Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2016Experimental proof of the slow light-induced degradation component in compensated n-type silicon
Niewelt, T.; Schön, J.; Broisch, J.; Rein, S.; Haunschild, J.; Warta, W.; Schubert, M.C.
Konferenzbeitrag
2016Inline quality rating of multi-crystalline wafers based on photoluminescence images
Demant, M.; Rein, S.; Haunschild, J.; Strauch, T.; Höffler, H.; Broisch, J.; Wasmer, S.; Sunder, K.; Anspach, O.; Brox, T.
Zeitschriftenaufsatz, Konferenzbeitrag
2016A unified parameterization of the formation of boron oxygen defects and their electrical activity
Niewelt, T.; Schön, J.; Broisch, J.; Mägdefessel, S.; Warta, W.; Schubert, M.C.
Zeitschriftenaufsatz, Konferenzbeitrag
2015Characterization and modelling of the boron-oxygen defect activation in compensated n-type silicon
Schön, J.; Niewelt, T.; Broisch, J.; Warta, W.; Schubert, M.C.
Zeitschriftenaufsatz
2015Electrical characterization of the slow boron oxygen defect component in Czochralski silicon
Niewelt, T.; Schön, J.; Broisch, J.; Warta, W.; Schubert, M.C.
Zeitschriftenaufsatz
2015Light-Induced Degradation and Regeneration in n-Type Silicon
Niewelt, T.; Broisch, J.; Schön, J.; Haunschild, J.; Rein, S.; Warta, W.; Schubert, M.C.
Konferenzbeitrag, Zeitschriftenaufsatz
2015A new method for the determination of the dopant-related base resistivity despite the presence of thermal donors
Broisch, J.; Haunschild, J.; Rein, S.
Zeitschriftenaufsatz
2015Resistivity, doping concentrations, and carrier mobilities in compensated N- and P-type Czochralski silicon: Comparison of measurements and simulations and consistent description of material parameters
Broisch, J.; Schindler, F.; Schubert, M.C.; Fertig, F.; Soiland, A.-K.; Rein, S.
Zeitschriftenaufsatz
2015Verfahren zur Charakterisierung eines Halbleiterwafers
Haunschild, Jonas; Broisch, Juliane; Rein, Stefan
Patent
2014Determination of the dopant-related base resistivity in presence of thermal donors
Broisch, J.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2014Einfluss von Materialdefekten in monokristallinem Silicium in der industriellen Solarzellenfertigung
Broisch, Juliane
Dissertation
2014Stability of the regeneration of the boron-oxygen complex in silicon solar cells during module certification
Fertig, F.; Broisch, J.; Biro, D.; Rein, S.
Zeitschriftenaufsatz
2014Towards a unified low-field model for carrier mobilities in crystalline silicon
Schindler, F.; Forster, M.; Broisch, J.; Schön, J.; Giesecke, J.; Rein, S.; Warta, W.; Schubert, M.C.
Zeitschriftenaufsatz
2014UMG N-Type Cz-Silicon: Influencing Factors of the Light-Induced Degradation and Its Suitability for PV Production
Broisch, J.; Schmidt, J.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2013Stability of the regeneration of the boron-oxygen complex in silicon solar cells during module integration
Fertig, F.; Greulich, J.; Broisch, J.; Biro, D.; Rein, S.
Zeitschriftenaufsatz
2012Cz-silicon wafers in solar cell production: Efficiency-limiting defects and material quality control
Haunschild, J.; Broisch, J.; Reis, I.; Rein, S.
Zeitschriftenaufsatz
2012Fully solderable large-area screen-printed Al-BSF p-type Mc-Si solar cells from 100% solar grade deedstock yielding eta > 17 %
Fertig, F.; Krauß, K.; Geisemeyer, I.; Broisch, J.; Höffler, H.; Odden, J.O.; Soiland, A.-K.; Rein, S.
Konferenzbeitrag
2012Lowly-doped compensated solar-grade Cz-silicon for high efficiency solar cell processes
Broisch, J.; Rein, S.; Schmidt, J.; Fertig, F.; Soiland, A.-K.; Odden, J.O.
Konferenzbeitrag
2012Modeling majority carrier mobility in compensated crystalline silicon for solar cells
Schindler, F.; Schubert, M.C.; Kimmerle, A.; Broisch, J.; Rein, S.; Kwapil, W.; Warta, W.
Zeitschriftenaufsatz, Konferenzbeitrag
2011Quality Control of Czochralski Grown Silicon Wafers in Solar Cell Production Using Photoluminescence Imaging
Haunschild, J.; Broisch, J.; Reis, I.E.; Rein, S.
Konferenzbeitrag