Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019The effect of Fe as constituent in Ni-base alloys on the oxygen evolution reaction in alkaline solutions at high current densities
Rauscher, Thomas; Bernäcker, Christian Immanuel; Mühle, Uwe; Kieback, Bernd F.; Röntzsch, Lars
Zeitschriftenaufsatz
2019Towards reconfigurable electronics: Silicidation of top-down fabricated silicon nanowires
Khan, Muhammad Bilal; Deb, Dipjyoti; Kerbusch, Jochen; Fuchs, Florian; Löffler, Markus; Banerjee, Sayanti; Mühle, Uwe; Weber, Walter Michael; Gemming, Sibylle; Schuster, Jörg; Erbe, Artur; Georgiev, Yordan M.
Zeitschriftenaufsatz
2018Corrosion resistance of silicon-infiltrated silicon carbide (SiSiC)
Striegler, Maria; Matthey, Björn; Mühle, Uwe; Michaelis, Alexander; Herrmann, Mathias
Zeitschriftenaufsatz
2018Nanomaterials: Certain aspects of application, risk assessment and risk communication
Laux, Peter; Tentschert, Jutta; Riebeling, Christian; Braeuning, Albert; Creutzenberg, Otto; Epp, Astrid; Fessard, Valérie; Haas, Karl-Heinz; Haase, Andrea; Hund-Rinke, Kerstin; Jakubowski, Norbert; Kearns, Peter; Lampen, Alfonso; Rauscher, Hubert; Schoonjans, Reinhilde; Störmer, Angela; Thielmann, Axel; Mühle, Uwe; Luch, Andreas
Zeitschriftenaufsatz
2018Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validation
Huang, J.; Löffler, Markus; Mühle, Uwe; Möller, Wolfhard; Mulders, Johannes J.L.; Kwakman, Laurens; Dorp, Willem F. van; Zschech, Ehrenfried
Zeitschriftenaufsatz
2017Analysis of the effect of TSV-induced stress on devices performance by direct strain and electrical measurements and FEA simulations
Kteyan, Armen; Mühle, Uwe; Gall, Martin; Sukharev, Valeriy; Radojcic, Riko; Zschech, Ehrenfried
Zeitschriftenaufsatz
2017Carrier mobility shift in advanced silicon nodes due to chip-package interaction
Sukharev, Valeriy; Choy, Jun-Ho; Kteyan, Armen; Hovsepyan, Henrik; Nakamoto, Mark; Zhao, Wei; Radojcic, Riko; Mühle, Uwe; Zschech, Ehrenfried
Zeitschriftenaufsatz
2017Enabling energy efficiency and polarity control in germanium nanowire transistors by individually gated nanojunctions
Trommer, Jens; Heinzig, André; Mühle, Uwe; Löffler, Markus; Winzer, Annett; Jordan, Paul M.; Beister, Jürgen; Baldauf, Tim; Geidel, Marion; Adolphi, Barbara; Zschech, Ehrenfried; Mikolajick, Thomas; Weber, Walter Michael
Zeitschriftenaufsatz
2017In-Situ Stretching Patterned Graphene Nanoribbons in the Transmission Electron Microscope
Liao, Zhongquan; Sandonas, Leonardo Medrano; Zhang, Tao; Gall, Martin; Dianat, Arezoo; Gutierrez, Rafael; Mühle, Uwe; Gluch, Jürgen; Jordan, Rainer; Cuniberti, Gianaurelio; Zschech, Ehrenfried
Zeitschriftenaufsatz
2017Microstructural investigation of diamond-SiC composites produced by pressureless silicon infiltration
Matthey, Björn; Höhn, Sören; Wolfrum, Anne-Kathrin; Mühle, Uwe; Motylenko, Mykhaylo; Rafaja, David; Michaelis, Alexander; Herrmann, Mathias
Zeitschriftenaufsatz
2017Preparation and TEM characterization of interfaces in co-sintered metal-ceramic composites
Mühle, Uwe; Günther, Anne; Standke, Yvonne; Moritz, Tassilo; Gluch, Jürgen; Zschech, Ehrenfried
Poster
2017Reconfigurable germanium transistors with low source-drain leakage for secure and energy-efficient doping-free complementary circuits
Trommer, Jens; Heinzig, André; Slesazeck, Stefan; Mühle, Uwe; Löffler, Markus; Walter, Dennis; Mayr, Christian Georg; Mikolajick, Thomas; Weber, Walter Michael
Konferenzbeitrag
2017Target preparation and characterization of interfaces in co-sintered metal ceramic composites using imaging and analytical Transmission Electron Microscopy
Mühle, Uwe; Günther, Anne; Standke, Yvonne; Moritz, Tassilo; Herrmann, Mathias; Gluch, Jürgen; Zschech, Ehrenfried
Aufsatz in Buch
2016CPI stress induced carrier mobility shift in advanced silicon nodes
Sukharev, Valeriy; Choy, Jun-Ho; Kteyan, Armen; Hovsepyan, Henrik; Mühle, Uwe; Zschech, Ehrenfried; Radojcic, Riko
Konferenzbeitrag
2016Structural characterisation of carbon fibres along the fabrication process using SEM/FIB and TEM
Mühle, Uwe; Standke, Yvonne; Zschech, Ehrenfried; Meinl, Juliane; Michaelis, Alexander; Kirsten, Martin; Cherif, Chokri
Konferenzbeitrag
2016TEM investigation of time-dependent dielectric breakdown mechanisms in Cu/Low-k interconnects
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Clausner, André; Mühle, Uwe; Gluch, Jürgen; Standke, Yvonne; Rosenkranz, Rüdiger; Aubel, Oliver; Hauschildt, Meike; Zschech, Ehrenfried
Zeitschriftenaufsatz
2015Bulk titanium nitride ceramics - Significant enhancement of hardness by silicon nitride addition, nanostructuring and high pressure sintering
Bläß, Ulrich W.; Barsukova, Tatiana; Schwarz, Marcus; Köhler, Anke; Schimpf, Christian; Petrusha, Igor A.; Mühle, Uwe; Rafaja, David; Kroke, Edwin
Zeitschriftenaufsatz
2015In situ time-dependent dielectric breakdown in the transmission electron microscope: A possibility to understand the failure mechanism in microelectronic devices
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Clausner, André; Mühle, Uwe; Gluch, Jürgen; Standke, Gisela; Aubel, Oliver; Beyer, Armand; Hauschildt, Meike; Zschech, Ehrenfried
Zeitschriftenaufsatz
2015In-situ study of the TDDB-induced damage mechanism in Cu/ultra-low-k interconnect structures
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Mühle, Uwe; Gluch, Jürgen; Standke, Yvonne; Aubel, Oliver; Vogel, Norman; Hauschildt, Meike; Beyer, Armand; Engelmann, Hans Jürgen; Zschech, Ehrenfried
Zeitschriftenaufsatz, Konferenzbeitrag
2015Phasenbildungsmechanismen in Stahl-Keramik-Werkstoffverbunden
Günther, Anne; Slawik, Tim; Moritz, Tassilo; Mühle, Uwe; Michaelis, Alexander
Konferenzbeitrag
2015Preparation and characterization of silicon nanowires using SEM/FIB and TEM
Banerjee, Sayanti; Mühle, Uwe; Löffler, Markus; Heinzig, André; Trommer, Jens; Zschech, Ehrenfried
Zeitschriftenaufsatz, Konferenzbeitrag
2015Spezielle Anwendungen der Transmissionselektronenmikroskopie in der Siliziumhalbleiterindustrie
Mühle, Uwe
: Rafaja, David (Betreuer); Lichte, Hannes (Gutachter); Zschech, Ehrenfried (Gutachter)
Habilitationsschrift
2015TEM study of schottky junctions in reconfigurable silicon nanowire devices
Banerjee, Sayanti; Löffler, Markus; Mühle, Uwe; Berent, Katarzyna; Heinzig, A.; Trommer, J.; Weber, Walter; Zschech, Ehrenfried
Zeitschriftenaufsatz
2015Ultra-thin ZrO2/SrO/ZrO2 insulating stacks for future dynamic random access memory capacitor applications
Knebel, Steve; Pešić, Milan; Cho, Kyuho; Chang, Jaewan; Lim, Hanjin; Kolomiiets, Nadiia; Afanasyev, Valeri; Mühle, Uwe; Schröder, Uwe; Mikolajick, Thomas
Zeitschriftenaufsatz
2015Verfahren zur Erstellung von Elementverteilungsbildern mit einem Transmissionselektronenmikroskop
Mühle, Uwe; Gluch, Jürgen; Zschech, Ehrenfried
Patent
2014In situ study on low-k interconnect time-dependent-dielectric-breakdown mechanisms
Yeap, Kong Boon; Gall, Martin; Liao, Zhongquan; Sander, Christoph; Mühle, Uwe; Justison, Patrick; Aubel, Oliver; Hauschildt, Meike; Beyer, Armand; Vogel, Norman; Zschech, Ehrenfried
Zeitschriftenaufsatz
2014A new in situ microscopy approach to study the degradation and failure mechanisms of time-dependent dielectric breakdown: Set-up and opportunities
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Aubel, Oliver; Mühle, Uwe; Gluch, Jürgen; Niese, Sven; Standke, Yvonne; Rosenkranz, Rüdiger; Löffler, Markus; Vogel, Norman; Beyer, Armand; Engelmann, Hans Jürgen; Guttmann, Peter; Schneider, Gerhard; Zschech, Ehrenfried
Zeitschriftenaufsatz