Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analytics
Gruber, David P.; Todt, Juraj; Wöhrl, Nicolas; Zalesak, Jakub; Tkadletz, Michael; Kubec, Adam; Niese, Sven; Burghammer, Manfred; Rosenthal, Martin; Sternschulte, Hadwig; Pfeifenberger, Manuel J.; Sartory, Bernhard; Keckes, Jozef
2018A laboratory X-ray microscopy study of cracks in on-chip interconnect stacks of integrated circuits
Kutukova, Kristina; Niese, Sven; Sander, Christoph; Standke, Yvonne; Gluch, Jürgen; Gall, Martin; Zschech, Ehrenfried
2018Multilayer Laue Lenses (MLL) with 45 mm focal length as optics for in-situ nanoindentation experiments
Kubec, Adam; Niese, Sven; Gluch, Jürgen; Rosenthal, Martin; Todt, Juraj; Keckes, Jozef; Gawlitza, Peter
Zeitschriftenaufsatz, Konferenzbeitrag
2018A novel micro-double cantilever beam (micro-DCB) test in an X-ray microscope to study crack propagation in materials and structures
Kutukova, Kristina; Niese, Sven; Gelb, Jeff; Dauskardt, Reinhold; Zschech, Ehrenfried
2018Sub 25 nm focusing with a long working distance using multilayer Laue lenses
Kubec, Adam; Niese, Sven; Rosenthal, M.; Gluch, Jürgen; Burghammer, M.; Gawlitza, Peter; Keckes, J.; Leson, Andreas
Zeitschriftenaufsatz, Konferenzbeitrag
2017Point focusing with flat and wedged crossed multilayer Laue lenses
Kubec, Adam; Melzer, Kathleen; Gluch, Jürgen; Niese, Sven; Braun, Stefan; Patommel, Jens; Burghammer, Manfred; Leson, Andreas
2016A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses
Niese, Sven; Braun, Stefan; Dietsch, Reiner; Gluch, Jürgen; Holz, Thomas; Huber, Norman; Kubec, Adam; Zschech, Ehrenfried
2016FIB sample preparation for X-ray microscopy and ROI target cross-sectioning
Zschech, Ehrenfried; Gluch, Jürgen; Rosenkranz, Rüdiger; Standke, Yvonne; Niese, Sven
2015Anwendungen der Röntgenmikroskopie in der Mikroelektronik und Energietechnik
Zschech, Ehrenfried; Gluch, Jürgen; Niese, Sven; Lewandowska, Anna; Wolf, Jürgen M.; Röntzsch, Lars; Löffler, Markus
2015Lab-based in-situ X-ray microscopy - methodical developments and applications in materials science and microelectronics
Niese, Sven
: Schmeißer, Dieter (Gutachter); Zschech, Ehrenfried (Gutachter); Schneider, Gerd (Gutachter)
2014Advanced methods for mechanical and structural characterization of nanoscale materials for 3D IC integration
Sander, Christoph; Standke, Yvonne; Niese, Sven; Rosenkranz, Rüdiger; Clausner, André; Gall, Martin; Zschech, Ehrenfried
Zeitschriftenaufsatz, Konferenzbeitrag
2014Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer
Niese, Sven; Krüger, Peter; Kubec, Adam; Laas, Roman; Gawlitza, Peter; Melzer, Kathleen; Braun, Stefan; Zschech, Ehrenfried
2014Full-field X-ray microscopy with crossed partial multilayer Laue lenses
Niese, Sven; Krüger, Peter; Kubec, Adam; Braun, Stefan; Patommel, Jens; Schroer, Christian G.; Leson, Andreas; Zschech, Ehrenfried
2014Multi-scale X-ray tomography for process and quality control in 3D TSV packaging
Zschech, Ehrenfried; Niese, Sven; Löffler, Markus; Wolf, M. Jürgen
2014A new in situ microscopy approach to study the degradation and failure mechanisms of time-dependent dielectric breakdown: Set-up and opportunities
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Aubel, Oliver; Mühle, Uwe; Gluch, Jürgen; Niese, Sven; Standke, Yvonne; Rosenkranz, Rüdiger; Löffler, Markus; Vogel, Norman; Beyer, Armand; Engelmann, Hans Jürgen; Guttmann, Peter; Schneider, Gerhard; Zschech, Ehrenfried
2014Ptychography with multilayer Laue lenses
Kubec, Adam; Braun, Stefan; Niese, Sven; Krüger, Peter; Patommel, Jens; Hecker, Michael; Leson, Andreas; Schroer, Christian G.