Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2006Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging
Mikulik, P.; Lübbert, D.; Pernot, P.; Helfen, L.; Baumbach, T.
Konferenzbeitrag
2006Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging
Helfen, L.; Myagotin, A.; Pernot, P.; DiMichiel, M.; Mikulik, P.; Berthold, A.; Baumbach, T.
Konferenzbeitrag
2005'In-situ' observation of dynamical diffraction by means of Medipix2 sensor crystal fulfilling Bragg condition
Mitschke, M.; Pernot, P.; Helfen, L.; Scherzer, S.; Zwerger, A.; Baumbach, T.
Konferenzbeitrag
2005Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging
Lübbert, D.; Ferrari, C.; Mikulik, P.; Pernot, P.; Helfen, L.; Verdi, N.; Korytar, D.; Baumbach, T.
Zeitschriftenaufsatz
2005High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography
Helfen, L.; Baumbach, T.; Mikulik, P.; Kiel, D.; Pernot, P.; Cloetens, P.; Baruchel, J.
Zeitschriftenaufsatz
2005Investigation of pore initiation in metal foams by synchrotron-radiation tomography
Helfen, L.; Baumbach, T.; Pernot, P.; Cloetens, P.; Stanzick, H.; Schladitz, K.; Banhart, J.
Zeitschriftenaufsatz
2005Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging
Lübbert, D.; Baumbach, T.; Mikulik, P.; Pernot, P.; Helfen, L.; Köhler, R.; Katona, T.M.; Keller, S.; DenBaars, S.P.
Zeitschriftenaufsatz
2003Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping
Mikulik, P.; Lubbert, D.; Korytar, D.; Pernot, P.; Baumbach, T.
Zeitschriftenaufsatz
2002Advanced x-ray imaging techniques for semiconductor wafer characterisation
Baumbach, T.; Mikulik, P.; Korytar, D.; Pernot, P.; Lubbert, D.; Helfen, L.; Herms, M.; Landesberger, C.
Konferenzbeitrag