bundles
Rodriguez, R.D.; Blaudeck, T.; Kalbacova, J.; Sheremet, E.; Schulze, S.; Adner, D.; Hermann, S.; Hietschold, M.; Lang, H.; Schulz, S.E.; Zahn, D.R.T.
Zeitschriftenaufsatz
2016A plasma assisted in situ restoration process for sidewall damaged ULK dielectrics
Koehler, N.; Fischer, T.; Zimmermann, S.; Schulz, S.E.
Zeitschriftenaufsatz
2016Study on TSV isolation liners for a Via Last approach with the use in 3D-WLP for MEMS
Hofmann, L.; Fischer, T.; Werner, T.; Selbmann, F.; Rennau, M.; Ecke, R.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2016Towards nanoreliability of sensors incorporating interfaces between single-walled carbon nanotubes and metals: Molecular dynamics simulations and in situ experiments using electron microscopy
Hartmann, S.; Hermann, S.; Bonitz, J.; Heggen, M.; Hölck, O.; Shaporin, A.; Mehner, J.; Schulz, S.E.; Gessner, T.; Wunderle, B.
Zeitschriftenaufsatz
2016Wafer-level technology for integration of carbon nanotubes into micro-electro-mechanical systems
Bonitz, J.; Böttger, S.; Herrmann, S.; Schulz, S.E.; Gessner, T.; Hartmann, S.; Wunderle, B.
Konferenzbeitrag
2015[Ag{S2CNR(C2H4OH)}] as single-source precursor for Ag2S – synthesis, decomposition mechanism, and deposition studies
Mothes, R.; Jakob, A.; Waechtler, T.; Schulz, S.E.; Gessner, T.; Lang, H.
Zeitschriftenaufsatz
20153D integration approaches for MEMS and CMOS sensors based on a Cu through-silicon-via technology and wafer level bonding
Hofmann, L.; Dempwolf, S.; Reuter, D.; Ecke, R.; Gottfried, K.; Schulz, S.E.; Knechtel, R.; Geßner, T.
Konferenzbeitrag
20153d Wafer Level Packaging By Using Cu-Through Silicon Vias For Thin Mems Accelerometer Packages
Hofmann, L.; Reuter, D.; Schubert, I.; Wuensch, D.; Rennau, M.; Ecke, R.; Vogel, K.; Gottfried, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2015Back-end-of-line compatible contact materials for carbon nanotube based interconnects
Fiedler, H.; Toader, M.; Hermann, S.; Rennau, M.; Rodriguez, R.D.; Sheremet, E.; Hietschold, M.; Zahn, D.R.T.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2015Carbon Nanotube based sensors in MEMS/NEMS
Hermann, S.; Bonitz, J.; Boettger, S.; Hartmann,S; Shaporin, A.; Mehner, J.; Wunderle, B.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2015Experimental and Theoretical Investigations on an in situ k-restore Process with Plasma Enhanced Fragmentation for Damaged ULK Materials
Foerster, A.; Koehler, N.; Zimmermann, S.; Fischer, T.; Wagner, C.; Schuster, J.; Gemming, S.; Schulz, S.E.; Gessner, T.
Abstract
2015Experimental investigations on a plasma assisted in situ restoration process for sidewall damaged ultra low-k dielectrics
Köhler, N.; Fischer, T.; Zimmermann, S.; Schulz, S.E.
Konferenzbeitrag
2015Half-sandwich cobalt complexes in the metal-organic chemical vapor deposition process
Georgi, C.; Hapke, M.; Thiel, I.; Hildebrandt, A.; Waechtler, T.; Schulz, S.E.; Lang, H.
Zeitschriftenaufsatz
2015High-performance giant magnetoresistive sensorics on flexible Si membranes
Pérez, N.; Melzer, M.; Makarov, D.; Ueberschär, O.; Ecke, R.; Schulz, S.E.; Schmidt, O.G.
Zeitschriftenaufsatz
2015Interaction between carbon nanotubes and metals: Electronic properties, stability, and sensing
Fuchs, F.; Zienert, A.; Wagner, C.; Schuster, J.; Schulz, S.E.
Zeitschriftenaufsatz, Konferenzbeitrag
2015Investigation of barrier formation and stability of self-forming barriers with CuMn, CuTi and CuZr alloys
Franz, M.; Ecke, R.; Kaufmann, C.; Kriz, J.; Schulz, S.E.
Konferenzbeitrag
2015k-restore Process with Plasma Enhanced Fragmentation for Damaged ULK Materials — A DFT and MD Study
Foerster, A.; Wagner, C.; Schuster, J.; Gemming, S.; Schulz, S.E.
Abstract
2015Materials for Advanced Metallization 2014 (MAM 2014). Preface
Schulz, S.E.; Hecker, M.; Korner, H.; Wolf, H.
Konferenzbeitrag, Zeitschriftenaufsatz
2015Monolithic integration of 2D spin valve magnetic field sensors for angular sensing
Almeida, M.J.; Götze, T.; Ueberschär, O.; Matthes, P.; Müller, M.; Ecke, R.; Exner, H.; Schulz, S.E.
Zeitschriftenaufsatz, Konferenzbeitrag
2015Monolithic integration of focused 2D GMR spin valve magnetic field sensor for high-sensitivity (compass) applications
Ueberschär, O.; Almeida, M.J.; Matthes, P.; Müller, M.; Ecke, R.; Exner, H.; Schulz, S.E.
Konferenzbeitrag
2015On treatment of ultra-low-k SiCOH in CF4 plasmas: Correlation between the concentration of etching products and etching rate
Lang, N.; Zimmermann, S.; Zimmermann, H.; Macherius, U.; Uhlig, B.; Schaller, M.; Schulz, S.E.; Röpcke, J.
Zeitschriftenaufsatz
2015Optimized monolithic 2-D spin-valve sensor for high-sensitivity compass applications
Ueberschär, O.; Almeida, M.J.; Matthes, P.; Müller, M.; Ecke, R.; Rückriem, R.; Schuster, J.; Exner, H.; Schulz, S.E.
Zeitschriftenaufsatz
2015Optimum laser exposure for setting exchange bias in spin valve sensors
Almeida, M.J.; Matthes, P.; Ueberschär, O.; Müller, M.; Ecke, R.; Exner, H.; Albrecht, M.; Schulz, S.E.
Zeitschriftenaufsatz, Konferenzbeitrag
2015Quantum cascade laser based monitoring of CF2 radical concentration as a diagnostic tool of dielectric etching plasma processes
Hübner, M.; Lang, N.; Zimmermann, S.; Schulz, S.E.; Buchholtz, W.; Röpcke, J.; Helden, J.H. van
Zeitschriftenaufsatz
2015Simulation of ALD chemistry of (nBu3P)2Cu(acac) and Cu(acac)2 precursors on Ta(110) surface
Hu, X.; Schuster, J.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2015Surface chemistry of copper metal and copper oxide atomic layer deposition from copper(II) acetylacetonate
Hu, X.; Schuster, J.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2015Towards nanoreliability of CNT-based sensor applications: Investigations of CNT-metal interfaces combining molecular dynamics simulations, advanced in situ experiments and analytics
Hartmann, S.; Shaporin, A.; Hermann, S.; Bonitz, J.; Heggen, M.; Meszmer, P.; Sturm, H.; Hölck, O.; Blaudeck, T.; Schulz, S.E.; Mehner, J.; Gessner, T.; Wunderle, B.
Konferenzbeitrag
2015Wafer-level decoration of carbon nanotubes in field-effect transistor geometry with preformed gold nanoparticles using a microfluidic approach
Blaudeck, T.; Adner, D.; Hermann, S.; Lang, H.; Gessner, T.; Schulz, S.E.
Zeitschriftenaufsatz, Konferenzbeitrag
2015A wafer-level test platform for statistical TEM analysis of the structural properties of integrated carbon nanotubes
Hartmann, M.; Hermann, S.; Pohl, D.; Rellinghaus, B.; Schulz, S.E.
Abstract
2015Wetting behavior of plasma etch residue removal solutions on plasma damaged and repaired porous ULK dielectrics
Ahner, N.; Zimmermann, S.; Köhler, N.; Krüger, S.; Schulz, S.E.
Konferenzbeitrag
2014ALD of Nickel Oxide and its Reduction to Nickel for Potential Applications in Interconnects and Spintronics
Wächtler, T.; Sharma, A.; Ahner, N.; Melzer, M.; Mueller, S.; Lehmann, D.; Schäfer, P.; Schulze, S.; Schulz, S.E.; Zahn, D.R.T.; Hietschold, M.; Gessner, T.
Konferenzbeitrag
2014Carbon nanotube based via interconnects: Performance estimation based on the resistance of individual carbon nanotubes
Fiedler, H.; Toader, M.; Hermann, S.; Rodriguez, R.D.; Sheremet, E.; Rennau, M.; Schulze, S.; Waechtler, T.; Hietschold, M.; Zahn, D.R.T.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2014Challenges of current and future advanced interconnect systems for integrated circuits
Schulz, S.E.; Ahner, N.; Fischer, T.; Koerner, H.; Oszinda, T.; Schulze, K.; Zimmermann, S.
Aufsatz in Buch
2014A cobalt layer deposition study: Dicobaltatetrahedranes as convenient MOCVD precursor systems
Georgi, C.; Hildebrandt, A.; Waechtler, T.; Schulz, S.E.; Gessner, T.; Lang, H.
Zeitschriftenaufsatz
2014Corrigendum to "Controlling SWCNT assembling density by electrokinetics" [Sensors and Actuators, A: Physical (2013) 201 (36-42)]
Yu, H.; Hermann, S.; Dong, Z.; Mai, J.; Li, W.J.; Schulz, S.E.
Zeitschriftenaufsatz
2014Deposition of copper thin films for ULSI interconnects by ALD of copper oxide and subsequent reduction
Waechtler, T.; Mothes, R.; Hofmann, L.; Schulze, S.; Oswald, S.; Schulz, S.E.; Lang, H.; Hietschold, M.; Gessner, T.
Aufsatz in Buch
2014The dielectric response of low-k interlayer dielectric material characterized by electron energy loss spectroscopy
Singh, P.K.; Knaup, J.M.; Zimmermann, S.; Schulze, S.; Schulz, S.E.; Frauenheim, T.; Hietschold, M.
Zeitschriftenaufsatz
2014Dispersion Preparation for Wafer-Level Liquid Processing of Carbon Nanotube Microsensors
Hille, Toni; Blaudeck, T.; Hermann, S.; Schulz, S.E.
Konferenzbeitrag
2014Hysteresis-free carbon nanotube field-effect transistors without passivation
Tittmann, J.; Hermann, S.; Schulz, S.E.; Pacheco-Sanchez, A.; Claus, M.; Schröter, M.
Konferenzbeitrag
2014Influence of porosity and methyl doping inside silica network
Singh, P.K.; Knaup, J.M.; Zimmermann, S.; Schulze, S.; Schulz, S.E.; Frauenheim, T.; Hietschold, M.
Zeitschriftenaufsatz
2014Interaction Between Carbon Nanotubes and Metals: Electronic Properties, Stability, and Sensing
Fuchs, F.; Zienert, A.; Wagner, C.; Schuster, J.; Schulz, S.E.
Konferenzbeitrag
2014Interaction between semiconducting carbon nanotubes and metals: Sensing, stability and electronic properties
Fuchs, F.; Zienert, A.; Wagner, C.; Schuster, J.; Schulz, S.E.
Konferenzbeitrag
2014Interface Resistance of Carbon-Nanotube-Based Interconnects
Fiedler, H.; Toader, Marius; Hermann, S.; Rennau, M.; Rodriguez, Raul D.; Sheremet, E.; Zahn, Dietrich R.T.; Hietschold, Michael; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2014Localization length of integrated multi-walled carbon nanotubes
Fiedler, H.; Hermann, S.; Rennau, M.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2014Molecular dynamic simulations of maximum pull-out forces of embedded CNTs for sensor applications and validating nano scale experiments
Hartmann, S.; Hölck, O.; Blaudeck, T.; Hermann, S.; Schulz, S.E.; Gessner, T.; Wunderle, B.
Konferenzbeitrag
2014Monolithic spin valve compass for autonomous MEMS navigation in geomagnetic field
Almeida, M.J.; Ueberschär, O.; Ecke, R.; Schulz, S.E.; Matthes, P.; Müller, M.; Exner, H.
Konferenzbeitrag
2014Quantitative in-situ scanning electron microscope pull-out experiments and molecular dynamics simulations of carbon nanotubes embedded in palladium
Hartmann, S.; Blaudeck, T.; Hölck, O.; Hermann, S.; Schulz, S.E.; Gessner, T.; Wunderle, B.
Zeitschriftenaufsatz
2014Raman spectroscopy study of the interaction of gold nanoparticles with carbon-nanotubefield-effect transistors
Kalbacova, Jana; Rodriguez, Raul D.; Blaudeck, T.; Hermann, S.; Sheremet, E.; Adner, David; Lang, Heinrich; Schulz, S.E.; Zahn, Dietrich R.T.
Konferenzbeitrag
2014Sidewall Damage Analysis of Low-k Dielectricmaterial by Using Energy-Filtered Transmission Electron Microscopy
Singh, P.K.; Zimmermann, S.; Waechtler, T.; Schulze, Steffen; Schulz, S.E.; Hietschold, Michael
Konferenzbeitrag
2014Simulation of ALD chemistry of copper metalorganic precursors on Ta(110) Surface
Hu, X.; Schuster, J.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2014Surface chemistry of a Cu(I) beta-diketonate precursor and the atomic layer deposition of Cu2O on SiO2 studied by x-ray photoelectron spectroscopy
Dhakal, D.; Waechtler, T.; Schulz, S.E.; Gessner, T.; Lang, H.; Mothes, R.; Tuchscherer, A.
Zeitschriftenaufsatz
2014Tip-Enhanced Raman Spectroscopy for the Characterization of Carbon Nanotubes
Sheremet, E.; Rodriguez, Raul D.; Krayev, A.; Kalbacova, Jana; Hermann, S.; Schulz, S.E.; Zahn, Dietrich R.T.
Konferenzbeitrag
2014Wafer-Level Functionalization of Integrated Carbon Nanotubes with Metal Nanoparticles
Blaudeck, T.; Adner, David; Hermann, S.; Schulz, S.E.; Lang, Heinrich; Gessner, T.
Konferenzbeitrag
20133D integration technologies for MEMS based on copper TSVs and copper-to-copper metal thermo compression bonding
Hofmann, L.; Baum, M.; Schulz, S.E.; Wiemer, M.; Geßner, T.
Konferenzbeitrag
2013Conductive AFM for CNT characterization
Toader, M.; Fiedler, H.; Hermann, S.; Schulz, S.E.; Gessner, T.; Hietschold, M.
Zeitschriftenaufsatz, Konferenzbeitrag
2013Controlling SWCNT assembling density by electrokinetics
Yu, H.; Hermann, S.; Dong, Z.; Mai, J.; Li, W.J.; Schulz, S.E.
Zeitschriftenaufsatz
2013Copper oxide atomic layer deposition on thermally pretreated multi-walled carbon nanotubes for interconnect applications
Melzer, M.; Waechtler, T.; Müller, S.; Fiedler, H.; Hermann, S.; Rodriguez, R.D.; Villabona, A.; Sendzik, A.; Mothes, R.; Schulz, S.E.; Zahn, D.R.T.; Hietschold, M.; Lang, H.; Gessner, T.
Zeitschriftenaufsatz
2013Determination of surface energy characteristics of plasma processed ultra low-k dielectrics for optimized wetting in wet chemical plasma etch residue removal
Ahner, N.; Zimmermann, S.; Schaller, M.; Schulz, S.E.
Konferenzbeitrag
2013Development and characterisation of 3D integration technologies for MEMS based on copper filled TSVs and copper-to-copper metal thermo compression bonding
Baum, M.; Hofmann, L.; Wiemer, M.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2013Investigations on partially filled HAR TSVs for MEMS applications
Hofmann, L.; Schubert, I.; Gottfried, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2013Magneto-optical Kerr effect studies of Cu2O/nickel heterostructures
Salvan, G.; Robaschik, P.; Fronk, M.; Müller, S.; Waechtler, T.; Schulz, S.E.; Mothes, R.; Lang, H.; Schubert, C.; Thomas, S.; Albrecht, M.; Zahn, D.R.T.
Zeitschriftenaufsatz
2013Manipulation of Ni catalyst particle size, shape and areal density on TiN support layer for growth of vertical aligned CNTs
Tittmann, J.; Hermann, S.; Fiedler, H.; Schulz, S.E.; Gessner, T.
Abstract
2013Modeling and simulation of the interplay between contact metallization and stress liner technologies for strained silicon
Schuster, J.; Schulz, S.E.; Herrmann, T.; Richter, R.
Zeitschriftenaufsatz
2013TSVs mit hohem Aspektverhältnis und Kupfer-Bonden für MEMS
Hofmann, L.; Baum, M.; Gottfried, K.; Schulz, S.E.; Wiemer, M.; Gessner, T.
Konferenzbeitrag
2013Vertical Integration techniques for MEMS using HAR TSV
Hofmann, L.; Schubert, I.; Ecke, R.; Gottfried, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2013Wafer-level technology for piezoresistive electro-mechanical transducer based on Carbon Nanotubes
Shaporin, A.; Hermann, S.; Kaufmann, C.; Schulz, S.E.; Gessner, T.; Voigt, S.; Mehner, J.; Hartmann, S.; Wunderle, B.; Bonitz, J.
Konferenzbeitrag
2012ALD of Metal and Metal Oxide Thin Films for Applications in ULSI Metallization Systems and Spintronic Layer Stacks
Waechtler, T.; Mueller, S.; Fiedler, H.; Melzer, M.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Analysis of pore sealing processes and TiN diffusion barrier deposition on a porous ultra low-k dielectric by ellipsometric porosimetry and PALS
Ahner, N.; Ecke, R.; Schulz, S.E.; Jungmann, M.; Krause-Rehberg, R.; Butterling, M.; Anwand, W.; Wagner, A.; Preusse, A.
Konferenzbeitrag
2012Back-end-of the line compatible homogeneous coating of vertical aligned carbon nanotubes with a conductive diffusion barrier for interconnect applications
Fiedler, H.; Ecke, R.; Hermann, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Band gap tuning of carbon nanotubes for sensor and interconnect applications - a quantum simulation study
Sommer, J.; Zienert, A.; Gemming, S.; Schuster, J.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Distinguishing between individual contributions to the via resistance in carbon nanotubes based interconnects
Fiedler, H.; Toader, M.; Hermann, S.; Rodriguez, R.D.; Sheremet, E.; Rennau, M.; Schulze, S.; Waechtler, T.; Hietschold, M.; Zahn, D.R.T.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2012FIB/SEM analysis for smart systems integration
Waechtler, T.; Auerswald, E.; Hoebelt, I.; Nowack, M.; Noack, E.; Gollhardt, A.; Vogel, D.; Michel, B.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Field emitting carbon nanotubes in MEMS-structures for movement sensors
Loschek, S.; Hermann, S.; Haibo, Y.; Schulz, S.E.
Konferenzbeitrag
2012Growth of carbon nanotube forests between a bi-metallic catalyst layer and a SiO2 substrate to form a self-assembled carbon-metal heterostructure
Hermann, S.; Schulze, S.; Ecke, R.; Liebig, A.; Schaefer, P.; Zahn, D.R.T.; Albrecht, M.; Hietschold, M.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2012Influence of thermal cycles on the silylation process for recovering k-value and chemical structure of plasma damaged ultra-low-k materials
Fischer, T.; Ahner, N.; Zimmermann, S.; Schaller, M.; Schulz, S.E.
Zeitschriftenaufsatz, Konferenzbeitrag
2012A less damaging patterning regime for a successful integration of ultra low-k materials in modern nanoelectronic devices
Zimmermann, S.; Ahner, N.; Fischer, T.; Schaller, M.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012A Low Damage Patterning Scheme for Ultra Low-k Dielectrics
Zimmermann, S.; Ahner, N.; Fischer,T.; Oszinda,T.; Uhlig, B.; Schulz, S.E.; Gessner,T.
Zeitschriftenaufsatz
2012Magneto-optical Kerr-effect studies on copper oxide thin films produced by atomic layer deposition on SiO2
Fronk, M.; Müller, S.; Waechtler, T.; Schulz, S.E.; Mothes, R.; Lang, H.; Zahn, D.R.T.; Salvan, G.
Zeitschriftenaufsatz, Konferenzbeitrag
2012Modeling of TDDB in advanced Cu interconnect systems under BTS conditions
Blský, P.; Streiter, R.; Wolf, H.; Schulz, S.E.; Aubel, O.; Gessner, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2012Nanomechanics oc CNTs for Sensor Simulation
Wagner, C.; Hartmann, S.; Schuster, J.; Wunderle, B.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Nanomechanics of CNTs for sensor application
Wagner, C.; Hartmann, S.; Wunderle, B.; Schuster, J.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Nanoscale optical and electrical characterization of horizontally aligned single-walled carbon nanotubes
Rodriguez, R.D.; Toader, M.; Hermann, S.; Sheremet, E.; Mueller, S.; Gordan, O.D.; Yu, H.; Schulz, S.E.; Hietschold, M.; Zahn, D.R.T.
Zeitschriftenaufsatz, Konferenzbeitrag
2012Optimized wetting behavior of water-based cleaning solutions for plasma etch residue removal by application of surfactants
Ahner, N.; Zimmermann, S.; Schaller, M.; Schulz, S.E.
Konferenzbeitrag
2012Optimizing sonication parameters for dispersion of single-walled carbon nanotubes
Yu, H.B.; Hermann, S.; Schulz, S.E.; Gessner, T.; Dong, Z.L.; Li, W.J.
Zeitschriftenaufsatz
2012Processes for wafer level integration of carbon nanotubes in electronic and sensor applications
Hermann, S.; Fiedler, H.; Loschek, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Simulation of nanostructures for sensor and circuit applications
Zienert, A.; Wagner, C.; Mohammadzadeh, S.; Schuster, J.; Streiter, R.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Structuring of carbon nanotubes for field emission based movement sensors
Loschek, S.; Hermann, S.; Yu, H.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012A two-step UV curing process for producing high tensile stressed silicon nitride layers
Fischer, T.; Prager, L.; Hohage, J.; Ruelke, H.; Schulz, S.E.; Richter, R.; Gessner, T.
Konferenzbeitrag
2012Wafer level approaches for carbon nanotube integration in interconnects and MEMS/NEMS
Hermann, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2012Wafer level approaches for the integration of carbon nanotubes in electronic and sensor applications
Hermann, S.; Fiedler, H.; Haibo, Y.; Loschek, S.; Bonitz, J.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2011ALD-grown seed layers for electrochemical copper deposition integrated with different diffusion barrier systems
Waechtler, T.; Ding, S.-F.; Hofmann, L.; Mothes, R.; Xie, Q.; Oswald, S.; Detavernier, C.; Schulz, S.E.; Qu, X.-P.; Lang, H.; Gessner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2011Electrical property improvements of ultra low-k ILD using a silylation process feasible for process integration
Thomas, O.; Schaller, M.; Gerlich, L.; Fischer, D.; Leppack, S.; Bartsch, C.; Schulz, S.E.
Konferenzbeitrag
2011Fabrication and characterisation of CNT via interconnects for application in ULSI circuits
Fiedler, H.; Hermann, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2011How to evaluate surface free energies of dense and ultra low-kappa dielectrics in pattern structures
Oszinda, T.; Schaller, M.; Dittmar, K.; Jiang, L.; Schulz, S.E.
Konferenzbeitrag
2011Influence of copper on the catalytic carbon nanotube growth process
Fiedler, H.; Hermann, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2011Influence of the additives argon, O-2, C4F8, H-2, N-2 and CO on plasma conditions and process results during the etch of SiCOH in CF4 plasma
Zimmermann, S.; Ahner, N.; Blaschta, F.; Schaller, M.; Zimmermann, H.; Rülke, H.; Lang, N.; Röpcke, J.; Schulz, S.E.; Geßner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2011Influence of thermal cycles on the silylation process for recovering k-value and chemical structure of plasma damaged ultra-low-k materials
Fischer, T.; Ahner, N.; Zimmermann, S.; Schaller, M.; Schulz, S.E.
Konferenzbeitrag
2011The inhibition of enhanced Cu oxidation on ruthenium/diffusion barrier layers for Cu interconnects by carbon alloying into Ru
Ding, S.-F.; Xie, Q.; Mueller, S.; Waechtler, T.; Lu, H.-S.; Schulz, S.E.; Detavernier, C.; Qu, X.-P.; Gessner, T.
Zeitschriftenaufsatz
2011Investigations regarding through silicon via filling for 3D integration by periodic pulse reverse plating with and without additives
Hofmann, L.; Ecke, R.; Schulz, S.E.; Geßner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2011Lewis-base copper(I) formates: Synthesis, reaction chemistry, structural characterization and their use as spin-coating precursors for copper deposition
Tuchscherer, A.; Shen, Y.; Jakob, A.; Mothes, R.; Al-Anber, M.; Walfort, B.; Rüffer, T.; Frühauf, S.; Ecke, R.; Schulz, S.E.; Gessner, T.; Lang, H.
Zeitschriftenaufsatz
2011Modeling of TDDB in advanced Cu interconnect systems under BTS conditions
Belsky, P.; Streiter, R.; Wolf, H.; Schulz, S.E.; Aubel, O.; Gessner, T.
Konferenzbeitrag
2011Prediction of wafer homogeneity maps using a virtual metrology scheme consisting of time resolved OES measurements and a neural network
Zimmermann, S.; Reich, R.; Zacher, M.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2011Smart systems
Gessner, T.; Vogel, M.; Otto, T.; Schulz, S.E.; Baumann, R.
Konferenzbeitrag
2011Thermal ALD of Cu via reduction of CuxO films for the advanced metallization in spintronic and ULSI interconnect systems
Mueller, S.; Waechtler, T.; Tuchscherer, A.; Mothes, R.; Gordan, O.; Lehmann, D.; Haidu, F.; Ogiewa, M.; Gerlich, L.; Ding, S.-F.; Schulz, S.E.; Gessner, T.; Lang, H.; Zahn, D.R.T.; Qu, X.-P.
Konferenzbeitrag
2011Variable-shaped e-beam lithography enabling process development for future copper damascene technology
Jaschinsky, P.; Erben, J.-W.; Choi, K.-H.; Schulze, K.; Gutsch, M.; Freitag, M.; Schulz, S.E.; Steidel, K.; Hohle, C.; Gessner, T.; Kücher, P.
Zeitschriftenaufsatz, Konferenzbeitrag
2010Analysis of the impact of different additives during etch processes of dense and porous low-k with OES and QMS
Zimmermann, S.; Ahner, N.; Blaschta, F.; Schaller, M.; Rülke, H.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2010Business units and core competences of Fraunhofer ENAS
Gessner, T.; Vogel, M.; Otto, T.; Schulz, S.E.; Baumann, R.R.
Zeitschriftenaufsatz
2010Carbon nanotubes for nanoscale low temperature flip chip connections
Hermann, S.; Pahl, B.; Ecke, R.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2010Chemical Repair of plasma damaged porous ultra low-k SiOCH film using a vapor phase process
Oszinda, T.; Schaller, M.; Schulz, S.E.
Konferenzbeitrag
2010Chemical repair of plasma damaged porous ultra low-kappa SiOCH film using a vapor phase process
Oszinda, T.; Schaller, M.; Schulz, S.E.
Zeitschriftenaufsatz
2010How to evaluate surface free energies of dense and ultra low-k dielectrics in pattern structures
Oszinda, T.; Schaller, M.; Dittmar, K.; Jiang, L.; Schulz, S.E.
Konferenzbeitrag
2010Inhibition of enhanced Cu oxidation on ruthenium
Ding, S.-F.; Xie, Q.; Waechtler, T.; Lu, H.-S.; Schulz, S.E.; Qu, X.-P.
Konferenzbeitrag
2010Integration von Kohlenstoffnanoröhren für MEMS/NEMS Anwendungen
Hermann, S.; Loschek, S.; Haibo, Y.; Bonitz, J.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2010Investigation of physical and chemical property changes of ultra low-kappa SiOCH in aspect of cleaning and chemical repair processes
Oszinda, T.; Schaller, M.; Fischer, D.; Walsh, C.; Schulz, S.E.
Konferenzbeitrag, Zeitschriftenaufsatz
2010Metallisierungsverfahren für die 3D Integration in der Mikroelektronik und Mikrosystemtechnik
Hofmann, L.; Ecke, R.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2010Mikro- und Nanotechnologien für Smart Integrated Systems
Gessner, T.; Vogel, M.; Schulz, S.E.; Wiemer, M.; Hiller, K.; Kurth, S.
Zeitschriftenaufsatz
2010Neue Materialien und Technologien für Nanoelektronik und Sensorik
Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2010Optimized wetting behavior of water-based cleaning solutions for plasma etch residue removal by application of surfactants
Ahner, N.; Zimmermann, S.; Schaller, M.; Schulz, S.E.
Konferenzbeitrag
2010Phosphane copper(I) dicarboxylates: Synthesis and their potential use as precursors for the spin-coating process in the deposition of copper
Jakob, A.; Rüffer, T.; Ecorchard, P.; Walfort, B.; Körbitz, K.; Frühauf, J.; Schulz, S.E.; Gessner, T.; Lang, H.
Zeitschriftenaufsatz
2010Phosphite copper(I) trifluoroacetates [((RO)(3)P)(m)CuO2CCF3] (m=1, 2, 3): synthesis, solid state structures and their potential use as CVD precursors
Mothes, R.; Rüffer, T.; Shen, Y.Z.; Jakob, A.; Walfort, B.; Petzold, H.; Schulz, S.E.; Ecke, R.; Gessner, T.; Lang, H.
Zeitschriftenaufsatz
2010Pulse reverse electroplating for TSV filling in 3D integration
Hofmann, L.; Ecke, R.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2009Characterization of plasma damaged porous ULK SiCOH layers in aspect of changes in the diffusion behavior of solvents and repair-chemicals
Oszinda, T.; Schaller, M.; Fischer, D.; Schulz, S.E.
Konferenzbeitrag
2009Controlling the formation of nanoparticles for definite growth of carbon nanotubes for interconnect applications
Hermann, S.; Ecke, R.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2009Copper oxide ALD from a Cu(I) beta-diketonate: Detailed growth studies on SiO2 and TaN
Wächtler, T.; Roth, N.; Mothes, R.; Schulze, S.; Schulz, S.E.; Gessner, T.; Lang, H.; Hietschold, M.
Konferenzbeitrag
2009Copper oxide ALD from a Cu(I) beta-diketonate: Growth studies and application as seed layers for electrochemical copper deposition
Waechtler, T.; Hofmann, L.; Mothes, R.; Schulze, S.; Schulz, S.E.; Gessner, T.; Lang, H.; Hietschold, M.
Abstract
2009Copper oxide films grown by atomic layer deposition from Bis(tri-n-butylphosphane)copper(I)acetylacetonate on Ta, TaN, Ru, and SiO2
Waechtler, T.; Oswald, S.; Roth, N.; Jakob, A.; Lang, H.; Ecke, R.; Schulz, S.E.; Gessner, T.; Moskvinova, A.; Schulze, S.; Hietschold, M.
Zeitschriftenaufsatz
2009Detailed study of copper oxide ALD on SiO2, TaN, and Ru
Wächtler, T.; Schulze, S.; Hofmann, L.; Hermann, S.; Roth, N.; Schulz, S.E.; Gessner, T.; Lang, H.; Hietschold, M.
Poster
2009Electrochemical deposition of reactive nanoscale metallization systems for low temperature bonding in 3D integration
Hofmann, L.; Braeuer, J.; Baum, M.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2009Improved characterization of Fourier transform infrared spectra analysis for post-etched ultra-low-kappa SiOCH dielectric using chemometric methods
Oszinda, T.; Beyer, V.; Schaller, M.; Fischer, D.; Bartsch, C.; Schulz, S.E.
Konferenzbeitrag, Zeitschriftenaufsatz
2009Improvement of etch processes for SiCOH materials with novel in situ diagnostic and evaluation methods
Zimmermann, S.; Ahner, N.; Blaschta, F.; Schaller, M.; Zimmermann, H.; Rülke, H.; Lang, N.; Röpcke, J.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2009Metallisierungsverfahren für die 3D Integration in der Mikroelektronik und Mikrosystemtechnik
Hofmann, L.; Ecke, R.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2009Process development for smart systems integration in MEMS
Ecke, R.; Frömel, J.; Schulz, S.E.; Wiemer, M.; Gessner, T.
Zeitschriftenaufsatz
2009Restoration of plasma damaged porous ultra low-k SiOCH films: A coating process with UV activation versus a vapor phase process with thermal activation
Oszinda, T.; Schaller, M.; Leppack, S.; Schulz, S.E.
Konferenzbeitrag
2009Selective deposition of aligned carbon nanotubes for NEMS applications
Bonitz, J.; Hermann, S.; Loschek, S.; Liu, P.; Schulz, S.E.
Konferenzbeitrag
2009Surface energy and wetting behaviour of plasma etched porous SiCOH surfaces and plasma etch residue cleaning solutions
Ahner, N.; Schaller, M.; Bartsch, C.; Baryschpolec, E.; Schulz, S.E.
Konferenzbeitrag
2009Surfactants as an additive to wet cleaning solutions for plasma etch residue removal: Compatibility to a porous CVD-SiCOH ultra low-k dielectric material
Ahner, N.; Schulz, S.E.; Zacher, M.
Konferenzbeitrag
2009Vom Open Government zur digitalen Agora
Graudenz, D.; Krug, B.; Hoffmann, C.; Schulz, S.E.; Warnecke, T.; Klessmann, J.
Bericht
2008Airgap structures by using sacrificial wet etch: Fabrication, thermal and mechanical behaviour, reliability
Schulze, K.; Schulz, S.E.; Koerner, H.; Gessner, T.
Konferenzbeitrag
2008ALD of Copper and Copper Oxide Thin Films for Applications in Metallization Systems of ULSI Devices
Waechtler, T.; Oswald, S.; Roth, N.; Lang, H.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2008Copper and copper oxide composite films deposited by ALD on tantalum-based diffusion barriers
Wächtler, T.; Oswald, S.; Pohlers, A.; Schulze, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2008Copper(I) Carboxylates of Type [(nBu3P)mCuO2CR] (m = 1, 2, 3) - Synthesis, Properties, and their Use as CVD Precursors
Jakob, A.; Shen, Y.; Wächtler, T.; Schulz, S.E.; Gessner, T.; Riedel, R.; Fasel, C.; Lang, H.
Zeitschriftenaufsatz
2008Copper oxide and copper thin films grown by ALD for seed layer applications
Wächtler, T.; Schulz, S.E.
Konferenzbeitrag
2008Evaluation of airgap structures produced by wet etch of sacrificial dielectrics: Impact of wet etch media on diffusion barriers, copper, and the Cu/SiC:H interface
Schulze, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2008Investigation of etch processes of dense and porous low-k dielectrics using OES and QMS as in situ diagnostic methods
Zimmermann, S.; Blaschta, F.; Schaller, M.; Rülke, H.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2008Metallization by chemical vapor deposition of W and Cu
Klumpp, A.; Wieland, R.; Ecke, R.; Schulz, S.E.
Aufsatz in Buch
2008New precursors for CVD copper metallization
Norman, J.A.T.; Perez, M.; Schulz, S.E.; Wächtler, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2008Optical, electrical and structural properties of spin-on MSQ low-k dielectrics over a wide temperature range
Ahner, N.; Schulz, S.E.; Blaschta, F.; Rennau, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2008Study of nano-mechanical properties for thin porous films through instrumented indentation: SiO2 low dielectric constant films as an example
Herrmann, M.; Richter, F.; Schulz, S.E.
Konferenzbeitrag, Zeitschriftenaufsatz
20073D-integrated Si- and SiGe CMOS-devices by ICV-SLID technology
Wieland, R.; Ecke, R.; Klumpp, A.; Merkel, R.; Schulz, S.E.; Ramm, P.
Konferenzbeitrag
2007Achieving ultra low k dielectric constant for nanoelectronics interconnect systems
Schulz, S.E.; Schulze, K.
Konferenzbeitrag
2007Atomic layer deposition of copper and copper oxide for applications in microelectronic metallization systems
Waechtler, T.; Schulz, S.E.; Oswald, S.; Gessner, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2007Characterization of sputtered Ta and TaN films by spectroscopic ellipsometry
Waechtler, T.; Gruska, B.; Zimmermann, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2007CMP issues arising from novel materials and concepts in the BEOL of advanced Microelectronic Devices
Gottfried, K.; Schubert, I.; Schulze, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2007Evaluation of Air Gap structures produced by wet etch of sacrificial dielectrics: Critical processes and reliability of Air Gap formation
Schulze, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2007Impact of dielectric material and metal arrangement on thermal behaviour of interconnect systems
Schulze, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2007Influence of barrier crystallization on CV characteristics of MIS structures
Ecke, R.; Rennau, M.; Zimmermann, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2007Novel Copper(I) and Silver(I) Complexes as Precursors for Chemical Vapor Deposition and Spin-Coating of Copper and Silver
Frühauf, S.; Gessner, T.; Haase, T.; Jakob, A.; Kohse-Hoeinghaus, K.; Lang, H.; Schulz, S.E.; Wächtler, T.
Konferenzbeitrag
2007Phosphane copper(I) complexes as CVD precursors
Roth, N.; Jakob, A.; Waechtler, T.; Schulz, S.E.; Gessner, T.; Lang, H.
Zeitschriftenaufsatz, Konferenzbeitrag
2007Thermal stability and gap-fill properties of spin-on MSQ low-k dielectrics
Ahner, N.; Schulz, S.E.; Blaschta, F.; Rennau, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2007Thermomechanical properties of thin organosilicate glass films treated with ultraviolet-assisted cure
Iacopi, F.; Beyer, G.; Travaly, Y.; Waldfried, C.; Gage, D.M.; Dauskardt, R.H.; Houthoofd, K.; Jacobs, P.; Adriaensens, P.; Schulze, K.; Schulz, S.E.; List, S.; Carlotti, G.
Zeitschriftenaufsatz
2006Cu/barrier CMP on porous low-k based interconnect schemes
Gottfried, K.; Schubert, I.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2005The current limits of the laser-acoustic test method to characterize low-k films
Schneider, D.; Frühauf, S.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2005Material development for integrated optics, microelectronics and display technology - selected examples
Dreyer, C.; Schneider, J.; Keil, N.; Zawadzki, C.; Yao, H.H.; Schuldt, U.; Schulze, K.; Kahle, O.; Schulz, S.E.; Uhlig, M.; Uhlig, C.; Boeffel, C.; Gessner, T.; Bauer, M.
Konferenzbeitrag
2005Novel low-k polycyanurates for integrated circuit (IC) metallization
Schulze, K.; Schuldt, U.; Kahle, O.; Schulz, S.E.; Uhlig, M.; Uhlig, C.; Dreyer, C.; Bauer, M.; Gessner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2005Scaling down thickness of ULK materials for 65 nm node and below and its effect on electrical performance
Frühauf, S.; Himcinschi, C.; Rennau, M.; Schulze, K.; Schulz, S.E.; Friedrich, M.; Gessner, T.; Zahn, D.R.T.; Le, Q.T.; Caluwaerts, R.
Konferenzbeitrag, Zeitschriftenaufsatz
2004Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy
Himcinschi, C.; Friedrich, M.; Frühauf, S.; Schulz, S.E.; Gessner, T.; Zahn, D.R.T.
Konferenzbeitrag, Zeitschriftenaufsatz
2004Improvement of mechanical integrity of ultra low k dielectric stack and CMP compatibility
Schulze, K.; Schulz, S.E.; Frühauf, S.; Körner, H.; Seidel, U.; Schneider, D.; Gessner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2003CVD TiN layers as diffusion barrier films on porous SiO2 aerogel
Bonitz, J.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2003Deposition and treatment of titanium based barrier layers by MOCVD
Ecke, R.; Schulz, S.E.; Gessner, T.; Riedel, S.; Lipp, E.; Eizenberg, M.
Konferenzbeitrag
2003Influence of SiH4 on the WN4-PECVD process
Ecke, R.; Schulz, S.E.; Hecker, M.; Mattern, N.; Gessner, T.
Konferenzbeitrag
2003Thermal conductivity of ultra low-k dielectrics
Delan, A.; Rennau, M.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2002Copper alloy formation and film properties after annealing of Al/Cu stacks in different ambients
Chen, Z.; Richter, K.; Riedel, S.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
2002InterChip via technology by using copper for vertical system integration
Ramm, P.; Bonfert, D.; Ecke, R.; Iberl, F.; Klumpp, A.; Riedel, S.; Schulz, S.E.; Wieland, R.; Zacher, M.; Gessner, T.
Konferenzbeitrag
2001Charakterisierung von CVD-WNx-Schichten als Barriere gegen Kupferdiffusion
Ecke, R.; Richter, K.; Schulz, S.E.; Gessner, T.
Konferenzbeitrag
2001Copper metallization scheme for vertical chip integration
Riedel, S.; Ecke, R.; Schulz, S.E.; Gessner, T.; Wieland, R.; Leutenecker, R.; Klumpp, A.; Ramm, P.
Konferenzbeitrag
2001Influence of barrier and cap layer deposition on the properties of capped and non-capped porous silicon oxide
Schulz, S.E.; Koerner, H.; Murray, C.; Streiter, I.; Gessner, T.
Zeitschriftenaufsatz
2001Influence of different treatment techniques on the barrier properties of MOCVD TiN against copper diffusion
Riedel, S.; Schulz, S.E.; Baumann, J.; Rennau, M.; Gessner, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2001Nanoporous dielectric materials for advanced CMOS
Gessner, T.; Bohuslavova, A.; Schulz, S.E.
Konferenzbeitrag
2001Neue Dünnschichtmaterialien für die fortgeschrittene Mikroelektronik
Gessner, T.; Schulz, S.E.
Abstract
2000Investigation of the plasma treatment in a multistep TiN MOCVD process
Riedel, S.; Schulz, S.E.; Gessner, T.
Zeitschriftenaufsatz
1998Morphology and electromigration lifetime of copper lines with different barriers
Schulz, S.E.; Baumann, J.; Weidner, J.-O.; Hasse, W.; Koerner, H.; Gessner, T.
Konferenzbeitrag