| | |
---|
2020 | Challenges and solution approaches for simulation-based reliability assessment - degradation modeling Lange, André; Jancke, Roland | Konferenzbeitrag |
2020 | Degradation modeling and validation - bottlenecks for standard use of aging simulations in IC design Lange, André; Jancke, Roland | Konferenzbeitrag |
2020 | What's Holding Back Aging Simulation? Lange, André | Elektronische Publikation |
2019 | Comparison of modeling approaches for transistor degradation: Model card adaptations vs subcircuits Lange, André; Velarde Gonzalez, Fabio A.; Lahbib, Insaf; Crocoll, Sonja | Konferenzbeitrag |
2019 | An experimental study on HCI under various stress conditions Lange, André; Weddeler, Nicki; Wagner, Jakob; Bogacz, Steffen; Drehsig, Daniel | Vortrag |
2019 | Integration of Transistor Aging Models across Different EDA Environments Velarde Gonzalez, Fabio Alberto : Lange, André (Betreuer) | Master Thesis |
2019 | Langlebige Prozessoren Lange, André | Zeitschriftenaufsatz |
2019 | Toward consistent circuit-level aging simulations in different EDA environments Velarde Gonzalez, Fabio A.; Giering, Kay-Uwe; Lange, André; Lahbib, Insaf; Crocoll, Sonja | Konferenzbeitrag |
2018 | Aging Models: The Basis for Predicting Circuit Reliability Lange, André | Elektronische Publikation |
2018 | Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation Clausner, André; Schlipf, Simon; Kurz, G.; Otto, M.; Paul, J.; Giering, Kay-Uwe; Warmuth, Jens; Lange, André; Jancke, Roland; Aal, A.; Rosenkranz, Rüdiger; Gall, Martin; Zschech, Ehrenfried | Konferenzbeitrag |
2018 | NBTI and HCI models for circuit level aging simulations in different EDA environments Velarde Gonzalez, Fabio Alberto; Lange, André; Crocoll, Sonja; Jancke, Roland | Vortrag |
2018 | Prediction of SRAM reliability under mechanical stress induced by harsh environments Warmuth, Jens; Giering, Kay-Uwe; Lange, André; Clausner, André; Schlipf, Simon; Kurz, Gottfried; Otto, Michael; Paul, Jens; Jancke, Roland; Aal, Andreas; Gall, Martin; Zschech, Ehrenfried | Konferenzbeitrag |
2017 | Circuit level aging simulations predict the long-therm behavior of ICS Lange, André | Bericht |
2017 | Gezielte Alterungssimulation von Hochvolt-Transistoren Lange, André | Zeitschriftenaufsatz |
2016 | BTI variability of SRAM cells under periodically changing stress profiles Giering, Kay-Uwe; Lange, André; Kaczer, Ben; Jancke, Roland | Konferenzbeitrag |
2016 | Multivariate modeling of variability supporting non-gaussian and correlated parameters Lange, André; Sohrmann, Christoph; Jancke, Roland; Haase, Joachim; Cheng, Binjie; Asenov, Asen; Schlichtmann, Ulf | Zeitschriftenaufsatz |
2016 | Non-gaussian correlated multivariate modeling for variability abstraction in integrated circuit analysis Lange, André : Schlichtmann, Ulf; Barke, Erich | Dissertation |
2015 | Correlated noise description using HDLs Haase, Joachim; Lange, André | Konferenzbeitrag |
2015 | Hybrid dynamical systems for memristor modelling Haase, Joachim; Lange, André | Konferenzbeitrag |
2015 | Towards probabilistic analog behavioral modeling Lange, André; Harasymiv, Ihor; Eisenberger, Oliver; Roger, Frédéric; Haase, Joachim; Minixhofer, Rainer | Konferenzbeitrag |
2014 | Ein universeller Ansatz zur Beschreibung von Prozessvariationen mit beliebig verteilten Modellparametern Lange, André; Haase, Joachim; Dietrich, Manfred; Kolodinski, Sabine | Konferenzbeitrag |
2014 | Variability-aware compact model strategy for 20-nm bulk MOSFETs Wang, Xingsheng; Reid, Dave; Wang, Liping; Burenkov, Alex; Millar, Campbell; Cheng, Binjie; Lange, Andre; Lorenz, Jürgen; Bär, Eberhard; Asenov, Asen | Konferenzbeitrag |
2013 | CHRONOS: Ein Werkzeug zur Berücksichtigung von Alterungseffekten in Schaltungssimulationen Müller, Leif; Lange, André; Sohrmann, Christoph; Jancke, Roland | Konferenzbeitrag |
2013 | The DECO framework: Reliability simulation based on a general design environment communication approach Sohrmann, Christoph; Lange, André; Jancke, Roland; Müller, Leif | Konferenzbeitrag |
2013 | Herausforderungen und Lösungsansätze für die Berücksichtigung des Alterungsverhaltens beim Entwurf integrierter Schaltungen Jancke, Roland; Lange, André; Müller, Leif; Sohrmann, Christoph | Konferenzbeitrag |
2013 | Hybrid dynamical systems for memristor modelling Haase, Joachim; Lange, André | Konferenzbeitrag |
2013 | Probabilistic standard cell modeling considering non-gaussian parameters and correlations Lange, André; Jancke, Roland; Haase, Joachim; Lorenz, Ingolf; Schlichtmann, Ulf | Konferenzbeitrag |
2012 | Generation of random parameters of behavioral models Lange, André; Haase, Joachim; Sohrmann, Christoph; Jancke, Roland | Konferenzbeitrag |
2012 | Methods of parameter variations Knoth, Christoph; Schlichtmann, Ulf; Li, Bing; Zhang, Min; Olbrich, Markus; Acar, Emrah; Eichler, Uwe; Haase, Joachim; Lange, André; Pronath, Michael | Aufsatz in Buch |
2012 | Path-based statistical gate-level analyses considering timing and energy Lange, André; Hopsch, Fabian; Haase, Joachim | Konferenzbeitrag |