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| 2008 | Nanostructured polymer thin films: Application to biosensors
Gavillet, J.; Getin, S.; Quesnel, E.; Martin, S.; Gelapierre, G.; Hiller, K.; Nestler, J.; Gessner, T.; Soechtig, J.; Voirin, G.; Buergi, L.; Auerswald, J.; Knapp, H.F.; Ross, S.; Bigot, S.; Ehrat, M.; Lieb, A.; Beckers, M.-C.; Dresse, D. | Konferenzbeitrag |
| 2007 | Integration aspects of a polymer based SPR biosensor with active micro optical and micro fluidic elements
Hiller, K.; Nestler, J.; Gessner, T.; Gavillet, J.; Getin, S.; Quesnel, E.; Martin, S.; Delapierre, G.; Soechtig, J.; Voirin, G.; Buergi, L.; Auerswald, J.; Knapp, H.F.; Stanley, R.; Bigot, S.; Dimov, S.; Ehrat, M.; Lieb, A.; Beckers, M.-C.; Dresse, D.; Victor-Pujebet, E. | Konferenzbeitrag |
| 2002 | Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films
Tikhonravov, A.V.; Trubetskov, M.K.; Kokarev, M.A.; Amotchkina, T.V.; Duparre, A.; Quesnel, E.; Ristau, D.; Gunster, S. | Zeitschriftenaufsatz |
| 2002 | Ultraviolet optical and microstructural properties of MgF 2 and LaF 3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation
Ristau, D.; Gunster, S.; Bosch, S.; Duparre, A.; Masetti, E.; Ferre-Borrull, J.; Kiriakidis, G.; Peiro, F.; Quesnel, E.; Tikhonravov, A. | Zeitschriftenaufsatz |
| 2001 | Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry
Tikhonravov, A.V.; Trubetskov, M.K.; Krasilnikova, A.V.; Masetti, E.; Duparre, A.; Quesnel, E.; Ristau, D. | Zeitschriftenaufsatz |
| 2001 | Laser damage studies on MgF2 thin films
Protopapa, M.L.; Thomasi, F. de; Perrone, M.R.; Piegari, A.; Masetti, E.; Ristau, D.; Quesnel, E.; Duparre, A. | Zeitschriftenaufsatz |
| 2001 | Procedure to characterize microroughness of optical thin films: Application to ion-beam-sputtered vacuum-ultraviolet coatings
Ferre-Borrull, J.; Duparre, A.; Quesnel, E. | Zeitschriftenaufsatz |
| 2000 | Microroughness analysis of thin film components for VUV applications
Ferre-Borrull, J.; Duparre, A.; Steinert, J.; Ristau, D.; Quesnel, E. | Konferenzbeitrag |
| 2000 | A new procedure for the optical characterization of high quality thin films
Bosch, S.; Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J.; Günster, S.; Ristau, D. | Konferenzbeitrag |
| 2000 | Optical characterization of materials deposited by different processes: the LaF3 in the UV-visible region
Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J. | Konferenzbeitrag |
| 2000 | Roughness and Light Scattering of Ion-Beam-Sputtered Fluoride Coatings for 193 nm
Ferre-Borrull, J.; Duparre, A.; Quesnel, E. | Zeitschriftenaufsatz |
| 1999 | DUV light scattering and morphology of ion beam sputtered fluoride coatings
Quesnel, E.; Petit dit Dariel, A.; Duparre, A.; Ferre-Borrull, J.; Steinert, J. | Konferenzbeitrag |
| 1999 | Laser damage of optical coatings from UV to deep UV at 193 nm
Dijon, J.; Quesnel, E.; Pelle, C.; Thielsch, R. | Konferenzbeitrag |