Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2014Role of the dielectric for the charging dynamics of the dielectric/barrier interface in AlGaN/GaN based metal-insulator-semiconductor structures under forward gate bias stress
Lagger, Peter; Steinschifter, P.; Reiner, M.; Stadtmüller, M.; Denifl, G.; Naumann, Andreas; Müller, Johannes; Wilde, Lutz; Sundqvist, Jonas; Pogany, D.
Zeitschriftenaufsatz
2008Transient latch-up analysis of power control device with combined light emission and backside transient interferometric mapping methods
Heer, M.; Pogany, D.; Street, M.; Smith, I.; Riedlberger, F.; Bonfert, D.; Gieser, H.A.
Konferenzbeitrag
2005Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, N.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; Heyn, V. de; Natarajan, M.; Groeseneken, G.; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M.
Zeitschriftenaufsatz
2004Internal behavior of BCD ESD protection devices under TLP and very-fast TLP stress
Blaho, M.; Zullino, L.; Wolf, H.; Stella, R.; Andreini, A.; Gieser, H.A.; Pogany, D.; Gornik, E.
Zeitschriftenaufsatz
2003Impact of layer thickness variations of SOI-wafer on ESD-robustness
Graf, M.; Dietz, F.; Dudek, V.; Bychikhin, S.; Pogany, D.; Gornik, E.; Soppa, W.; Wolf, H.
Konferenzbeitrag
2003Internal behavior of BCD ESD protection devices under very-fast TLP stress
Blaho, M.; Pogany, D.; Gornik, E.; Zullino, L.; Morena, E.; Stella, R.; Andreini, A.
Konferenzbeitrag
2003Investigation of ESD protection elements under high current stress in CDM-like time domain using backside laser interferometry
Bychikhin, S.; Dubec, V.; Litzenberger, M.; Pogany, D.; Gornik, E.; Groos, G.; Esmark, K.; Stecher, M.; Stadler, W.; Gieser, H.; Wolf, H.
Konferenzbeitrag, Zeitschriftenaufsatz
2003Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, N.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; Heyn, M. de; Natarajan, M.I.; Groeseneken, G.; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M.
Konferenzbeitrag