Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2016Inline quality rating of multi-crystalline wafers based on photoluminescence images
Demant, M.; Rein, S.; Haunschild, J.; Strauch, T.; Höffler, H.; Broisch, J.; Wasmer, S.; Sunder, K.; Anspach, O.; Brox, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2016Microcracks in silicon wafers I: Inline detection and implications of crack morphology on wafer strength
Demant, M.; Welschehold, T.; Oswald, M.; Bartsch, S.; Brox, T.; Schoenfelder, S.; Rein, S.
Zeitschriftenaufsatz
2016Quality rating of silicon wafers - a pattern recognition approach
Demant, Matthias
: Weber, E.; Brox, T.
Dissertation
2015Motion based foreground detection and poselet motion features for action recognition
Kraft, E.; Brox, T.
Konferenzbeitrag