| | |
|---|
| 2013 | Advanced characterization of glass frit bonded micro-chevron-test samples based on scanning acoustic microscopy
Naumann, F.; Brand, S.; Bernasch, M.; Tismer, S.; Czurratis, P.; Wünsch, D.; Petzold, M. | Zeitschriftenaufsatz |
| 2012 | Failure analysis using scanning acoustic microscopy for diagnostics of electronic devices and 3D system integration technologies
Czurratis, P.; Hoffrogge, P.; Brand, S.; Altmann, F.; Petzold, M. | Konferenzbeitrag |
| 2012 | Low temperature fusion wafer bonding quality investigation for failure mode analysis
Dragoi, V.; Czurratis, P.; Brand, S.; Beyersdorfer, J.; Patzig, C.; Krugers, J.; Schrank, F.; Siegert, J.; Petzold, M. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2012 | A study of factors influencing micro-chevron-testing of glass frit bonded interfaces
Naumann, F.; Bernasch, M.; Brand, S.; Wünsch, D.; Vogel, K.; Czurratis, P.; Petzold, M. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2011 | Acoustic inspection of high-density-interconnects for 3D-integration
Brand, S.; Petzold, M.; Czurratis, P.; Reed, J.D.; Lueck, M.; Gregory, C.; Huffman, A.; Lennon, J.M.; Temple, D.S. | Konferenzbeitrag |
| 2011 | Extending acoustic microscopy for comprehensive failure analysis applications
Brand, S.; Czurratis, P.; Hoffrogge, P.; Temple, D.; Malta, D.; Reed, J.; Petzold, M. | Zeitschriftenaufsatz |
| 2011 | Failure diagnostics for 3D system integration technologies in microelectronics
Altmann, F.; Schmidt, C.; Brand, S.; Czurratis, P.; Petzold, M. | Konferenzbeitrag |
| 2011 | High resolution acoustical imaging of high-density-interconnects for 3D-integration
Brand, S.; Petzold, M.; Czurratis, P.; Reed, J.D.; Lueck, M.; Gregory, C.; Huffman, A.; Lannon, J.M.; Temple, D.S. | Konferenzbeitrag |
| 2010 | Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
Brand, S.; Czurratis, P.; Hoffrogge, P.; Petzold, M. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2010 | Extending acoustic microscopy for comprehensive failure analysis applications
Brand, S.; Petzold, M.; Czurratis, P.; Hoffrogge, P. | Konferenzbeitrag |
| 2010 | Failure diagnostics for 3D system integration technologies in microelectronics
Altmann, F.; Schmidt, C.; Brand, S.; Czurratis, P.; Petzold, M. | Konferenzbeitrag |