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| 2019 | Non-Destructive Approach for Measuring Base Resistivity of Emitter-Diffused, Partially-Processed Wafers Using Temperature-Stage QSSPC
Kuruganti, V.; Haunschild, J.; Brand, A.; Al-Hajjawi, S.; Rein, S.; Glunz, S.W. | Konferenzbeitrag |
| 2018 | About the Relevance of Defect Features in As-Cut Multicrystalline Silicon Wafers on Solar Cell Performance
Kovvali, A.; Demant, M.; Trötschler, T.; Haunschild, J.; Rein, S. | Konferenzbeitrag |
| 2018 | Building the ENRICH Community - Common European Network as Advantage for ENRICH in Brazil, China and in the USA
Haunschild, Johanna; Orth, Ronald; Pereira Ferreira, Romulo | Konferenzbeitrag |
| 2018 | ENRICH - European Network of Research and Innovation Centres and Hubs
Orth, Ronald; Haunschild, Johanna | Poster |
| 2018 | ENRICH Community Building - Development of a Decision Support Tool for Membership Selection
Haunschild, Johanna; Kreiling, Laura | Konferenzbeitrag |
| 2018 | Facts & Figures: Get to know Brazil and its innovative Industries
Haunschild, Johanna; Pereira Ferreira, Romulo; Tsog, Sara | Bericht |
| 2018 | Facts & Figures: Get to know the European Union and its Innovative Industries
Haunschild, Johanna; Pereira Ferreira, Romulo | Bericht |
| 2018 | Fatos & Figuras: Conheça a União Europeia e suas indústrias inovadoras
Haunschild, Johanna; Pereira Ferreira, Romulo | Bericht |
| 2018 | Inline Characterization of Diamond Wire Sawn Multicrystalline Silicon Wafers
Haunschild, J.; Bergmann, N.; Hammer, T.; Krieg, K.; Kaden, T.; Anspach, O.; Schremmer, H.; Rein, S. | Konferenzbeitrag |
| 2018 | Inline Wafer Identification Using Optical Character Recognition (OCR)
Al-Hajjawi, S.; Hammer, T.; Haunschild, J. | Konferenzbeitrag |
| 2018 | International Innovation Partnerships by ENRICH in Brazil
Will, Markus; Haunschild, Johanna | Vortrag |
| 2017 | Comparative analysis of German and Brazilian innovation systems to improve binational cooperation
Melo, G.; Haunschild, J.; Orth, R.; Will, M.; Kohl, H. | Konferenzbeitrag |
| 2017 | Comparison of line-wise pl-imaging and area-wise pl-imaging
Höffler, H.; Dost, G.; Brand, A.; Haunschild, J.; Schremmer, H.; Bergmann, A. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2017 | Deployment of a business and innovation centre to foster cooperation between Europe and Brazil
Haunschild, Johanna; Melo, Gustavo; Orth, Ronald; Will, Markus; Kohl, Holger | Konferenzbeitrag |
| 2017 | Enhancing international collaboration through regional innovation hubs
Cap, Jan-Patrick; Haunschild, Johanna; Melo, Gustavo; Battistella Luna, Marina | Konferenzbeitrag |
| 2017 | Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers
Al-Hajjawi, S.; Haunschild, J.; Zimmer, M.; Dannenberg, T.; Preu, R. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2017 | Review of tools and approaches for inline quality control in high efficiency silicon solar cell production
Haunschild, J.; Greulich, J.; Höffler, H.; Wasmer, S.; Emanuel, G.; Krieg, A.; Friedrich, L.; Rein, S. | Konferenzbeitrag |
| 2016 | Experimental proof of the slow light-induced degradation component in compensated n-type silicon
Niewelt, T.; Schön, J.; Broisch, J.; Rein, S.; Haunschild, J.; Warta, W.; Schubert, M.C. | Konferenzbeitrag |
| 2016 | Influence of external contacting on electroluminescence and fill factor measurements
Höffler, H.; Haunschild, J.; Rein, S. | Zeitschriftenaufsatz |
| 2016 | Inline quality rating of multi-crystalline wafers based on photoluminescence images
Demant, M.; Rein, S.; Haunschild, J.; Strauch, T.; Höffler, H.; Broisch, J.; Wasmer, S.; Sunder, K.; Anspach, O.; Brox, T. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2016 | People are at the focus: Personal KM in an organizational context
Haunschild, Johanna; Schmieg, Hans Georg; Steinhöfel, Erik | Konferenzbeitrag |
| 2016 | Two steps to IT transparency: A practitioner’s approach for a knowledge based analysis of existing IT landscapes in SME
Kohl, Holger; Orth, Ronald; Haunschild, Johanna; Schmieg, Hans Georg | Konferenzbeitrag |
| 2015 | Grain-to-grain contrasts in photoluminescence images of silicon wafers
Höffler, H.; Haunschild, J.; Rein, S. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2015 | Investigating the impact of parameter and process variations on multicrystalline PERC cell efficiency
Wasmer, S.; Greulich, J.; Höffler, H.; Haunschild, J.; Demant, M.; Rein, S. | Konferenzbeitrag |
| 2015 | Light-Induced Degradation and Regeneration in n-Type Silicon
Niewelt, T.; Broisch, J.; Schön, J.; Haunschild, J.; Rein, S.; Warta, W.; Schubert, M.C. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2015 | A new method for the determination of the dopant-related base resistivity despite the presence of thermal donors
Broisch, J.; Haunschild, J.; Rein, S. | Zeitschriftenaufsatz |
| 2015 | Short-circuit current density imaging via PL image evaluation based on implied voltage distribution
Höffler, H.; Breitenstein, O.; Haunschild, J. | Zeitschriftenaufsatz |
| 2015 | Verfahren zur Charakterisierung eines Halbleiterwafers
Haunschild, Jonas; Broisch, Juliane; Rein, Stefan | Patent |
| 2014 | Determination of the dopant-related base resistivity in presence of thermal donors
Broisch, J.; Haunschild, J.; Rein, S. | Konferenzbeitrag |
| 2014 | Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
Blum, A.L.; Swirhun, J.S.; Sinton, R.A.; Yan, F.; Herasimenka, S.; Roth, T.; Lauer, K.; Haunschild, J.; Lim, B.; Bothe, K.; Hameiri, Z.; Seipel, B.; Xiong, R.; Dhamrin, M.; Murphy, J.D. | Zeitschriftenaufsatz |
| 2014 | Photoluminescence image evaluation of solar cells based on implied voltage distribution
Breitenstein, O.; Höffler, H.; Haunschild, J. | Zeitschriftenaufsatz |
| 2014 | Simulation of luminescence intensity combining PC1D electrical simulation with analytical optical models
Höffler, H.; Greulich, J.; Haunschild, J.; Rein, S. | Konferenzbeitrag |
| 2014 | Spatially resolved determination of junction voltage of silicon solar cells
Höffler, H.; Al-Mohtaseb, H.; Wöhrle, N.; Michl, B.; Kasemann, M.; Haunschild, J. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2014 | Two image processing tools to analyse alkaline texture and contact finger geometry in microscope images
Strauch, T.; Demant, M.; Lorenz, A.; Haunschild, J.; Rein, S. | Konferenzbeitrag |
| 2014 | UMG N-Type Cz-Silicon: Influencing Factors of the Light-Induced Degradation and Its Suitability for PV Production
Broisch, J.; Schmidt, J.; Haunschild, J.; Rein, S. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2014 | Voltage calibration of luminescence images of silicon solar cells
Höffler, H.; Al-Mohtaseb, H.; Haunschild, J.; Michl, B.; Kasemann, M. | Zeitschriftenaufsatz |
| 2013 | Comparing lifetime and photoluminescence imaging pattern recognition methodologies for predicting solar cell results based on as-cut wafer properties
Sinton, R.; Haunschild, J.; Demant, M.; Rein, S. | Zeitschriftenaufsatz |
| 2013 | Evaluation and improvement of a feature-based classification framework to rate the quality of multicrystalline silicon wafers
Demant, M.; Höffler, H.; Schwaderer, D.; Seidl, A.; Haunschild, J.; Rein, S. | Konferenzbeitrag |
| 2013 | Evaluation of cast mono silicon material for thermal oxide passivated solar cells
Schwab, C.; Haunschild, J.; Graf, M.; Wufka, C.; Wolf, A.; Biro, D.; Preu, R. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2013 | Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
Blum, A.L.; Swirhun, J.S.; Sinton, R.A.; Yan, F.; Herasimenka, S.; Roth, T.; Lauer, K.; Haunschild, J.; Lim, B.; Bothe, K.; Hameiri, Z.; Seipel, B.; Xiong, R.; Dhamrin, M.; Murphy, J.D. | Konferenzbeitrag |
| 2012 | Cz-silicon wafers in solar cell production: Efficiency-limiting defects and material quality control
Haunschild, J.; Broisch, J.; Reis, I.; Rein, S. | Zeitschriftenaufsatz |
| 2012 | Lumineszenz-Imaging - Vom Block zum Modul
Haunschild, Jonas | Dissertation |
| 2012 | A method to detect defective solder joints by Rs-electroluminescence imaging
Walter, J.; Eberlein, D.; Haunschild, J.; Tranitz, M.; Eitner, U. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2012 | Modelling of physically relevant features in photoluminescence images
Demant, M.; Greulich, J.; Glatthaar, M.; Haunschild, J.; Rein, S. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2012 | Rating and sorting of mc-Si as-cut wafers in solar cell production using PL imaging
Haunschild, J.; Reis, I.E.; Chipei, T.; Demant, M.; Thaidigsmann, B.; Linse, M.; Rein, S. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2012 | Relation between solar cell efficiency and crystal defect etching induced by acidic texturization on multicrystalline silicon material
Nievendick, J.; Zimmer, M.; Souren, F.; Haunschild, J.; Rentsch, J. | Zeitschriftenaufsatz |
| 2012 | Statistical evaluation of a luminescence-based method for imaging the series resistance of solar cells
Höffler, H.; Haunschild, J.; Zeidler, R.; Rein, S. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2012 | Tomographic defect reconstruction of multicrystalline silicon ingots using photoluminescence images of As-Cut wafers and solar cells
Zeidler, R.; Haunschild, J.; Seeber, B.; Riepe, S.; Höffler, H.; Fertig, F.; Reis, I.; Rein, S. | Konferenzbeitrag |
| 2011 | Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging
Haunschild, J.; Reis, I.E.; Geilker, J.; Rein, S. | Zeitschriftenaufsatz |
| 2011 | Investigations on the Impact of Wafer Grippers on Optical and Electrical Properties of Alkaline Textured and A-Si Passivated Surfaces
Nold, S.; Aßmus, M.; Weil, A.; Haunschild, J.; Savio, C.; Hofmann, M.; Rentsch, J.; Preu, R.; Kunz, M. | Konferenzbeitrag |
| 2011 | Luminescence imaging for inline characterisation in silicon photovoltaics. Review
Trupke, T.; Nyhus, J.; Haunschild, J. | Zeitschriftenaufsatz |
| 2011 | Metal pinning through rear passivation layers: Characterization and effects on solar cells
Saint-Cast, P.; Haunschild, J.; Schwab, C.; Billot, E.; Hofmann, M.; Rentsch, J.; Preu, R. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2011 | Quality Control of Czochralski Grown Silicon Wafers in Solar Cell Production Using Photoluminescence Imaging
Haunschild, J.; Broisch, J.; Reis, I.E.; Rein, S. | Konferenzbeitrag |
| 2011 | Verfahren zur Analyse des Erstarrungsverhaltens einer Siliziumschmelze zu einem Siliziumkristall
Haunschild, Jonas; Riepe, Stephan; Haas, F. | Patent |
| 2010 | Analysis of luminescence images applying pattern recognition techniques
Demant, M.; Glatthaar, M.; Haunschild, J.; Rein, S. | Konferenzbeitrag |
| 2010 | Appearance of rift structures created by acidic texturization and their impact on solar cell efficiency
Nievendick, J.; Demant, M.; Haunschild, J.; Krieg, A.; Souren, F.M.M.; Rein, S.; Zimmer, M.; Rentsch, J. | Konferenzbeitrag |
| 2010 | Evaluating luminescence based voltage images of silicon solar cells
Glatthaar, M.; Haunschild, J.; Zeidler, R.; Demant, M.; Greulich, J.; Michl, B.; Warta, W.; Rein, S.; Preu, R. | Zeitschriftenaufsatz |
| 2010 | High aspect ratio front contacts by single step dispensing of metal pastes
Specht, J.; Zengerle, K.; Pospischil, M.; Erath, D.; Haunschild, J.; Clement, F.; Biro, D. | Konferenzbeitrag |
| 2010 | Luminescence imaging for quantitative solar cell material and process characterization
Glatthaar, M.; Haunschild, J.; Zeidler, R.; Rentsch, J.; Rein, S.; Breitenstein, O.; Hinken, D.; Bothe, K. | Konferenzbeitrag |
| 2010 | Quality control of as-cut multicrystalline silicon wafers using photoluminescence imaging for solar cell production
Haunschild, J.; Glatthaar, M.; Demant, M.; Nievendick, J.; Motzko, M.; Rein, S.; Weber, E.R. | Zeitschriftenaufsatz |
| 2010 | Quality control using luminescence imaging in production of mc-silicon solar cells from UMG feedstock
Haunschild, J.; Glatthaar, M.; Riepe, S.; Rein, S. | Konferenzbeitrag |
| 2010 | Spatially resolved determination of dark saturation current and series resistance of silicon solar cells
Glatthaar, M.; Haunschild, J.; Kasemann, M.; Giesecke, J.; Warta, W.; Rein, S. | Zeitschriftenaufsatz |
| 2009 | Comparing luminescence imaging with illuminated lock-in thermography and carrier density imaging for inline inspection of silicon solar cells
Haunschild, J.; Glatthaar, M.; Kwapil, W.; Rein, S. | Konferenzbeitrag |
| 2009 | Fast series resistance imaging for silicon solar cells using electroluminescence
Haunschild, J.; Glatthaar, M.; Kasemann, M.; Rein, S.; Weber, E.R. | Zeitschriftenaufsatz |
| 2009 | Pilot-line processing of screen-printed Cz-Si MWT solar cells exceeding 17% efficiency
Clement, F.; Menkö, M.; Hoenig, R.; Haunschild, J.; Biro, D.; Preu, R.; Lahmer, D.; Lossen, J.; Krokoszinski, H.-J. | Konferenzbeitrag |
| 2009 | Spatially resolved determination of the dark saturation current by electroluminescence imaging
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S. | Konferenzbeitrag |
| 2009 | Spatially resolved determination of the dark saturation current of silicon solar cells from electroluminescence images
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S. | Zeitschriftenaufsatz |
| 2009 | Verfahren zur ortsaufgeloesten Bestimmung des Serienwiderstandes einer Halbleiterstruktur
Glatthaar, M.; Haunschild, J.; Rein, S. | Patent |
| 2009 | Verfahren zur Vermessung einer Halbleiterstruktur, welche eine Solarzelle oder eine Vorstufe einer Solarzelle ist
Glatthaar, M.; Haunschild, J.; Rein, S. | Patent |
| 2009 | Wet chemical processing for c-Si solar cells - status and perspectives
Rentsch, J.; Ackermann, R.; Birmann, K.; Furtwängler, H.; Haunschild, J.; Kästner, G.; Neubauer, R.; Nievendick, J.; Oltersdorf, A.; Rein, S.; Schütte, A.; Zimmer, M.; Preu, R. | Konferenzbeitrag |
| 2008 | Lumineszenzscanner sowie Verfahren zur Detektion von Lumineszenz in Halbleiterbauteilen
Glatthaar, M.; Rein, S.; Haunschild, J. | Patent |