Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2006Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging
Mikulik, P.; Lübbert, D.; Pernot, P.; Helfen, L.; Baumbach, T.
Konferenzbeitrag
2006Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging
Helfen, L.; Myagotin, A.; Pernot, P.; DiMichiel, M.; Mikulik, P.; Berthold, A.; Baumbach, T.
Konferenzbeitrag
2005Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging
Lübbert, D.; Ferrari, C.; Mikulik, P.; Pernot, P.; Helfen, L.; Verdi, N.; Korytar, D.; Baumbach, T.
Zeitschriftenaufsatz
2005High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography
Helfen, L.; Baumbach, T.; Mikulik, P.; Kiel, D.; Pernot, P.; Cloetens, P.; Baruchel, J.
Zeitschriftenaufsatz
2005Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging
Lübbert, D.; Baumbach, T.; Mikulik, P.; Pernot, P.; Helfen, L.; Köhler, R.; Katona, T.M.; Keller, S.; DenBaars, S.P.
Zeitschriftenaufsatz
2005Three-dimensional imaging of cement microstructure evolution during hydration
Helfen, L.; Dehn, F.; Mikulik, P.; Baumbach, T.
Zeitschriftenaufsatz
2004Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance EADQ Dresden
Köhler, B.; Schreiber, J.; Bendjus, B.; Herms, M.; Melov, V.; Helfen, L.; Mikulik, P.; Baumbach, T.
Konferenzbeitrag
2004Synchrotron-radiation X-ray tomography: A method for the 3D verification of cement microstructure and its evolution during hydration
Helfen, L.; Dehn, F.; Mikulik, P.; Baumbach, T.
Konferenzbeitrag
2003Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping
Mikulik, P.; Lubbert, D.; Korytar, D.; Pernot, P.; Baumbach, T.
Zeitschriftenaufsatz
2003Two-dimensional x-ray magnification based on a monolithic beam conditioner
Korytar, D.; Mikulik, P.; Ferrari, C.; Hrdy, J.; Baumbach, T.; Freund, A.; Kubena, A.
Zeitschriftenaufsatz
2002Advanced x-ray imaging techniques for semiconductor wafer characterisation
Baumbach, T.; Mikulik, P.; Korytar, D.; Pernot, P.; Lubbert, D.; Helfen, L.; Herms, M.; Landesberger, C.
Konferenzbeitrag
2002Strain in buried quantum wires: Analytical calculations and x-ray diffraction study
Kaganer, V.; Jenichen, B.; Paris, G.; Ploog, K.H.; Konovalov, O.; Mikulik, P.; Arai, S.
Zeitschriftenaufsatz
2001Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
Mikulik, P.; Jergel, M.; Baumbach, T.; Majkova, E.; Pincik, E.
Zeitschriftenaufsatz
1999Appendix: Quantum Mechanical Approach of Born and Distorted-Wave Born Approximations
Baumbach, T.; Mikulik, P.
Aufsatz in Buch
1999X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering
Baumbach, T.; Mikulik, P.
Zeitschriftenaufsatz
1999X-ray reflectivity by rough multilayers
Baumbach, T.; Mikulik, P.
Aufsatz in Buch
1998(X-ray) reflection by multilayer surface gratings
Mikulik, P.; Baumbach, T.
Zeitschriftenaufsatz