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| 2011 | Mixed oxide coatings for optics
Stenzel, O.; Wilbrandt, S.; Schürmann, M.; Kaiser, N.; Ehlers, H.; Mende, M.; Ristau, D.; Bruns, S.; Vergöhl, M.; Stolze, M.; Held, M.; Niederwald, H.; Koch, T.; Riggers, W.; Burdack, P.; Mark, G.; Schäfer, R.; Mewes, S.; Bischoff, M.; Arntzen, M.; Eisenkrämer, F.; Lappschies, M.; Jakobs, S.; Koch, S.; Baumgarten, B.; Tünnermann, A. | Zeitschriftenaufsatz |
| 2010 | Characterization of metal-oxide thin films deposited by plasma-assisted reactive magnetron sputtering
Jakobs, S.; Lappschies, M.; Schallenberg, U.; Stenzel, O.; Wilbrandt, S. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2009 | The correlation between mechanical stress, thermal shift and refractive index in HfO2, Nb2O5, Ta2O5 and SiO2 layers and its relation to the layer porosity
Stenzel, O.; Wilbrandt, S.; Kaiser, N.; Vinnichenko, M.; Munnik, F.; Kolitsch, A.; Chuvilin, A.; Kaiser, U.; Ebert, J.; Jakobs, S.; Kaless, A.; Wuethrich, S.; Treichel, O.; Wunderlich, B.; Bitzer, M.; Grössl, M. | Zeitschriftenaufsatz |
| 2004 | Ion-assisted deposition processes: Industrial network IntIon
Ehlers, H.; Becker, K.-J.; Beckmann, R.; Beermann, N.; Brauneck, U.; Fuhrberg, P.; Gäbler, D.; Jakobs, S.; Kaiser, N.; Kennedy, M.; König, F.; Laux, S.; Müller, J.C.; Rau, B.; Riggers, W.; Ristau, D.; Schäfer, D.; Stenzel, O. | Konferenzbeitrag |
| 2000 | Spectral-sensitive on-chip masking of Si-PIN-diodes using patterned and self-blocked optical coatings
Schallenberg, U.; Jakobs, S.; Buß, W. | Konferenzbeitrag |
| 1999 | Analytically design of multicycle broadband AR coatings
Schallenberg, U.; Jakobs, S.; Kaiser, N. | Konferenzbeitrag |
| 1999 | Comparative study of the roughness of optical surfaces and thin films by x-ray scattering and atomic force microscopy
Asadchikov, V.E.; Duparre, A.; Jakobs, S.; Karabekov, Y.; Kozhevnikov, I.V. | Zeitschriftenaufsatz |
| 1999 | Surface roughness characterization of smooth optical films deposited by ion plating
Jakobs, S.; Duparre, A.; Huter, M.; Pulker, H.K. | Zeitschriftenaufsatz |
| 1998 | AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H. | Zeitschriftenaufsatz |
| 1998 | Optical, structural and mechanical properties of lanthanide trifluoride thin film materials for use in the DUV-spectral region
Thielsch, R.; Heber, J.; Jakobs, S.; Kaiser, N.; Duparre, A.; Ullmann, J. | Konferenzbeitrag |
| 1998 | Surface finish and optical quality of CaF2 for UV-lithography applications
Duparre, A.; Tielsch, R.; Kaiser, N.; Jakobs, S.; Mann, K.; Eva, E. | Konferenzbeitrag |
| 1997 | Characterization of SiO2 protective coatings on polycarbonate
Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N. | Zeitschriftenaufsatz |
| 1997 | Influence of substrate surface and film roughness on the quality of optical coatings for the UV spectral region
Duparre, A.; Jakobs, S.; Kaiser, N. | Konferenzbeitrag |
| 1996 | Combination of surface characterization techniques for investigating optical thin-film components
Duparre, A.; Jakobs, S. | Zeitschriftenaufsatz |
| 1996 | Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A. | Konferenzbeitrag |
| 1996 | SiO2 protective coatings on plastic optics deposited with plasma-IAD
Schulz, U.; Jakobs, S.; Kaiser, N. | Konferenzbeitrag |
| 1995 | Formation of surface defects on polymer lenses depending on moisture absorption
Schulz, U.; Jakobs, S.; Anton, B.; Kaiser, N. | Konferenzbeitrag |
| 1994 | Generic detrending of surface profiles
Duparre, A.; Rothe, H.; Jakobs, S. | Zeitschriftenaufsatz |
| 1994 | Morphology investigations by atomic force microscopy of thin films and substrates for excimer laser mirrors
Kaiser, N.; Duparre, A.; Jakobs, S. | Konferenzbeitrag |