Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Characterization of light-activated Cu defects in silicon: Comparison with the recombination activity of metallic precipitates
Inglese, A.; Vahlman, H.; Kwapil, W.; Schön, J.; Savin, H.
Zeitschriftenaufsatz, Konferenzbeitrag
2017Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon
Vahlmann, H.; Haarahiltunen, A.; Kwapil, W.; Schön, J.; Yli-Koski, M.; Inglese, A.; Modanese, C.; Savin, H.
Zeitschriftenaufsatz, Konferenzbeitrag
2017Modeling of light-induced degradation due to Cu precipitation in p-type silicon. Pt.I: General theory of precipitation under carrier injection
Vahlman, H.; Haarahiltunen, A.; Kwapil, W.; Schön, J.; Inglese, A.; Savin, H.
Zeitschriftenaufsatz
2017Modeling of light-induced degradation due to Cu precipitation in p-type silicon. Pt.II: Comparison of simulations and experiments
Vahlman, H.; Haarahiltunen, A.; Kwapil, W.; Schön, J.; Inglese, A.; Savin, H.
Zeitschriftenaufsatz
2016Light-induced degradation in multicrystalline silicon: The role of copper
Inglese, A.; Focareta, A.; Schindler, F.; Schön, J.; Lindroos, J.; Schubert, M.C.; Savin, H.
Zeitschriftenaufsatz, Konferenzbeitrag