Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2015Acoustic GHz-microscopy and its potential applications in 3D-integration technologies
Brand, S.; Appenroth, T.; Naumann, F.; Steller, W.; Wolf, M.J.; Czurratis, P.; Altmann, F.; Petzold, M.
Konferenzbeitrag
2015Failure and stress analysis of Cu TSVs using GHz-scanning acoustic microscopy and scanning infrared polariscopy
Wolf, I. de; Khaled, A.; Herms, M.; Wagner, M.; Djuric, T.; Czurratis, P.; Brand, S.
Konferenzbeitrag
2014Defect detection in through silicon vias by GHz scanning acoustic microscopy: Key ultrasonic characteristics
Phommahaxay, A.; Wolf, I. de; Djuric, T.; Hoffrogge, P.; Brand, S.; Czurratis, P.; Philipsen, H.; Beyer, G.; Struyf, H.; Beyne, E.
Konferenzbeitrag
2014Scanning acoustic gigahertz microscopy for metrology applications in three-dimensional integration technologies
Brand, S.; Lapadatu, A.; Djuric, T.; Czurratis, P.; Schischka, J.; Petzold, M.
Zeitschriftenaufsatz
2013Acoustic imaging of bump defects in flip-chip devices using split spectrum analysis
Tismer, S.; Brand, S.; Klengel, S.; Petzold, M.; Czurratis, P.
Konferenzbeitrag
2013Advanced characterization of glass frit bonded micro-chevron-test samples based on scanning acoustic microscopy
Naumann, F.; Brand, S.; Bernasch, M.; Tismer, S.; Czurratis, P.; Wünsch, D.; Petzold, M.
Zeitschriftenaufsatz
2013High frequency scanning acoustic microscopy applied to 3D integrated process: Void detection in through silicon vias
Phommahaxay, A.; Wolf, I. de; Hoffrogge, P.; Brand, S.; Czurratis, P.; Philipsen, H.; Civale, Y.; Vandersmissen, K.; Halder, S.; Beyer, G.; Swinnen, B.; Miller, A.; Beyne, E.
Konferenzbeitrag
2012Failure analysis using scanning acoustic microscopy for diagnostics of electronic devices and 3D system integration technologies
Czurratis, P.; Hoffrogge, P.; Brand, S.; Altmann, F.; Petzold, M.
Konferenzbeitrag
2012Low temperature fusion wafer bonding quality investigation for failure mode analysis
Dragoi, V.; Czurratis, P.; Brand, S.; Beyersdorfer, J.; Patzig, C.; Krugers, J.; Schrank, F.; Siegert, J.; Petzold, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2012A study of factors influencing micro-chevron-testing of glass frit bonded interfaces
Naumann, F.; Bernasch, M.; Brand, S.; Wünsch, D.; Vogel, K.; Czurratis, P.; Petzold, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2011Acoustic inspection of high-density-interconnects for 3D-integration
Brand, S.; Petzold, M.; Czurratis, P.; Reed, J.D.; Lueck, M.; Gregory, C.; Huffman, A.; Lennon, J.M.; Temple, D.S.
Konferenzbeitrag
2011Extending acoustic microscopy for comprehensive failure analysis applications
Brand, S.; Czurratis, P.; Hoffrogge, P.; Temple, D.; Malta, D.; Reed, J.; Petzold, M.
Zeitschriftenaufsatz
2011Failure diagnostics for 3D system integration technologies in microelectronics
Altmann, F.; Schmidt, C.; Brand, S.; Czurratis, P.; Petzold, M.
Konferenzbeitrag
2011High resolution acoustical imaging of high-density-interconnects for 3D-integration
Brand, S.; Petzold, M.; Czurratis, P.; Reed, J.D.; Lueck, M.; Gregory, C.; Huffman, A.; Lannon, J.M.; Temple, D.S.
Konferenzbeitrag
2010Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
Brand, S.; Czurratis, P.; Hoffrogge, P.; Petzold, M.
Konferenzbeitrag, Zeitschriftenaufsatz
2010Extending acoustic microscopy for comprehensive failure analysis applications
Brand, S.; Petzold, M.; Czurratis, P.; Hoffrogge, P.
Konferenzbeitrag
2010Failure diagnostics for 3D system integration technologies in microelectronics
Altmann, F.; Schmidt, C.; Brand, S.; Czurratis, P.; Petzold, M.
Konferenzbeitrag