Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2011Mixed oxide coatings for optics
Stenzel, O.; Wilbrandt, S.; Schürmann, M.; Kaiser, N.; Ehlers, H.; Mende, M.; Ristau, D.; Bruns, S.; Vergöhl, M.; Stolze, M.; Held, M.; Niederwald, H.; Koch, T.; Riggers, W.; Burdack, P.; Mark, G.; Schäfer, R.; Mewes, S.; Bischoff, M.; Arntzen, M.; Eisenkrämer, F.; Lappschies, M.; Jakobs, S.; Koch, S.; Baumgarten, B.; Tünnermann, A.
2010Characterization of metal-oxide thin films deposited by plasma-assisted reactive magnetron sputtering
Jakobs, S.; Lappschies, M.; Schallenberg, U.; Stenzel, O.; Wilbrandt, S.
Zeitschriftenaufsatz, Konferenzbeitrag
2009The correlation between mechanical stress, thermal shift and refractive index in HfO2, Nb2O5, Ta2O5 and SiO2 layers and its relation to the layer porosity
Stenzel, O.; Wilbrandt, S.; Kaiser, N.; Vinnichenko, M.; Munnik, F.; Kolitsch, A.; Chuvilin, A.; Kaiser, U.; Ebert, J.; Jakobs, S.; Kaless, A.; Wuethrich, S.; Treichel, O.; Wunderlich, B.; Bitzer, M.; Grössl, M.
2004Ion-assisted deposition processes: Industrial network IntIon
Ehlers, H.; Becker, K.-J.; Beckmann, R.; Beermann, N.; Brauneck, U.; Fuhrberg, P.; Gäbler, D.; Jakobs, S.; Kaiser, N.; Kennedy, M.; König, F.; Laux, S.; Müller, J.C.; Rau, B.; Riggers, W.; Ristau, D.; Schäfer, D.; Stenzel, O.
2000Spectral-sensitive on-chip masking of Si-PIN-diodes using patterned and self-blocked optical coatings
Schallenberg, U.; Jakobs, S.; Buß, W.
1999Analytically design of multicycle broadband AR coatings
Schallenberg, U.; Jakobs, S.; Kaiser, N.
1999Comparative study of the roughness of optical surfaces and thin films by x-ray scattering and atomic force microscopy
Asadchikov, V.E.; Duparre, A.; Jakobs, S.; Karabekov, Y.; Kozhevnikov, I.V.
1999Surface roughness characterization of smooth optical films deposited by ion plating
Jakobs, S.; Duparre, A.; Huter, M.; Pulker, H.K.
1998AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H.
1998Optical, structural and mechanical properties of lanthanide trifluoride thin film materials for use in the DUV-spectral region
Thielsch, R.; Heber, J.; Jakobs, S.; Kaiser, N.; Duparre, A.; Ullmann, J.
1998Surface finish and optical quality of CaF2 for UV-lithography applications
Duparre, A.; Tielsch, R.; Kaiser, N.; Jakobs, S.; Mann, K.; Eva, E.
1997Characterization of SiO2 protective coatings on polycarbonate
Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N.
1997Influence of substrate surface and film roughness on the quality of optical coatings for the UV spectral region
Duparre, A.; Jakobs, S.; Kaiser, N.
1996Combination of surface characterization techniques for investigating optical thin-film components
Duparre, A.; Jakobs, S.
1996Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A.
1996SiO2 protective coatings on plastic optics deposited with plasma-IAD
Schulz, U.; Jakobs, S.; Kaiser, N.
1995Formation of surface defects on polymer lenses depending on moisture absorption
Schulz, U.; Jakobs, S.; Anton, B.; Kaiser, N.
1994Generic detrending of surface profiles
Duparre, A.; Rothe, H.; Jakobs, S.
1994Morphology investigations by atomic force microscopy of thin films and substrates for excimer laser mirrors
Kaiser, N.; Duparre, A.; Jakobs, S.