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| 2019 | Toward consistent circuit-level aging simulations in different EDA environments
Velarde Gonzalez, Fabio A.; Giering, Kay-Uwe; Lange, André; Lahbib, Insaf; Crocoll, Sonja | Konferenzbeitrag |
| 2018 | Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation
Clausner, André; Schlipf, Simon; Kurz, G.; Otto, M.; Paul, J.; Giering, Kay-Uwe; Warmuth, Jens; Lange, André; Jancke, Roland; Aal, A.; Rosenkranz, Rüdiger; Gall, Martin; Zschech, Ehrenfried | Konferenzbeitrag |
| 2018 | Prediction of SRAM reliability under mechanical stress induced by harsh environments
Warmuth, Jens; Giering, Kay-Uwe; Lange, André; Clausner, André; Schlipf, Simon; Kurz, Gottfried; Otto, Michael; Paul, Jens; Jancke, Roland; Aal, Andreas; Gall, Martin; Zschech, Ehrenfried | Konferenzbeitrag |
| 2016 | Analog-circuit NBTI degradation and time-dependent NBTI variability
Giering, Kay-Uwe; Rott, G.; Rzepa, G.; Reisinger, H.; Puppala, Ajith Kumar; Reich, Torsten; Gustin, W.; Grasser, T.; Jancke, Roland | Konferenzbeitrag |
| 2016 | BTI variability of SRAM cells under periodically changing stress profiles
Giering, Kay-Uwe; Lange, André; Kaczer, Ben; Jancke, Roland | Konferenzbeitrag |
| 2014 | NBTI modeling in analog circuits and its application to long-term aging simulations
Giering, Kay-Uwe; Sohrmann, Christoph; Rzepa, Gerhard; Heiß, Leonhardt; Grasser, Tibor; Jancke, Roland | Konferenzbeitrag |