Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019On-turbine multisensors based on hybrid ceramic manufacturing technology
Ziesche, Steffen; Goldberg, Adrian; Partsch, Uwe; Kappert, Holger; Kind, Heidrun; Aden, Mirko; Naumann, Falk
Konferenzbeitrag
2018Investigation of Material Dynamic Processes During Shear Test of Aluminum Heavy Wire Bond Contacts
Klengel, R.; Naumann, F.; Tismer, S.; Klengel, S.
Konferenzbeitrag
2018Material Characterization of Advanced Cement-Based Encapsulation Systems for Efficient Power Electronics with Increased Power Density
Böttge, B.; Naumann, F.; Behrendt, S.; Scheibel, M.G.; Kässner, S.; Klengel, S.; Petzold, M.; Nickel, K.G.; Hejtmann, G.; Miric, A.-Z.; Eisele, R.
Konferenzbeitrag
2018Non-destructive Assessment of the Porosity in Silver (Ag) Sinter Joints Using Acoustic Waves
Brand, S.; Böttge, B.; Kögel, M.; Naumann, F.; Zijl, J.; Kersjes, S.; Behrens, T.; Altmann, F.
Konferenzbeitrag
2018Surface integrity in ultra-precision grinding of transparent ceramics
Klocke, Fritz; Dambon, Olaf; Bletek, Thomas; Höche, Thomas; Naumann, Falk; Hutzler, Thomas
Zeitschriftenaufsatz, Konferenzbeitrag
2017On reproducing the copper extrusion of through-silicon-vias from the atomic scale
Liu, J.; Huang, Z.; Conway, P.P.; Altmann, F.; Petzold, M.; Naumann, F.
Konferenzbeitrag
2016Correlation of PVD deposition parameters with electrical and mechanical properties of coated thin-glass compounds
Lorenz, G.; Naumann, F.; Westphalen, J.; Weller, S.; Junghähnel, M.
Konferenzbeitrag
2016Entwicklung eines visuellen Konzepts zur Unterstützung des ARENA2036-Managements bei der Steuerung der Startprojekte
Trost, Renate; Naumann, Felix; Hyra, Robert; Weber, Marcel; Meyer, Jörg; Berthold, Maik
Aufsatz in Buch
2016Evaluation of the bond quality of laser-joined sapphire wafers using a fresnoite-glass sealant
Pablos-Martin, A. de; Tismer, S.; Naumann, F.; Krause, M.; Lorenz, M.; Grundmann, M.; Höche, T.
Zeitschriftenaufsatz
2016Fracture toughness of ultrashort pulse-bonded fused silica
Richter, S.; Naumann, F.; Zimmermann, F.; Tünnermann, A.; Nolte, S.
Zeitschriftenaufsatz
2016HOT-300 - a multidisciplinary technology approach targeting microelectronic systems at 300 °C operating temperature
Vogt, Holger; Altmann, Frank; Braun, Sebastian; Celik, Yusuf; Dietrich, Lothar; Dietz, Dorothee; Dijk, Marius van; Dreiner, Stefan; Döring, Ralf; Gabler, Felix; Goehlich, Andreas; Hutter, Matthias; Ihle, Martin; Kappert, Holger; Kordas, Norbert; Kokozinski, Rainer; Naumann, Falk; Nowak, Torsten; Oppermann, Hermann; Partsch, Uwe; Petzold, Matthias; Roscher, Frank; Rzepka, Sven; Schubert, Ralph; Weber, Constanze; Wiemer, Maik; Wittler, Olaf; Ziesche, Steffen
Konferenzbeitrag
2016Influence of thin-film properties on the reliability of flexible glass
Westphalen, J.; Junghähnel, M.; Weller, S.; Lorenz, G.; Naumann, F.
Konferenzbeitrag
2016Materials and technologies to enable high temperature stable MEMS and electronics for smart systems used in harsh environments
Gabler, Felix; Roscher, Frank; Döring, Ralf; Otto, Alexander; Ziesche, Steffen; Ihle, Martin; Celik, Yusuf; Dietz, Dorothee; Goehlich, Andreas; Kappert, Holger; Vogt, Holger; Naumann, Falk; Geßner, Thomas
Konferenzbeitrag
2016Numerical prototyping and defect evaluation of scanning acoustic microscopy for advanced failure diagnostics
Naumann, F.; Brand, S.
Konferenzbeitrag
2016Reliability evaluation of Si-dies due to assembly issues
Naumann, F.; Gottschalk, V.; Burchard, B.; Altmann, F.
Zeitschriftenaufsatz
2015Acoustic GHz-microscopy and its potential applications in 3D-integration technologies
Brand, S.; Appenroth, T.; Naumann, F.; Steller, W.; Wolf, M.J.; Czurratis, P.; Altmann, F.; Petzold, M.
Konferenzbeitrag
2015Failure analysis strategies for multistacked memory devices with TSV interconnects
Altmann, F.; Grosse, C.; Naumann, F.; Beyersdorfer, J.; Veches, T.
Konferenzbeitrag
2014Efficient nondestructive 3D defect localization by lock-in thermography utilizing multi-harmonics analysis
Naumann, F.; Altmann, F.; Grosse, C.; Herold, R.
Konferenzbeitrag
2014Mechanical characterization of bond wire materials in electronic devices at elevated temperatures
Lorenz, G.; Naumann, F.; Mittag, M.; Petzold, M.
Konferenzbeitrag
2014Mechanical characterization of glass frit bonded wafers
Vogel, K.; Wuensch, D.; Uhlig, S.; Froemel, J.; Naumann, F.; Wiemer, M.; Gessner, T.
Konferenzbeitrag
2013Advanced characterization of glass frit bonded micro-chevron-test samples based on scanning acoustic microscopy
Naumann, F.; Brand, S.; Bernasch, M.; Tismer, S.; Czurratis, P.; Wünsch, D.; Petzold, M.
Zeitschriftenaufsatz
2013Characterization and modeling of copper TSVs for silicon interposers
Malta, D.; Gregory, C.; Lueck, M.; Lannon, J.; Lewis, J.; Temple, D.; DiFonzo, P.; Naumann, F.; Petzold, M.
Konferenzbeitrag
2013Fracture mechanics life-time modeling of low temperature Si fusion bonded interfaces used for 3D MEMS device integration
Naumann, F.; Bernasch, M.; Siegert, J.; Carniello, S.; Petzold, M.
Konferenzbeitrag
2013Packaging material issues in high temperature power electronics
Boettge, B.; Naumann, F.; Klengel, R.; Klengel, S.; Petzold, M.
Konferenzbeitrag
2013Sample preparation strategies for fast and effective failure analysis of 3D devices
Kwakman, L.; Straw, M.; Coustillier, G.; Sentis, M.; Beyersdorfer, J.; Schischka, J.; Naumann, F.; Altmann, F.
Konferenzbeitrag
2012Failure mechanisms and mechanical characterization of reactive bonded interfaces
Boettge, B.; Schippel, F.; Naumann, F.; Berthold, L.; Lorenz, G.; Gerbach, R.; Bagdahn, J.; Petzold, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2012Influence of test speed on the bonding strength of glass frit bonded wafers
Vogel, K.; Wuensch, D.; Uhlig, S.; Froemel, J.; Naumann, F.; Wiemer, M.; Gessner, T.
Abstract
2012Quality control of bond strength in low-temperature bonded wafers
Siegert, J.; Cassidy, C.; Schrank, F.; Gerbach, R.; Naumann, F.; Petzold, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2012Reliability characterization of heavy wire bonding materials
Naumann, F.; Schischka, J.; Koetter, S.; Milke, E.; Petzold, M.
Konferenzbeitrag
2012A study of factors influencing micro-chevron-testing of glass frit bonded interfaces
Naumann, F.; Bernasch, M.; Brand, S.; Wünsch, D.; Vogel, K.; Czurratis, P.; Petzold, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2011Finite element modeling and raman study of strain distribution in patterned device islands on strained silicon-on-insulator (sSOI) substrates
Gu, D.; Baumgart, H.; Naumann, F.; Petzold, M.
Konferenzbeitrag
2011Modification of second harmonic generation in silicon by strain and structuring
Schriever, C.; Bohley, C.; Naumann, F.; Boor, J. de; Lange, J.; Schilling, J.
Konferenzbeitrag
2011Observation of free surface-induced bending upon nanopatterning of ultrathin strained silicon layer
Moutanabbir, O.; Reiche, M.; Zakharov, N.; Naumann, F.; Petzold, M.
Zeitschriftenaufsatz
2011Strain nano-engineering: SSOI as a playground
Moutanabbir, O.; Hähnel, A.; Reiche, M.; Erfurth, W.; Tarun, A.; Hayazawa, N.; Kawata, S.; Naumann, F.; Petzold, M.
Konferenzbeitrag
2011Strain stability in nanoscale patterned strained silicon-on-insulator
Moutanabbir, O.; Reiche, M.; Hähnel, A.; Erfurth, W.; Motohashi, M.; Tarun, A.; Hayazawa, N.; Kawata, S.; Naumann, F.; Patzold, M.; Holt, M.; Maser, J.
Konferenzbeitrag
2010Fast transient temperature operating micromachined emitter for mid-infrared optical gas sensing systems. Design, fabrication, characterization and optimization
Hildenbrand, J.; Peter, C.; Lamprecht, F.; Kürzinger, A.; Naumann, F.; Ebert, M.; Wehrspohn, R.; Korvink, J.G.; Wöllenstein, J.
Konferenzbeitrag, Zeitschriftenaufsatz
2010Finite element modeling and Raman study of strain distribution in patterned device islands on strained Silicon-on-Insulator (sSOI) substrates
Gu, D.; Baumgart, H.; Naumann, F.; Petzold, M.
Konferenzbeitrag
2010Micromachined mid-infrared emitter for fast transient temperature operation for optical gas sensing systems
Hildenbrand, J.; Korvink, J.; Wollenstein, J.; Peter, C.; Kurzinger, A.; Naumann, F.; Ebert, M.; Lamprecht, F.
Zeitschriftenaufsatz
2010Numerical investigations of the strain behavior in nanoscale patterned strained silicon structures
Naumann, F.; Moutanabbir, O.; Reiche, M.; Schriever, C.; Schilling, J.; Petzold, M.
Konferenzbeitrag
2010Numerische Analyse der Spannungsrelaxation nanostrukturierter sili-ziumbasierter optischer Wellenleiter zur Erzeugung nichtlinearer optischer Effekte
Naumann, F.; Schriever, C.; Bohley, C.; Schilling, J.; Petzold, M.
Konferenzbeitrag
2010Strain stability in nanoscale patterned strained silicon-on-insulator
Moutanabbir, O.; Reiche, M.; Hähnel, A.; Erfurth, W.; Tarun, A.; Hayazawa, N.; Kawata, S.; Naumann, F.; Petzold, M.
Zeitschriftenaufsatz, Konferenzbeitrag
2009The complex evolution of strain during nanoscale patterning of 60 nm thick strained silicon layer directly on insulator
Moutanabbir, O.; Reiche, M.; Erfurth, W.; Naumann, F.; Petzold, M.; Gösele, U.
Zeitschriftenaufsatz
2009Fast transient temperature operating micromachined emitter for mid-infrared for optical gas sensing systems
Hildenbrand, J.; Peter, C.; Lamprecht, F.; Kürzinger, A.; Naumann, F.; Ebert, M.; Wehrspohn, R.; Wöllenstein, J.
Konferenzbeitrag
2009Investigation of strain relaxation in patterned strained silicon-on-insulator structures by Raman spectroscopy and computer simulation
Gu, D.; Naumann, F.; Petzold, M.; Zhu, M.; Baumgart, H.
Konferenzbeitrag
2009Probing the strain states in nanopatterned strained SOI
Moutanabbir, O.; Reiche, M.; Hähnel, A.; Erfurth, W.; Naumann, F.; Petzold, M.; Gösele, U.
Konferenzbeitrag
2009Thermal and mechanical design optimisation of a micro machined mid-infrared emitter for optical gas sensing systems
Naumann, F.; Ebert, M.; Hildenbrand, J.; Moretton, E.; Peter, C.; Wöllenstein, J.
Konferenzbeitrag
2009Thermal simulation of defect localisation using lock-in thermography in complex and fully packaged devices
Schmidt, C.; Naumann, F.; Altmann, F.; Martens, S.; Wilde, J.
Konferenzbeitrag
2008Application of lock-in-thermography for 3D defect localisation in complex devices
Schmidt, C.; Altmann, F.; Grosse, C.; Naumann, F.; Lindner, A.
Konferenzbeitrag
2008Micromachined mid-infrared emitter for fast transient temperature operation for optical gas sensing systems
Hildenbrand, J.; Kürzinger, A.; Peter, C.; Moretton, E.; Wöllenstein, J.; Naumann, F.; Ebert, M.; Korvink, J.
Konferenzbeitrag
2007Dynamic analyses of membranes and thin films on wafer level
Gerbach, R.; Naumann, F.; Ebert, M.; Bagdahn, J.; Klattenhoff, J.; Rembe, C.
Konferenzbeitrag
2007Measurement of dynamic properties of MEMS and the possibilities of parameter identification by simulation
Ebert, M.; Naumann, F.; Gerbach, R.; Bagdahn, J.
Konferenzbeitrag
2004Semantic overlay clusters within super-peer networks
Löser, A.; Naumann, F.; Nejdl, W.; Siberski, W.; Thaden, U.
Konferenzbeitrag
1995Damage characterization of ion beam exposed metal-oxide-semiconductor varactor cells by charge to breakdown measurements
Brünger, W.H.; Buchmann, L.-M.; Naumann, F.; Friedrich, D.; Finkelstein, W.; Mohondro, R.
Konferenzbeitrag
1994Growth kinetics and electrical performance of silicon oxide layer grown by RTP in pure N2O ambient
Lange, P.; Hartmannsgruber, E.; Naumann, F.
Konferenzbeitrag
1994Growth rate and characterization of silicon oxide films grown in N2O atmosphere in a rapid thermal processor
Lange, P.; Bernt, H.; Hartmannsgruber, E.; Naumann, F.
Zeitschriftenaufsatz
1993Schnelle thermische Oxidation von Silizium in N2O-Atmosphäre
Lange, P.; Hartmannsgruber, E.; Naumann, F.; Windbracke, W.
Konferenzbeitrag
1990Comparison between surface channel PMOS transistors processed with optical and X-ray lithography with regard to X-ray damage
Naumann, F.; Bernt, H.; Friedrich, D.; Kaatz, A.; Windbracke, W.
Konferenzbeitrag