Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Fully printed zinc oxide electrolyte-gated transistors on paper
Carvalho, José Tiago; Dubceac, Viorel; Grey, Paul; Cunha, Ines; Fortunato, Elvira; Martins, Rodrigo; Clausner, André; Zschech, Ehrenfried; Pereira, Luis
Zeitschriftenaufsatz
2018Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation
Clausner, André; Schlipf, Simon; Kurz, G.; Otto, M.; Paul, J.; Giering, Kay-Uwe; Warmuth, Jens; Lange, André; Jancke, Roland; Aal, A.; Rosenkranz, Rüdiger; Gall, Martin; Zschech, Ehrenfried
Konferenzbeitrag
2018Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects using high statistical sampling
Kraatz, Matthias; Sander, Christoph; Clausner, André; Hauschildt, M.; Standke, Yvonne; Gall, Martin; Zschech, Ehrenfried
Konferenzbeitrag
2018Functional integration - structure-integrated wireless sensor technology targeting smart mechanical engineering applications
Rülke, Steffen; Beyer, Volkhard; Zorn, Wolfgang; Meinig, Marco; Wecker, Julia; Reuter, Danny; Deicke, Frank; Clausner, André; Werner, Thomas
Konferenzbeitrag
2018Prediction of SRAM reliability under mechanical stress induced by harsh environments
Warmuth, Jens; Giering, Kay-Uwe; Lange, André; Clausner, André; Schlipf, Simon; Kurz, Gottfried; Otto, Michael; Paul, Jens; Jancke, Roland; Aal, Andreas; Gall, Martin; Zschech, Ehrenfried
Konferenzbeitrag
2018Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0.22Ga0.78N/GaN layers
Garitagoitia, Maria Aranzazu; Rosenkranz, Rüdiger; Löffler, M.; Clausner, André; Standke, Yvonne; Zschech, Ehrenfried
Zeitschriftenaufsatz
2018Vorrichtung zur Durchführung von Biegeversuchen an plattenförmigen Proben
Clausner, André; Gall, Martin; Macher, Frank; Sander, Christoph; Zschech, Ehrenfried
Patent
2016Fundamental limitations at the determination of initial yield stress using nano-indentation with spherical tips
Clausner, André; Richter, Frank
Zeitschriftenaufsatz
2016Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy
Kopycinska-Müller, Malgorzata; Clausner, André; Yeap, Kong Boon Oon; Köhler, Bernd; Kuzeyeva, Nataliya; Mahajan, Sukesh; Savage, Travis; Zschech, Ehrenfried; Wolter, Klaus-Jürgen
Zeitschriftenaufsatz
2016Non-destructive imaging of organosilicate glass (OSG) thin films at low voltage with the EsB detector
Garitagoitia, Maria Aranzazu; Moayedi, Elham; Rosenkranz, Rüdiger; Clausner, André; Pakbaz, Khashayar; Zschech, Ehrenfried
Zeitschriftenaufsatz
2016Novel approaches to determine thermomechanical materials data in advanced interconnect stacks
Zschech, Ehrenfried; Gall, Martin; Clausner, André; Sander, Christoph; Sukharev, Valeriy
Konferenzbeitrag
2016TEM investigation of time-dependent dielectric breakdown mechanisms in Cu/Low-k interconnects
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Clausner, André; Mühle, Uwe; Gluch, Jürgen; Standke, Yvonne; Rosenkranz, Rüdiger; Aubel, Oliver; Hauschildt, Meike; Zschech, Ehrenfried
Zeitschriftenaufsatz
2015In situ time-dependent dielectric breakdown in the transmission electron microscope: A possibility to understand the failure mechanism in microelectronic devices
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Clausner, André; Mühle, Uwe; Gluch, Jürgen; Standke, Gisela; Aubel, Oliver; Beyer, Armand; Hauschildt, Meike; Zschech, Ehrenfried
Zeitschriftenaufsatz
2015Usage of the concept of the effectively shaped indenter for the determination of yield stress from Berkovich nano-indentation experiments
Clausner, André; Richter, Frank
Zeitschriftenaufsatz
2014Advanced methods for mechanical and structural characterization of nanoscale materials for 3D IC integration
Sander, Christoph; Standke, Yvonne; Niese, Sven; Rosenkranz, Rüdiger; Clausner, André; Gall, Martin; Zschech, Ehrenfried
Zeitschriftenaufsatz, Konferenzbeitrag
2014Determination of yield stress from nano-indentation experiments
Clausner, André; Richter, Frank
Zeitschriftenaufsatz