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| 2019 | International round-robin experiment for angle-resolved light scattering measurement
Finck, A. von; Herffurth, T.; Duparre, A.; Schröder, S.; Lequime, M.; Zerrad, M.; Liukaityte, S.; Amra, C.; Achour, S.; Chalony, M.; Kuperman, Q.; Cornil, Y.; Bialek, A.; Goodman, T.; Greenwell, C.; Gur, B.; Brinkers, S.; Otter, G.; Vosteen, A.; Stover, J.; Vink, R.; Deep, A.; Doyle, D. | Zeitschriftenaufsatz |
| 2019 | New light absorbing material for grazing angles
Yevtushenko, A.; Finck, A. von; Katsir, D.; Duparré, A. | Konferenzbeitrag |
| 2018 | Characterization of Large-Area Crystalline Coatings for Next-Generation Gravitational Wave Detectors
Cole, G.D.; Deutsch, C.; Follman, D.; Heu, P.; Zederbauer, T.; Rai, A.; Bachmann, D.; Finck, A. von; Schröder, S.; Koch, P.; Lück, H. | Konferenzbeitrag |
| 2018 | New light absorbing material for grazing angles
Yevtushenko, A.; Finck, A. von; Katsir, D.; Duparré, A. | Konferenzbeitrag |
| 2017 | Light scattering techniques for the characterization of optical components
Hauptvogel, M.; Schröder, S.; Herffurth, T.; Trost, M.; Finck, A. von; Duparré, A.; Weigel, T. | Konferenzbeitrag |
| 2017 | Reducing light scattering from surface contaminations by thin film design
Finck, A. von; Wilbrandt, S.; Stenzel, O.; Schröder, S. | Zeitschriftenaufsatz |
| 2017 | Vane-free design for star trackers and telescopes
Yevtushenko, A.; Finck, A. von; Katsir, D.; Shfaram, H.; Duparré, A. | Konferenzbeitrag |
| 2015 | Parallelized multichannel BSDF measurements
Finck, A. von; Trost, M.; Schröder, S.; Duparré, A. | Zeitschriftenaufsatz |
| 2015 | Standardization of light scattering measurements
Schröder, S.; Finck, A. von; Duparré, A. | Zeitschriftenaufsatz |
| 2014 | Characterization of optical coatings using a multisource table-top scatterometer
Finck, A. von; Herffurth, T.; Schröder, S.; Duparre, A.; Sinzinger, S. | Zeitschriftenaufsatz |
| 2014 | Table top system for angle resolved light scattering measurement
Finck, A. von | Dissertation |
| 2013 | Estimating hemispherical scatter from incident plane measurements of isotropic samples scattering from both bulk and surface irregularities
Stover, J.C.; Schroeder, S.; Finck, A. von; Unglaub, D.; Duparré, A. | Konferenzbeitrag |
| 2011 | Instrument for close-to-process light scatter measurements of thin film coatings and substrates
Finck, A. von; Hauptvogel, M.; Duparre, A. | Zeitschriftenaufsatz |
| 2011 | Table-Top Streulichtmesssystem ALBATROSS-TT
Finck, A. von; Hauptvogel, M.; Duparré, A.; Notni, G.; Tünnermann, A. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2009 | Makyoh-Imaging zur Charakterisierung reflektierender Oberflächen
Finck, A. von; Duparre, A.; Pfeffer, M. | Zeitschriftenaufsatz |