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| 2020 | Electron and proton irradiation effect on the minority carrier lifetime in SiC passivated p-doped Ge wafers for space photovoltaics
Weiss, Charlotte; Park, Seonyong; Lefèvre, Jérémie; Boizot, Bruno; Mohr, Christian; Cavani, Olivier; Picard, Sandrine; Kurstjens, Rufi; Niewelt, Tim; Janz, Stefan | Zeitschriftenaufsatz |
| 2020 | Impact of Postplating Annealing on Defect Activation in Boron-Doped PERC Solar Cells
Grübel, B.; Theil, G.C.; Roder, S.; Niewelt, T.; Kluska, S. | Zeitschriftenaufsatz |
| 2019 | Analysis of Temperature Dependent Characteristics of Diffused Regions in Silicon Solar Cells
Eberle, R.; Fell, A.; Richter, A.; Niewelt, T.; Schindler, F.; Schubert, M. | Konferenzbeitrag |
| 2019 | Analysis of Temperature Dependent Surface Recombination Properties
Eberle, R.; Fell, A.; Niewelt, T.; Schindler, F.; Schubert, M.C. | Konferenzbeitrag |
| 2019 | Imaging Interstitial Iron Concentrations in Gallium-Doped Silicon Wafers
Post, R.; Niewelt, T.; Schön, J.; Schindler, F.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2019 | Impact of POCl3 Diffusion Process Parameters on Oxygen Precipitation in Czochralski-Grown Silicon
Maus, S.; Lohmüller, S.; Mu, D.; Schön, J.; Niewelt, T.; Wolf, A.; Preu, R. | Konferenzbeitrag |
| 2019 | Investigation of LeTID where we can Control it - Application of FZ Silicon for Defect Studies
Niewelt, T.; Post, R.; Schindler, F.; Kwapil, W.; Schubert, M.C. | Konferenzbeitrag |
| 2019 | Lifetime-limiting defects in monocrystalline Silicon
Niewelt, Tim
: Weber, Eike R. (Referent); Glunz, Stefan W. (Referent) | Dissertation |
| 2019 | Re-evaluation of the SRH-Parameters for the FeGa Defect
Post, R.; Niewelt, T.; Yang, W.; Macdonald, D.; Kwapil, W.; Schubert, M.C. | Konferenzbeitrag |
| 2018 | Analysis of Defect Recombination Based on Shockley-Read-Hall Statistics - Where we com from: The DPSS Approach
Niewelt, T. | Vortrag |
| 2018 | Carrier-Selective Contacts for High-Efficiency Silicon Solar Cells
Glunz, S.; Feldmann, F.; Polzin, J.; Steinhauser, B.; Müller, R.; Fell, A.; Richter, A.; Niewelt, T.; Schindler, F.; Kökbudak, G.; Turan, R.; Nogay, G.; Löper, P.; Young, D.L.; Lee, B.G.; Stradins, P.; Bivour, M.; Cariou, R.; Benick, J.; Dimroth, F.; Hermle, M. | Vortrag |
| 2018 | Iron Imaging on Ga Doped Wafers
Post, R.; Niewelt, T.; Schön, J.; Schindler, F.; Schubert, M.C. | Vortrag |
| 2018 | Limiting Effects in Crystalline Silicon for High-Efficiency Solar Cells
Niewelt, T.; Richter, A.; Eberle, R.; Post, R.; Schön, J.; Schindler, F.; Hermle, M.; Kwapil, W.; Schubert, M. | Vortrag |
| 2018 | An open source based repository for defects in silicon
Juhl, Mattias K.; Heinz, Friedemann D.; Coletti, Gianluca; Macdonald, Daniel; Rougieux, Fiacre E.; Schindler, Florian; Niewelt, Tim; Schubert, Martin C. | Konferenzbeitrag |
| 2018 | Taking monocrystalline silicon to the ultimate lifetime limit
Niewelt, Tim; Richter, Armin; Kho, T.C.; Grant, N.E.; Bonilla, R.S.; Steinhauser, Bernd; Polzin, Jana-Isabelle; Feldmann, Frank; Hermle, Martin; Murphy, J.D.; Phang, S.P.; Kwapil, Wolfram; Schubert, Martin C. | Zeitschriftenaufsatz |
| 2018 | Taking Monocrystalline Silicon to the Ultimate Lifetime Limit
Niewelt, T.; Richter, A.; Kho, T.; Grant, N.; Bonilla, R.; Steinhauser, B.; Polzin, J.-I.; Feldmann, F.; Hermle, M.; Murphy, J.; Phang, S.; Kwapil, W.; Schubert, M.C. | Vortrag |
| 2017 | Degradation of Crystalline Silicon Due to Boron Oxygen Defects
Niewelt, T.; Schön, J.; Warta, W.; Glunz, S.W.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2017 | Experimental evidence of electron capture and emission from trap levels in Cz silicon
Heinz, F.D.; Niewelt, T.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2017 | Kinetics of carrier-induced degradation at elevated temperature in multicrystalline silicon solar cells
Kwapil, W.; Niewelt, T.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2017 | Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon
Niewelt, T.; Selinger, M.; Grant, N.; Kwapil, W.M.; Murphy, J.D.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2017 | Long-term stability of aluminum oxide based surface passivation schemes under illumination at elevated temperatures
Niewelt, T.; Kwapil, W.M.; Selinger, M.; Richter, A.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2017 | Stability of effective lifetime of float-zone silicon wafers with AlOx surface passivation schemes under illumination at elevated temperature
Niewelt, T.; Kwapil, W.; Selinger, M.; Richter, A.; Schubert, M.C. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2017 | Superacid-treated silicon surfaces: Extending the limit of carrier lifetime for photovoltaic applications
Grant, N.E.; Niewelt, T.; Wilson, N.R.; Wheeler-Jones, E.C.; Bullock, J.; Al-Amin, M.; Schubert, M.C.; Veen, A.C. van; Javey, A.; Murphy, J.D. | Zeitschriftenaufsatz |
| 2017 | Understanding the light-induced degradation at elevated temperatures: Similarities between multicrystalline and floatzone p-type silicon
Niewelt, T.; Schindler, F.; Kwapil, W.; Eberle, R.; Schön, J.; Schubert, M.C. | Konferenzbeitrag |
| 2016 | Experimental proof of the slow light-induced degradation component in compensated n-type silicon
Niewelt, T.; Schön, J.; Broisch, J.; Rein, S.; Haunschild, J.; Warta, W.; Schubert, M.C. | Konferenzbeitrag |
| 2016 | Fast in-situ photoluminescence analysis for a recombination parameterization of the fast BO defect component in silicon
Niewelt, T.; Mägdefessel, S.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2016 | Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging
Schön, J.; Youssef, A.; Park, S.; Mundt, L.E.; Niewelt, T.; Mack, S.; Nakajima, K.; Morishita, K.; Murai, R.; Jensen, M.A.; Buonassisi, T.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2016 | Swirl Defect Investigation Using Temperature- and Injection-Dependent Photoluminescence Imaging
Youssef, A.; Schön, J.; Niewelt, T.; Mack, S.; Park, S.; Nakajima, K.; Morishita, K.; Murai, R.; Jensen, M.A.; Buonassisi, T.; Schubert, M.C. | Konferenzbeitrag |
| 2016 | A unified parameterization of the formation of boron oxygen defects and their electrical activity
Niewelt, T.; Schön, J.; Broisch, J.; Mägdefessel, S.; Warta, W.; Schubert, M.C. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2015 | Characterization and modelling of the boron-oxygen defect activation in compensated n-type silicon
Schön, J.; Niewelt, T.; Broisch, J.; Warta, W.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2015 | Electrical characterization of the slow boron oxygen defect component in Czochralski silicon
Niewelt, T.; Schön, J.; Broisch, J.; Warta, W.; Schubert, M.C. | Zeitschriftenaufsatz |
| 2015 | Light-Induced Degradation and Regeneration in n-Type Silicon
Niewelt, T.; Broisch, J.; Schön, J.; Haunschild, J.; Rein, S.; Warta, W.; Schubert, M.C. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2015 | Spatially resolved impurity identification via temperature- and injection-dependent photoluminescence imaging
Mundt, L.; Schubert, M.C.; Schön, J.; Michl, B.; Niewelt, T.; Schindler, F.; Warta, W. | Zeitschriftenaufsatz |
| 2014 | Interstitial oxygen imaging from thermal donor growth - a fast photoluminescence based method
Niewelt, T.; Lim, S.; Holtkamp, J.; Schön, J.; Warta, W.; Macdonald D.; Schubert, M.C. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2012 | Broad Range Injection-Dependent Minority Carrier Lifetime from Photoluminescence
Giesecke, J.; Niewelt, T.; Rüdiger, M.; Rauer, M.; Schubert, M.; Warta, W. | Zeitschriftenaufsatz |
| 2012 | Passivation layers for indoor solar cells at low irradiation intensities
Rühle, K.; Rauer, M.; Rüdiger, M.; Giesecke, J.; Niewelt, T.; Schmiga, C.; Glunz, S.W.; Kasemann, M. | Zeitschriftenaufsatz, Konferenzbeitrag |