Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Analytical model for thin-film SOI PIN-diode leakage current
Schmidt, Andrei; Dreiner, Stefan; Vogt, Holger; Goehlich, Andreas; Paschen, Uwe
Zeitschriftenaufsatz
2017First results on DEPFET Active Pixel Sensors fabricated in a CMOS foundry - a promising approach for new detector development and scientific instrumentation
Aschauer, Stefan; Majewski, Petra; Lutz, Gerhard; Soltau, Heike; Holl, Peter; Hartmann, Robert; Schlosser, Dieter; Paschen, Uwe; Weyers, Sascha; Dreiner, Stefan; Klusmann, Miriam; Hauser, Julia; Kalok, David; Bechteler, Alois; Heinzinger, Klaus; Porro, Matteo; Titze, Barbara; Strüder, Lothar
Zeitschriftenaufsatz
2016Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Zeitschriftenaufsatz
2016Silicon based single-photon avalanche diode (SPAD) technology for low-light and high-speed applications
Durini, Daniel; Paschen, Uwe; Schwinger, Alexander; Spickermann, Andreas
Aufsatz in Buch
2015Beschleunigte Zuverlässigkeitsuntersuchung von Siliziumnitrid bei schmalbandiger UV-Bestrahlung
Schmidt, Andrei; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag
2015Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag
2015Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag, Zeitschriftenaufsatz
2015High temperature SOI CMOS technology and circuit realization for applications up to 300°C
Kappert, Holger; Kordas, Norbert; Dreiner, Stefan; Paschen, Uwe; Kokozinski, Rainer
Konferenzbeitrag
2015Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps
Schmidt, Andrei; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag
2014CMOS SPADs with up to 500 µm diameter and 55% detection efficiency at 420 nm
Villa, Federica; Bronzi, Danilo; Zou, Yu; Scarcella, Carmelo; Boso, Gianluca; Tisa, Simone; Tosi, Alberto; Zappa, Franco; Durini, Daniel; Weyers, Sascha; Paschen, Uwe; Brockherde, Werner
Zeitschriftenaufsatz
2014High temperature 0.35 micron Silicon-on-Insulator CMOS technology
Kappert, Holger; Dreiner, Stefan; Kordas, Norbert; Schmidt, Alexander; Paschen, Uwe; Kokozinski, Rainer
Konferenzbeitrag
2014Low-noise CMOS SPAD arrays with in-pixel time-to-digital converters
Tosi, Alberto; Villa, Federica; Bronzi, Danilo; Zou, Yu; Lussana, Rudi; Tamborini, Davide; Tisa, Simone; Durini, Daniel; Weyers, Sascha; Paschen, Uwe; Brockherde, Werner; Zappa, Franco
Konferenzbeitrag
2014Reliability of CMOS on silicon-on-insulator for use at 250 °C
Grella, Katharina; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe
Zeitschriftenaufsatz
2014Zuverlässigkeitsuntersuchungen an einer hochtemperaturtauglichen SOI-CMOS-Technologie
Dreiner, Stefan; Grella, Katharina; Heiermann, Wolfgang; Kelberer, Andreas; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Zeitschriftenaufsatz
2013Development of high voltage for a 0.18 µm CMOS process: A heterogeneous technology alliance project
Dreiner, Stefan; Weyers, Sascha; Mehta, M.; Paschen, Uwe
Aufsatz in Buch
2013High temperature characterization up to 450°C of MOSFETs and basic circuits realized in a Silicon-on-Insulator (SOI) CMOS-technology
Grella, Katharina; Dreiner, Stefan; Schmidt, Alexander; Heiermann, Wolfgang; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Zeitschriftenaufsatz
2013High temperature reliability investigations up to 350 °C of gate oxid capacitors realized in a Silicon-on-Insulator CMOS-technology
Grella, Katharina; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag
2013Large-area CMOS SPADs with very low dark counting rate
Bronzi, Danilo; Villa, Federica; Bellisai, Simone; Tisa, Simone; Tosi, Alberto; Ripamonti, Giancarlo; Zappa, Franco; Weyers, Sascha; Durini, Daniel; Brockherde, Werner; Paschen, Uwe
Konferenzbeitrag
2013Leistungselektronik und elektrische Antriebstechnik
März, Martin; Eilers, Dirk; Gillner, Arnold; Schliwinski, Hans-Jürgen; Schneider-Ramelow, Martin; Schubert, Thomas; Partsch, Uwe; Paschen, Uwe; Wilken, Ralph
Aufsatz in Buch
2013Reliability investigations up to 350°C of gate oxid capacitors realized in a Silicon-on-Insulator CMOS-technology
Grella, Katharina; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe
Zeitschriftenaufsatz
2012High temperature characterization up to 450 °C of MOSFETs and basic circuits realized in a Silicon-on-Insulator (SOI) CMOS-technology
Grella, Katharina; Dreiner, Stefan; Schmidt, Alexander; Heiermann, Wolfgang; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag
2012Low-noise and large-area CMOS SPADs with timing response free from slow tails
Bronzi, Danilo; Villa, Federica; Bellisai, Simone; Markovic, Bojan; Tisa, Simone; Tosi, Alberto; Zappa, Franco; Weyers, Sascha; Durini, Daniel; Brockherde, Werner; Paschen, Uwe
Konferenzbeitrag
2012Quantum efficiency determination of a novel CMOS design for fast imaging applications in the extreme ultraviolet
Herbert, Stefan; Banyay, Matus; Maryasov, Alexey; Hochschulz, Frank; Paschen, Uwe; Vogt, Holger; Juschkin, Larissa
Zeitschriftenaufsatz
2012Reducing the impact of process variations on the sensitivity of CMOS photodiodes
Hochschulz, Frank; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe
Aufsatz in Buch
2012SPAD detector for long-distance 3D ranging with sub-nanosecond TDC
Villa, Federica; Markovic, Bojan; Bronzi, Danilo; Bellisai, Simone; Boso, G.; Scarcella, C.; Tosi, Alberto; Durini, Daniel; Weyers, Sascha; Paschen, Uwe; Brockherde, Werner
Konferenzbeitrag
2012SPAD smart pixel for time-of-flight and time-correlated single-photon counting measurements
Villa, F.; Markovic, B.; Bellisai, S.; Bronzi, D.; Tosi, A.; Zappa, F.; Tisa, S.; Durini, Daniel; Weyers, Sascha; Paschen, Uwe; Brockherde, Werner
Zeitschriftenaufsatz
2011CMOS photodiodes for narrow linewidth applications
Hochschulz, Frank; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag
2010Coupling of Monte Carlo sputter simulation and feature-scale profile simulation and application to the simulation of back etching of an intermetal dielectric
Baer, E.; Kunder, D.; Lorenz, J.; Sekowski, M.; Paschen, Uwe
Konferenzbeitrag
2006RF-circuits in digital CMOS processes
Stücke, Thomas; Christoffers, Niels; Paschen, Uwe
Konferenzbeitrag