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| 2002 | Extending the capabilities of scanning probe microscopy for microroughness analysis in surface engineering
Ferre-Borrull, J.; Steinert, J.; Duparre, A. | Zeitschriftenaufsatz |
| 2002 | Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components
Duparre, A.; Ferre-Borrull, J.; Gliech, S.; Notni, G.; Steinert, J.; Bennett, J.M. | Zeitschriftenaufsatz |
| 2002 | Ultraviolet optical and microstructural properties of MgF 2 and LaF 3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation
Ristau, D.; Gunster, S.; Bosch, S.; Duparre, A.; Masetti, E.; Ferre-Borrull, J.; Kiriakidis, G.; Peiro, F.; Quesnel, E.; Tikhonravov, A. | Zeitschriftenaufsatz |
| 2001 | Procedure to characterize microroughness of optical thin films: Application to ion-beam-sputtered vacuum-ultraviolet coatings
Ferre-Borrull, J.; Duparre, A.; Quesnel, E. | Zeitschriftenaufsatz |
| 2000 | Effective dielectric function of mixtures of three or more materials: a numerical procedure for computations
Bosch, S.; Ferre-Borrull, J.; Leinfellner, N.; Canillas, A. | Zeitschriftenaufsatz |
| 2000 | Microroughness analysis of thin film components for VUV applications
Ferre-Borrull, J.; Duparre, A.; Steinert, J.; Ristau, D.; Quesnel, E. | Konferenzbeitrag |
| 2000 | A new procedure for the optical characterization of high quality thin films
Bosch, S.; Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J.; Günster, S.; Ristau, D. | Konferenzbeitrag |
| 2000 | Optical characterization of materials deposited by different processes: the LaF3 in the UV-visible region
Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J. | Konferenzbeitrag |
| 2000 | Roughness and Light Scattering of Ion-Beam-Sputtered Fluoride Coatings for 193 nm
Ferre-Borrull, J.; Duparre, A.; Quesnel, E. | Zeitschriftenaufsatz |
| 1999 | DUV light scattering and morphology of ion beam sputtered fluoride coatings
Quesnel, E.; Petit dit Dariel, A.; Duparre, A.; Ferre-Borrull, J.; Steinert, J. | Konferenzbeitrag |