Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2005ESD-Schutztransistor
Wolf, H.; Wilkening, W.; Mettler, S.
Patent
2005Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, N.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; Heyn, V. de; Natarajan, M.; Groeseneken, G.; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M.
Zeitschriftenaufsatz
2004Characterization and modeling of transient device behavior under CDM ESD stress
Willemen, J.; Andreini, A.; Heyn, V. de; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, G.; Mettler, S.; Morena, E.; Qu, N.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L.
Konferenzbeitrag, Zeitschriftenaufsatz
2004Study of CDM Specific Effects for a Smart Power Input Protection Structure
Etherton, M.; Qu, N.; Willemen, J.; Wilkening, W.; Mettler, S.; Dissegna, M.; Stella, R.; Zullino, L.; Andreini, A.; Gieser, H.; Wolf, H.; Fichtner, W.
Konferenzbeitrag
2003Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, N.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; Heyn, M. de; Natarajan, M.I.; Groeseneken, G.; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M.
Konferenzbeitrag
2002ESD-level circuit simulation impact of interconnect RC-delay on HBM and CDM behavior
Mergens, M.P.J.; Wilkening, W.; Kiesewetter, G.; Mettler, S.; Wolf, H.; Hieber, E.; Fichtner, W.
Zeitschriftenaufsatz
2000Analysis of lateral DMOS power devices under ESD stress conditions
Mergens, M.P.J.; Wilkening, W.; Mettler, S.; Wolf, H.; Stricker, A.; Fichtner, W.
Zeitschriftenaufsatz
2000Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate-coupling behaviour
Mergens, M.; Wilkening, W.; Mettler, S.; Wolf, H.; Fichtner, W.
Zeitschriftenaufsatz
1999Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
Mergens, M.; Wilkening, W.; Mettler, S.; Wolf, H.; Stricker, A.; Fichtner, W.
Konferenzbeitrag
1999Characterization and optimization of a bipolar ESD-device by measurements and simulations
Stricker, A.D.; Mettler, S.; Wolf, H.; Mergens, M.; Wilkening, W.; Gieser, H.; Fichtner, W.
Zeitschriftenaufsatz
1999Modular approach of a high current MOS compact model for ESD circuit level simulation
Mergens, M.; Wilkening, W.; Mettler, S.; Wolf, H.; Fichtner, W.
Konferenzbeitrag