Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Adaptive low-temperature covalent bonding of III-nitride thin films by extremely thin water interlayers
Gerrer, Thomas; Graff, Andreas; Simon-Najasek, Michél; Czap, Heiko; Maier, Thomas; Benkhelifa, Fouad; Müller, Stefan; Nebel, Christoph E.; Waltereit, Patrick; Quay, Rüdiger; Cimalla, Volker
Zeitschriftenaufsatz
2019Formation of icosahedron twins during initial stages of heteroepitaxial diamond nucleation and growth
Lebedev, Vadim; Yoshikawa, Taro; Giese, Christian; Kirste, Lutz; Zukauskaite, Agne; Graff, Andreas; Meyer, Frank; Burmeister, Frank; Ambacher, Oliver
Zeitschriftenaufsatz
2018Cathodoluminescence spectroscopy for failure analysis and process development of GaN-based microelectronic devices
Monachon, C.; Zielinski, M.S.; Berney, J.; Poppitz, David; Graff, Andreas; Breuer, Steffen; Kirste, Lutz
Konferenzbeitrag
2018Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology
Dammann, Michael; Baeumler, Martina; Brueckner, Peter; Kemmer, Tobias; Konstanzer, Helmer; Graff, Andreas; Simon-Najasek, Michél; Quay, Rüdiger
Zeitschriftenaufsatz
2018Effect of substrate bias on the growth behavior of iridium on A-plane sapphire using radio frequency sputtering at low temperatures
Meyer, F.; Oeser, S.; Graff, A.; Reisacher, E.; Carl, E.-R.; Fromm, A.; Wirth, M.; Groener, L.; Burmeister, F.
Zeitschriftenaufsatz
2018Physical failure analysis methods for wide band gap semiconductor devices
Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.
Konferenzbeitrag
2017Blistering mechanisms of atomic-layer-deposited AlN and Al2O3 films
Broas, M.; Jiang, H.; Graff, A.; Sajavaara, T.; Vuorinen, V.; Paulasto-Kröckel, M.
Zeitschriftenaufsatz
2017Failure analysis and defect inspection of electronic devices by high resolution cathodoluminescence
Monachon, C.; Zielinskl, M.S.; Gachet, D.; Sonderegger, S.; Muckenhirn, S.; Barney, J.; Poppitz, D.; Graff, A.; Breuer, S.; Kirste, L.
Konferenzbeitrag
2017High resolution physical analysis of ohmic contact formation at GaN-HEMT devices
Graff, A.; Simon-Najasek, M.; Altmann, F.; Kuzmik, J.; Gregušová, D.; Haščík, Š.; Jung, H.; Baur, T.; Grünenpütt, J.; Blanck, H.
Zeitschriftenaufsatz
2017Interfacial void segregation of Cl in Cu-Sn micro-connects
Ross, G.; Tao, X.; Broas, M.; Mäntyoja, N.; Vuorinen, V.; Graff, A.; Altmann, F.; Petzold, M.; Paulasto-Kröckel, M.
Zeitschriftenaufsatz
2017Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications
Dammann, Michael; Baeumler, Martina; Polyakov, Vladimir M.; Brueckner, Peter; Konstanzer, Helmer; Quay, Rüdiger; Mikulla, Michael; Graff, Andreas; Simon-Najasek, M.
Zeitschriftenaufsatz
2016Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures
Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H.
Zeitschriftenaufsatz
2015Degradation of 0.25 μm GaN HEMTs under high temperature stress test
Dammann, M.; Baeumler, M.; Brückner, P.; Bronner, W.; Maroldt, S.; Konstanzer, H.; Wespel, M.; Quay, R.; Mikulla, M.; Graff, A.; Lorenzini, M.; Fagerlind, M.; Wel, P.J. van der; Roedle, T.
Zeitschriftenaufsatz
2015Electron microscope analyses of the bio-silica basal spicule from the Monorhaphis chuni sponge
Werner, P.; Blumtritt, H.; Zlotnikov, I.; Graff, A.; Dauphin, Y.; Fratzl, P.
Zeitschriftenaufsatz
2015High-resolution structural investigation of passivated interfaces of silicon solar cells
Richter, S.; Kaufmann, K.; Naumann, V.; Werner, M.; Graff, A.; Grosser, S.; Moldovan, A.; Zimmer, M.; Rentsch, J.; Bagdahn, J.; Hagendorf, C.
Zeitschriftenaufsatz
2015Stable silicon anodes for lithium-ion batteries using mesoporous metallurgical silicon
Li, X.P.; Yan, C.L.; Wang, J.N.; Graff, A.; Schweizer, S.L.; Sprafke, A.; Schmidt, O.G.; Wehrspohn, R.B.
Zeitschriftenaufsatz
2015Strategien zum Marktausbau der Elektromobilität in Baden-Württemberg
Gölz, Sebastian; Wedderhoff, Oliver; Dütschke, Elisabeth; Peters, Anja; Plötz, Patrick; Gnann, Till; Graff, Andreas; Hoffmann, Christian; Dobrzinski, Julia; Nick, Aljoscha
Bericht
2015With electroluminescence microcopy towards more reliable AlGaN/GaN transistors
Baeumler, M.; Dammann, M.; Wespel, M.; George, R.; Konstanzer, H.; Maroldt, S.; Polyakov, V.M.; Müller, S.; Bronner, W.; Brueckner, P.; Benkhelifa, F.; Waltereit, P.; Quay, R.; Mikulla, M.; Wagner, J.; Ambacher, O.; Graff, A.; Altmann, F.; Simon-Najasek, M.; Lorenzini, M.; Fagerlind, M.; Wel, P. van der; Roedle, T.
Konferenzbeitrag
2014Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures
Simon-Najasek, M.; Huebner, S.; Altmann, F.; Graff, A.
Zeitschriftenaufsatz
2014Analytical ETL/EML layer investigation of blue OLEDs
Graff, A.; Altmann, F.; Dzwilewski, A.; Freitag, B.
Zeitschriftenaufsatz
2014Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells
Naumann, V.; Lausch, D.; Hähnel, A.; Bauer, J.; Breitenstein, O.; Graff, A.; Werner, M.; Swatek, S.; Großer, S.; Bagdahn, J.; Hagendorf, C.
Zeitschriftenaufsatz
2014Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials
März, B.; Graff, A.; Klengel, R.; Petzold, M.
Zeitschriftenaufsatz
2014Microstructure analysis of the interaction between watts-type nickel electrolyte and screen printed solar cell contacts
Kraft, A.; Pernia, Y.; Ni, L.; Filipovic, A.; Hähnel, A.; Graff, A.; Bartsch, J.; Glatthaar, M.
Zeitschriftenaufsatz
2014Non-destructive evaluation of 3D microstructure evolution during sintering of strontium titanate
Gumbsch, P.; Syha, M.; Lödermann, B.; Trenkle, A.; Graff, A.
Konferenzbeitrag, Zeitschriftenaufsatz
2014A perfectly periodic three-dimensional protein/silica mesoporous structure produced by an organism
Zlotnikov, I.; Werner, P.; Blumtritt, H.; Graff, A.; Dauphin, Y.; Zolotoyabko, E.; Fratzl, P.
Zeitschriftenaufsatz
2014Potential-Induced Degradation (PID): Introduction of a novel test approach and explanation of increased depletion region recombination
Lausch, D.; Naumann, V.; Breitenstein, O.; Bauer, J.; Graff, A.; Bagdahn, J.; Hagendorf, C.
Zeitschriftenaufsatz
2014Sodium outdiffusion from stacking faults as root cause for the recovery process of potential-induced degradation (PID)
Lausch, D.; Naumann, V.; Graff, A.; Hähnel, A.; Breitenstein, O.; Hagendorf, C.; Bagdahn, J.
Konferenzbeitrag, Zeitschriftenaufsatz
2013Aberration corrected TEM and Super-X STEM-EDXS characterization of high electron mobility transistor structures
Graff, A; Simon-Najasek, M.; Altmann, F.; Dammann, M.
Konferenzbeitrag
2013Betriebstaugliche Ultraschall-Querfehlerprüfung an SAWL-Pipeline-Rohren mit Phased-Array Technik
Chichkov, Nikolai; Graff, Alfred; Kersting, Thomas; Orth, Thomas; Schmitte, Till; Spies, Martin
Konferenzbeitrag
2013Differences in intermetallic phase growth in thermally aged alloyed gold bond interconnections on aluminium
Maerz, B.; Graff, A.; Klengel, R.; Petzold, M.
Konferenzbeitrag
2013The role of stacking faults for the formation of shunts during potential-induced degradation of crystalline Si solar cells
Naumann, V.; Lausch, D.; Graff, A.; Werner, M.; Swatek, S.; Bauer, J.; Hähnel, A.; Breitenstein, O.; Großer, S.; Bagdahn, J.; Hagendorf, C.
Zeitschriftenaufsatz
2013Three dimensional X-ray diffraction contrast tomography reconstruction of polycrystalline strontium titanate during sintering and electron backscatter diffraction validation
Syha, M.; Reinheimer, W.; Loedermann, B.; Graff, A.; Trenkle, A.; Baeuer, M.; Weygand, D.; Ludwig, W.; Gumbsch, P.
Konferenzbeitrag
2013Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization
Syha, M.; Trenkle, A.; Lödermann, B.; Graff, A.; Ludwig, W.; Weygand, D.; Gumbsch, P.
Zeitschriftenaufsatz
2012Microscopic degradation analysis of RF-stressed AlGaN/GaN HEMTs
Gütle, F.; Baeumler, M.; Dammann, M.; Cäsar, M.; Walcher, H.; Waltereit, P.; Bronner, W.; Müller, S.; Kiefer, R.; Quay, R.; Mikulla, M.; Ambacher, O.; Graff, A.; Altmann, F.; Simon, M.
Konferenzbeitrag
2011Characterization of wafer-bonded joins using high-resolution transmission electron microscopy
Höche, T.; Graff, A.; Altmann, F.; Petzold, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2011Reliability and degradation mechanism of 0.25 µm AlGaN/GaN HEMTs under RF stress conditions
Dammann, M.; Baeumler, M.; Gütle, F.; Cäsar, M.; Walcher, H.; Waltereit, P.; Bronner, W.; Müller, S.; Kiefer, R.; Quay, R.; Mikulla, M.; Ambacher, O.; Graff, A.; Altmann, F.; Simon, M.
Konferenzbeitrag
2010Growth behaviour of gold-aluminum intermetallic phases (IMP) in temperature aged ball bonds observed by electron backscatter diffraction
März, B.; Scheibe, S.; Graff, A.; Petzold, M.
Konferenzbeitrag
2010Quantitative assessment of TEM-sample warping caused by FIB preparation
Salzer, R.; Graff, A.; Simon, M.; Altmann, F.
Abstract
2010SAFT- und TOFD-Auswertung für die Ultraschall-Schweißnahtprüfung von längsnahtgeschweißten Großrohren
Rieder, A.; Dillhöfer, A.; Spies, M.; Graff, A.; Orth, T.; Kersting, T.
Konferenzbeitrag
2010Strain determination using electron backscatter diffraction
Krause, M.; Graff, A.; Altmann, F.
Konferenzbeitrag
2009Quantitative determination of magnetic fields from iron particles of oblong form encapsulated by carbon nanotubes using electron holography
Nepijko, S.A.; Graff, A.; Schönhense, G.; Schneider, C.M.
Zeitschriftenaufsatz
2009Standard free thickness determination of thin TEM samples via backscatter electron image correlation
Salzer, R.; Graff, A.; Simon, M.; Altmann, F.
Konferenzbeitrag
2009Standard free thickness determination of thin TEM samples via backscatter electron image correlation
Salzer, R.; Graff, A.; Simon, M.; Altmann, F.
Konferenzbeitrag, Zeitschriftenaufsatz
2009Surface amorphization, sputter rate, and intrinsic stresses of silicon during low energy Ga+ focused-ion beam milling
Pastewka, L.; Salzer, R.; Graff, A.; Altmann, F.; Moseler, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2008Mechanical characterization and micro structure diagnostics of glass frit bonded interfaces
Boettge, B.; Dresbach, C.; Graff, A.; Petzold, M.; Bagdahn, J.
Konferenzbeitrag
2008Reducing of ion beam induced surface damaging using »low voltage«
Salzer, R.; Simon, M.; Graff, A.; Altmann, F.; Pastewka, L.; Moseler, M.
Konferenzbeitrag
2008Topotaxial formation of titanium-rich barium titanates during solid state reactions on (110) TiO2 (rutile) and (001) BaTiO3 single crystals
Lotnyk, A.; Graff, A.; Senz, S.; Zakharov, N.D.; Hesse, D.
Konferenzbeitrag, Zeitschriftenaufsatz
2007Long-term stability of composite cathode at high current densities
Kusnezoff, M.; Trofimenko, N.; Mosch, S.; Beckert, W.; Graff, A.; Altmann, F.
Konferenzbeitrag, Zeitschriftenaufsatz
2006Analytical and mechanical methods for material property investigations of SnAgCu-solder
Petzold, M.; Bennemann, S.; Graff, A.; Krause, M.; Müller, M.; Wiese, S.; Wolter, K.-J.
Konferenzbeitrag
2006A SEM and TEM study of the interconnect microstructure and reliability for a new XFLGA package
Bennemann, S.; Graff, A.; Schischka, J.; Petzold, M.; Theuss, H.; Dangelmaier, J.; Pressel, K.
Konferenzbeitrag
2006TEM-Präparation mittels "low-voltage-FIB"
Altmann, F.; Graff, A.; Simon, M.; Hoffmeister, H.; Gnauck, P.
Zeitschriftenaufsatz
2005A highly reliable flip chip solution based on electroplated AuSn bumps in a leadless package
Theuss, H.; Pressel, K.; Paulus, S.; Kilger, T.; Dangelmaier, J.; Lehner, R.; Eisener, B.; Kiendl, H.; Schischka, J.; Graff, A.; Petzold, M.
Konferenzbeitrag
2005Microstructure evolution during BaTiO3 formation by solid-state reactions on rutile single crystal surfaces
Graff, A.; Senz, S.; Völtzke, D.; Abicht, H.-P.; Hesse, D.
Konferenzbeitrag, Zeitschriftenaufsatz
1995A parallel solver for limited area weather forecast progams
Graff, A.; Joppich, W.
Buch
1995Parallelisierung eines Helmholtzlösers aus den lokalen Vorhersagemodellen des Deutschen Wetterdienstes
Graff, A.; Joppich, W.
Buch
1995Portable parallelization of the ECMWF weather prediction code - experiences and results
Gärtel, U.; Graff, A.; Joppich, W.; Schüller, A.
Zeitschriftenaufsatz, Konferenzbeitrag
1988The influence of the recovery phase injection on the decay of the ring current
Graff, A.
Zeitschriftenaufsatz