Fraunhofer-Publica List: Bauer, A*

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.


2021	Agil arbeiten, lernen, Unternehmenswerte pflegen Korge, Gabriele; Bauer, Agnes; Sharma, Mara	Aufsatz in Buch
2021	Agiles Lernen im Unternehmen : Longmuß, Jörg (Hrsg.); Korge, Gabriele (Hrsg.); Bauer, Agnes (Hrsg.); Höhne, Benjamin (Hrsg.)	Buch
2021	Agiles Lernen im Unternehmen. Prinzipien, Ablauf, Rollen, Instrumente Korge, Gabriele; Höhne, Benjamin; Bauer, Agnes; Longmuß, Jörg	Aufsatz in Buch
2021	Agiles Lernen zu 100% online Bauer, Agnes; Korge, Gabriele; Aders, Marianne	Aufsatz in Buch
2021	Der Ansatz Agiles Lernen im Unternehmen Korge, Gabriele; Longmuß, Jörg; Höhne, Benjamin; Bauer, Agnes	Aufsatz in Buch
2021	Digitalisierungsprojekte professionell managen Korge, Gabriele; Mantsch, Alexandra; Serra, Anja; Bauer, Agnes	Aufsatz in Buch
2020	A 4H-SiC UV Phototransistor with Excellent Optical Gain Based on Controlled Potential Barrier Benedetto, L. di; Licciardo, G.D.; Erlbacher, T.; Bauer, A.J.; Rubino, A.	Zeitschriftenaufsatz
2020	Antimicrobial peptides from rat-tailed maggots of the drone fly Eristalis tenax show potent activity against multidrug-resistant gram-negative bacteria Hirsch, R.; Wiesner, J.; Bauer, A.; Marker, A.; Vogel, H.; Hammann, P.E.; Vilcinskas, A.	Zeitschriftenaufsatz
2020	Impact of Channel Implantation on a 4H-SiC CMOS Operational Amplifier for High Temperature Applications Albrecht, M.; Perez, D.; Martens, R.C.; Bauer, A.J.; Erlbacher, T.	Konferenzbeitrag
2020	Influence of Aluminum Compensation Effects in 4H-SiC on the Performance of VDMOS Transistors Schlichting, Holger; Kocher, Matthias; Weiße, Julietta; Erlbacher, Tobias; Bauer, Anton J.	Konferenzbeitrag
2020	Influence of Shallow Pits and Device Design of 4H-SiC VDMOS Transistors on In-Line Defect Analysis by Photoluminescence and Differential Interference Contrast Mapping Kocher, Matthias; Schlichting, Holger; Kallinger, Birgit; Rommel, Mathias; Bauer, Anton J.; Erlbacher, Tobias	Konferenzbeitrag
2020	Low-Resistance Ohmic Contact Formation by Laser Annealing of N-Implanted 4H-SiC Hellinger, Carsten; Rusch, Oleg; Rommel, Mathias; Bauer, Anton J.; Erlbacher, Tobias	Konferenzbeitrag
2020	Molecular Networking-Guided Discovery and Characterization of Stechlisins, a Group of Cyclic Lipopeptides from a Pseudomonas sp. Marner, M.; Patras, M.A.; Kurz, M.; Zubeil, F.; Förster, F.; Schuler, S.; Bauer, A.; Hammann, P.; Vilcinskas, A.; Schaberle, T.F.; Glaeser, J.	Zeitschriftenaufsatz
2020	Pre-Deposition Interfacial Oxidation and Post-Deposition Interface Nitridation of LPCVD TEOS Used as Gate Dielectric on 4H-SiC Lim, Minwho; Sledziewski, Tomasz; Rommel, Mathias; Erlbacher, Tobias; Kim, Hong-Ki; Kim, Seongjun; Shin, Hoon-Kyu; Bauer, Anton J.	Konferenzbeitrag
2020	Smart Platform for Rapid Prototyping: A First Solution Approach to Improve Time-to-Market and Process Control in Low-Volume Device Fabrication Schellenberger, M.; Anger, S.; Pfeffer, M.; Häublein, V.; Roeder, G.; Bauer, A.	Konferenzbeitrag
2020	Towards Best Practice in Explaining Neural Network Decisions with LRP Kohlbrenner, M.; Bauer, A.; Nakajima, S.; Binder, A.; Samek, W.; Lapuschkin, S.	Konferenzbeitrag
2019	Agiles Sprintlernen - ein Konzept für dezentrales betriebliches Lernen Jungclaus, Joana; Korge, Gabriele; Arndt, Petra; Bauer, Agnes	Zeitschriftenaufsatz
2019	Aluminum acceptor activation and charge compensation in implanted p-type 4H-SiC Weiße, J.; Hauck, M.; Krieger, M.; Bauer, A.J.; Erlbacher, T.	Zeitschriftenaufsatz
2019	Biological Profiling of Coleoptericins and Coleoptericin-Like Antimicrobial Peptides from the Invasive Harlequin Ladybird Harmonia axyridis Hirsch, R.; Wiesner, J.; Marker, A.; Bauer, A.; Hammann, P.E.; Vilcinskas, A.	Aufsatz in Buch
2019	Channeling in 4H-SiC from an Application Point of View Pichler, Peter; Sledziewski, Tomasz; Häublein, Volker; Bauer, Anton J.; Erlbacher, Tobias	Konferenzbeitrag
2019	Comparison between Ni-SALICIDE and Self-Aligned Lift-Off Used in Fabrication of Ohmic Contacts for SiC Power MOSFET Sledziewski, Tomasz; Erlbacher, Tobias; Bauer, Anton J.; Frey, Lothar; Chen, Ximing; Zhao, Yanli; Li, Chengzhan; Dai, Xiaoping	Konferenzbeitrag
2019	Decoration of Al Implantation Profiles in 4H-SiC by Bevel Grinding and Dry Oxidation Kocher, Matthias; Erlbacher, Tobias; Rommel, Mathias; Bauer, Anton J.	Konferenzbeitrag
2019	Design Considerations for Robust Manufacturing and High Yield of 1.2 kV 4H-SiC VDMOS Transistors Schlichting, H.; Sledziewski, T.; Bauer, A.J.; Erlbacher, T.	Konferenzbeitrag
2019	Determination of Compensation Ratios of Al-Implanted 4H-SiC by TCAD Modelling of TLM Measurements Kocher, Matthias; Yao, Boteng; Weisse, Julietta; Rommel, Mathias; Xu, Zong Wei; Erlbacher, Tobias; Bauer, Anton J.	Konferenzbeitrag
2019	Feasibility of 4H-SiC p-i-n diode for sensitive temperature measurements between 20.5 K and 802 K Matthus, C.D.; Benedetto, L. di; Kocher, M.; Bauer, A.J.; Licciardo, G.D.; Rubino, A.; Erlbacher, T.	Zeitschriftenaufsatz
2019	First Experimental Test on Bipolar Mode Field Effect Transistor Prototype in 4H-SiC. A Proof of Concept Benedetto, L. di; Licciardo, G.D.; Huerner, A.; Erlbacher, T.; Bauer, A.J.; Rubino, A.	Konferenzbeitrag
2019	Improving 5V Digital 4H-SiC CMOS ICs for Operating at 400°C Using PMOS Channel Implantation Albrecht, M.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2019	Influence of Aluminum Compensation Effects in 4H-SiC on the Performance of VDMOS Transistors Schlichting, Holger; Kocher, Matthias; Weiße, Julietta; Erlbacher, Tobias; Bauer, Anton J.	Poster
2019	Influence of shallow pits and device design of 4H-SiC VDMOS transistors on in-line defect analysis by using PL scanning Kocher, Matthias; Schlichting, Holger; Kallinger, Birgit; Rommel, Mathias; Bauer, Anton J.; Erlbacher, Tobias	Poster
2019	Low-resistance ohmic contact formation by laser annealing of N-implanted 4H-SiC Hellinger, Carsten; Rusch, Oleg; Rommel, Mathias; Bauer, Anton J.; Erlbacher, Tobias	Poster
2019	Ohmic Contact Mechanism for Ni/C-Faced 4H-n-SiC Substrate Kim, Seongjun; Kim, Hong-Ki; Lim, Minwho; Jeong, Seonghoon; Kang, Min-Jae; Kang, Min-Sik; Lee, Nam-Suk; Coung, Tran Viet; Kim, Hyunsoo; Erlbacher, Tobias; Bauer, Anton J.; Shin, Hoon-Kyu	Zeitschriftenaufsatz
2019	On the Origin of Charge Compensation in Aluminum-Implanted n-Type 4H-SiC by Analysis of Hall Effect Measurements Weisse, Julietta; Hauck, Martin; Sledziewski, Tomasz; Krieger, Michael; Bauer, Anton J.; Mitlehner, Heinz; Frey, Lothar; Erlbacher, Tobias	Konferenzbeitrag
2019	Performance of 4H-SiC Bipolar Diodes as Temperature Sensor at Low Temperatures Benedetto, L. di; Matthus, C.D.; Erlbacher, T.; Bauer, A.J.; Licciardo, G.D.; Rubino, A.; Frey, L.	Konferenzbeitrag
2019	Pre-deposition interfacial oxidation and post-deposition interface nitridation of LPCVD TEOS used as gate dielectric on 4H-SiC Lim, Minwho; Sledziewski, Tomasz; Rommel, Mathias; Erlbacher, Tobias; Kim, Hong-Ki; Kim, Seongjun; Shin, Hoon-Kyu; Bauer, Anton	Poster
2019	Process and design optimization of SiC MOSFET for low on-state resistance Sledziewski, Tomasz; Erlbacher, Tobias; Bauer, Anton	Vortrag
2019	Profiling antimicrobial peptides from the medical maggot Lucilia sericata as potential antibiotics for MDR Gram-negative bacteria Hirsch, R.; Wiesner, J.; Marker, A.; Pfeifer, Y.; Bauer, A.; Hammann, P.E.; Vilcinskas, A.	Zeitschriftenaufsatz
2019	Publisher’s Note: "Aluminum acceptor activation and charge compensation in implanted p-type 4H-SiC" [AIP Advances 9, 055308 (2019)] Weiße, J.; Hauck, M.; Krieger, M.; Bauer, A.J.; Erlbacher, T.	Zeitschriftenaufsatz
2019	Surface Characterization of Ion Implanted 4H-SiC Epitaxial Layers with Ion Energy and Concentration Variations Kim, Hong-Ki; Kim, Seongjun; Buettner, Jonas; Lim, Minwho; Erlbacher, Tobias; Bauer, Anton J.; Koo, Sang-Mo; Lee, Nam-Suk; Shin, Hoon-Kyu	Konferenzbeitrag
2019	A TCAD Process Model with Monte Carlo Ion Implantation for 4H-SiC JBS Diode Analysis and Design Büttner, J.; Beuer, S.; Petersen, S.; Rommel, M.; Erlbacher, T.; Bauer, A.	Poster
2019	Technological advances towards 4H-SiC JBS diodes for wind power applications Buettner, Jonas; Erlbacher, Tobias; Bauer, Anton	Konferenzbeitrag
2019	Über das Smartphone Wissen und Unterstützung für pflegende Angehörige bereitstellen Rutz, Maria; Gerlach, Mario; Schmeer, Regina; Gaugisch, Petra; Bauer, Alexander; Wolff, Dominik; Behrends, Marianne; Kupka, Thomas; Raudies, Stephanie; Meyenburg-Altwarg, Iris; Dierks, Marie-Luise	Zeitschriftenaufsatz
2019	Wavelength-selective 4H-SiC UV-sensor array Matthus, C.D.; Bauer, A.J.; Frey, L.; Erlbacher, T.	Zeitschriftenaufsatz
2018	Advances in thermal laser separation: Process monitoring in a kerf-free laser-based cutting technology to ensure high yield Barreto, M.C.; Roeder, G.; Steinhoff, M.; Schellenberger, M.; Bauer, A.	Zeitschriftenaufsatz, Konferenzbeitrag
2018	Agiles Sprintlernen Korge, Gabriele; Jungclaus, Joana; Bauer, Agnes	Zeitschriftenaufsatz
2018	Analysis of compensation effects in aluminum-implanted 4H-SiC devices Weisse, J.; Hauck, M.; Sledziewski, T.; Tschiesche, M.; Krieger, M.; Bauer, A.; Mitlehner, H.; Frey, L.; Erlbacher, T.	Konferenzbeitrag
2018	Analytical model for the influence of the gate-voltage on the forward conduction properties of the body-diode in SiC-MOSFETs Huerner, A.; Heckel, T.; Enduschat, A.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2018	Cationic polyacrylamide copolymers (PAMs): Environmental half life determination in sludge‑treated soil Hennecke, Dieter; Bauer, Angela; Herrchen, Monika; Wischerhoff, Erik; Gores, Friedhelm	Zeitschriftenaufsatz
2018	Comparative Study of 4H-SiC UV-Sensors with Ion Implanted and Epitaxially Grown p-Emitter Matthus, C.D.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2018	Decoration of Al implantation profiles in 4H-SiC by bevel grinding and dry oxidation Kocher, Matthias; Erlbacher, Tobias; Rommel, Mathias; Bauer, Anton	Poster
2018	Determination of compensation ratios of Al-implanted 4H-SiC by TCAD modelling of TLM measurements Kocher, Matthias; Yao, Boteng; Weisse, Julietta; Rommel, Mathias; Xu, Zongwei; Erlbacher, Tobias; Bauer, Anton	Poster
2018	Dose dependent profile deviation of implanted aluminum in 4H-SiC during high temperature annealing Kocher, Matthias; Rommel, Mathias; Sledziewski, Tomasz; Häublein, Volker; Bauer, Anton	Poster
2018	Dose Dependent Profile Deviation of Implanted Aluminum in 4H-SiC During High Temperature Annealing Kocher, Matthias; Rommel, Mathias; Sledziewski, Tomasz; Häublein, Volker; Bauer, Anton J.	Konferenzbeitrag
2018	Electrical properties of schottky-diodes based on B doped diamond Erlbacher, T.; Huerner, A.; Zhu, Y.; Bach, L.; Schletz, A.; Zürbig, Verena; Pinti, Lucas; Kirste, Lutz; Giese, Christian; Nebel, Christoph E.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2018	Elektronik Bauer, Anton; Bär, Eberhard; Erlbacher, Tobias; Friedrich, Jochen; Lorenz, Jürgen; Rommel, Mathias; Schellenberger, Martin	Aufsatz in Buch
2018	Evidence of low injection efficiency for implanted p-emitters in bipolar 4H-SiC high-voltage diodes Matthus, C.D.; Huerner, A.; Erlbacher, T.; Bauer, A.; Frey, L.	Zeitschriftenaufsatz
2018	Hätte ich das mal vorher gewusst! Gaugisch, Petra; Bauer, Alexander; Gerlach, Mario; Schmeer, Regina; Rutz, Maria; Wolff, Dominik; Behrends, Marianne; Kupka, Thomas	Konferenzbeitrag
2018	Impact of Al-ion implantation on the formation of deep defects in n-type 4H-SiC Weiße, Julietta; Hauck, Martin; Krieger, Michael; Erlekampf, Jürgen; Mitlehner, Heinz; Bauer, Anton J.; Rommel, Mathias; Häublein, Volker; Erlbacher, Tobias; Csato, Constantin; Rüb, Michael; Akhmadaliev, Shavkat; Frey, Lothar	Konferenzbeitrag
2018	Influence of Al doping concentration and annealing parameters on TiAl based Ohmic contacts on 4H-SiC Kocher, Matthias; Rommel, Mathias; Erlbacher, Tobias; Bauer, Anton J.	Konferenzbeitrag
2018	The influence of investment expenditures on the development of fast charging infrastructure Horn, D.; Bauer, A.; Schmidt, A.; Udovenko, O.	Konferenzbeitrag
2018	Influence of triangular defects on the electrical characteristics of 4H-SiC devices Schoeck, J.; Schlichting, H.; Kallinger, B.; Erlbacher, T.; Rommel, M.; Bauer, A.J.	Konferenzbeitrag
2018	Mass Separation Issues for the Implantation of Doubly Charged Aluminum Ions Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2018	Rollo aus einem Flächenmaterial mit Sandwich-Struktur Bauer, Annette; Becker, Katharina; Bernaschek, Andreas; Borges, Ralf; Dreyer, Christian	Patent
2018	Total Synthesis and Structural Revision of the Antibiotic Tetrapeptide GE81112A Jürjens, G.; Schuler, S.M.M.; Kurz, M.; Petit, S.; Couturier, C.; Jeannot, F.; Nguyen, F.; Wende, R.C.; Hammann, P.E.; Wilson, D.N.; Bacqué, E.; Pöverlein, C.; Bauer, A.	Zeitschriftenaufsatz
2017	4.5 kV SiC junction barrier schottky diodes with low leakage current and high forward current density Schöck, Johannes; Büttner, Jonas; Rommel, Mathias; Erlbacher, Tobias; Bauer, Anton	Konferenzbeitrag
2017	Advanced 4H-SiC p-i-n Diode as Highly Sensitive High-Temperature Sensor Up To 460 degrees C Matthus, C.D.; Erlbacher, T.; Hess, A.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2017	Development of sensor integration concept for mass production processes Rost, F.; Arnold, B.; Decker, R.; Bauer, A.; Tsapkolenko, A.; Rzepka, S.; Mehner, J.; Kroll, L.	Konferenzbeitrag
2017	Enhanced contamination control methods in advanced wafer processing Pfeffer, M.; Richter, H.; Altmann, R.; Leibold, A.; Bauer, A.	Konferenzbeitrag
2017	Experimental verification of a self-triggered solid-state circuit breaker based on a SiC BIFET Albrecht, M.; Hürner, A.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2017	Implementation of 4H-SiC PiN-diodes as nearly linear temperature sensors up to 800 K towards SiC multi-sensor integration Matthus, C.D.; Erlbacher, T.; Schöfer, B.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2017	Implementation of new discovery pipelines in industry to access novel lead structures for antibiotics development Glaeser, J.; Zubeil, F.; Toti, L.; Bauer, A.; Vilcinskas, A.; Hammann, P.	Abstract
2017	Influence of Al doping concentration and annealing parameters on TiAl based ohmic contacts on 4H-SiC Kocher, Matthias; Rommel, Mathias; Erlbacher, Tobias; Bauer, Anton	Poster
2017	Influence of triangular defects on the electrical characteristics of 4H-SiC devices Schöck, Johannes; Schlichting, Holger; Kallinger, Birgit; Erlbacher, Tobias; Rommel, Mathias; Bauer, Anton J.	Poster
2017	Monolithically integrated solid-state-circuit-breaker for high power applications Huerner, A.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2017	Novel advanced analytical design tool for 4H-SiC VDMOSFET devices Benedetto, L. di; Licciardo, G.D.; Erlbacher, T.; Bauer, A.J.; Rubino, A.	Konferenzbeitrag
2017	Point contact current voltage measurements of 4H-SiC samples with different doping profiles Kocher, Matthias; Niebauer, Michael; Rommel, Mathias; Haeublein, Volker; Bauer, Anton	Konferenzbeitrag
2017	Stress reduction in high voltage MIS capacitor fabrication Banzhaf, S.; Kenntner, J.; Grieb, M.; Schwaiger, S.; Erlbacher, T.; Bauer, A.J.; Frey, L.; Frey, L.	Konferenzbeitrag
2017	Svetamycins A-G, unusual piperazic acid-containing peptides from Streptomyces sp. Dardić, D.; Lauro, G.; Bifulco, G.; Laboudie, P.; Sakhaii, P.; Bauer, A.; Vilcinskas, A.; Hammann, P.E.; Plaza, A.	Zeitschriftenaufsatz
2016	4.5 kV SiC junction barrier schottky diodes with low leakage current and high forward current density Schöck, Johannes; Büttner, Jonas; Rommel, Mathias; Erlbacher, Tobias; Bauer, Anton	Poster
2016	Advanced detection method for polymer residues on semiconductor substrates Richter, H.; Pfitzner, L.; Pfeffer, M.; Bauer, A.; Siegert, J.; Bodner, T.	Konferenzbeitrag
2016	Analytical Model and Design of 4H-SiC Planar and Trenched JBS Diodes Di Benedetto, L.; Licciardo, G.D.; Erlbacher, T.; Bauer, A.J.; Bellone, S.	Zeitschriftenaufsatz
2016	Conduction loss reduction for bipolar injection field-effect-transistors (BIFET) Hürner, Andreas; Mitlehner, Heinz; Erlbacher, Tobias; Bauer, Anton J.; Frey, Lothar	Konferenzbeitrag
2016	Ion implanted 4H-SiC UV pin-diodes for solar radiation detection - simulation and characterization Matthus, Christian D.; Erlbacher, Tobias; Burenkov, Alexander; Bauer, Anton J.; Frey, Lothar	Konferenzbeitrag
2016	A model of electric field distribution in gate oxide and JFET-region of 4H-SiC DMOSFETs Benedetto, Luigi di; Licciardo, Gian D.; Erlbacher, Tobias; Bauer, Anton J.; Liguori, R.; Rubino, Alfredo	Zeitschriftenaufsatz
2016	Monolithic 3D TSV-based high-voltage, high-temperature capacitors Gruenler, S.; Rattmann, G.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2016	Optimized design for 4H-SiC power DMOSFETs Benedetto, Luigi di; Licciardo, Gian D.; Erlbacher, Tobias; Bauer, Anton J.; Rubino, Alfredo	Zeitschriftenaufsatz
2016	Particle free handling of substrates Samadi, H.; Pfeffer, M.; Altmann, R.; Leibold, A.; Gumprecht, T.; Bauer, A.	Zeitschriftenaufsatz
2016	Post-trench processing of silicon deep trench capacitors for power electronic applications Banzhaf, Stefanie; Schwaiger, Stefan; Erlbacher, Tobias; Bauer, Anton J.; Frey, Lothar	Konferenzbeitrag
2016	Potential of 4H-SiC CMOS for high temperature applications using advanced lateral p-MOSFETs Albrecht, Matthäus; Erlbacher, Tobias; Bauer, Anton J.; Frey, Lothar	Konferenzbeitrag
2016	Prospects and issues of nanomaterials use in microelectronics Jank, Michael; Bauer, Anton; Frey, Lothar	Poster
2016	Semiconductor equipment assessment - An enabler for production ready equipment Pfeffer, M.; Pfitzner, L.; Bauer, A.	Konferenzbeitrag
2016	SF3: Unusual Antimicrobial Hexapeptides from a Streptomyces sp Strain Dardic, D.; Hirsch, R.; Druzineck, D.; Wiesner, J.; Bauer, A.; Vilcinskas, A.; Hammann, P.; Plaza, A.	Abstract
2016	Silicon integrated RC snubbers for applications up to 900V with reduced mechanical stress and high manufacturability Krach, Florian; Thielen, Nils; Heckel, Thomas; Bauer, Anton J.; Erlbacher, Tobias; Frey, Lothar	Konferenzbeitrag
2016	Systematic characterization of doping profiles in 4H-SiC by point contact current voltage measurements Kocher, Matthias; Niebauer, Michael; Rommel, Mathias; Haeublein, Volker; Bauer, Anton	Poster
2015	Advanced contamination control methods for yield enhancement. YE: Yield Enhancement/Learning Richter, H.; Leibold, A.; Altmann, R.; Doffek, B.; Koebl, J.; Pfeffer, M.; Bauer, A.; Schneider, G.; Cheung, D.	Konferenzbeitrag
2015	Atomic scale characterization of SiO2/4H-SiC interfaces in MOSFETs devices Beltran, A.M.; Duguay, S.; Strenger, C.; Bauer, A.J.; Cristiano, F.; Schamm-Chardon, S.	Zeitschriftenaufsatz
2015	Classification and key feature extraction for equipment health monitoring Krauel, Christopher; Weishäupl, Laura; Petzold, Lisa; Pfeffer, Markus; Bauer, Anton	Vortrag
2015	Comprehensive study of the electron scattering mechanisms in 4H-SiC MOSFETs Uhnevionak, Viktoryia; Burenkov, Alexander; Strenger, Christian; Ortiz, Guillermo; Bedel-Pereira, Elena; Mortet, Vincent; Cristiano, Fuccio; Bauer, Anton J.; Pichler, Peter	Zeitschriftenaufsatz
2015	High-voltage monolithic 3D capacitors based on through-silicon-via technology Grünler, Saeideh; Rattmann, Gudrun; Erlbacher, Tobias; Bauer, Anton; Frey, Lothar	Poster
2015	Impact of acceptor concentration on electrical properties and density of interface states of 4H-SiC n-metal-oxide-semiconductor field effect transistors studied by Hall effect Ortiz, Guillermo; Strenger, Christian; Uhnevionak, Viktoryia; Burenkov, Alexander; Bauer, Anton J.; Pichler, Peter; Cristiano, Fuccio; Bedel-Pereira, Elena; Mortet, Vincent	Zeitschriftenaufsatz
2015	Impact of post-trench processing on the electrical characteristics of 4H-SiC trench-MOS structures with thick top and bottom oxides Banzhaf, C.T.; Grieb, M.; Rambach, M.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2015	Improved electrical behavior of ZrO2-based MIM structures by optimizing the O3 oxidation pulse time Paskaleva, A.; Weinreich, W.; Bauer, A.J.; Lemberger, M.; Frey, L.	Zeitschriftenaufsatz
2015	Influence of annealing, oxidation and doping on conduction-band near interface traps in 4H-SiC characterized by low temperature conductance measurements Noll, S.; Rambach, M.; Grieb, M.; Scholten, D.; Bauer, A.; Frey, L.	Konferenzbeitrag
2015	Modeling of ion drift in 4H-SiC-based chemical MOSFET sensors Erlbacher, T.; Schwarzmann, H.; Bauer, A.J.; Döhler, G.H.; Schreivogel, M.; Lutz, T.; Guillén, F.H.; Graf, J.; Fix, R.; Frey, L.	Zeitschriftenaufsatz
2015	Modeling of the electrochemical etch stop with high reverse bias across pn-junctions Szwarc, Robert; Frey, Lothar; Weber, Hans; Moder, Iris; Erlbacher, Tobias; Rommel, Mathias; Bauer, Anton J.	Vortrag
2015	Modelling of the electrochemical etch stop with high reverse bias across pn-junctions Szwarc, R.; Frey, L.; Weber, H.; Moder, I.; Erlbacher, T.; Rommel, M.; Bauer, A.J.	Konferenzbeitrag
2015	Particle free handling of substrates Samadi, H.; Pfeffer, M.; Altmann, R.; Leibold, A.; Gumprecht, T.; Bauer, A.	Konferenzbeitrag
2015	Robust double-ring junction termination extension design for high voltage power semiconductor devices based on 4H-SiC Hürner, A.; Benedetto, L. di; Erlbacher, T.; Mitlehner, H.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2015	Semiconductor equipment assessment - an enabler for production ready equipment Pfeffer, M.; Pfitzner, L.; Bauer, A.	Konferenzbeitrag
2015	Silicon nitride, a high potential dielectric for 600 V integrated RC-snubber applications Krach, F.; Schwarzmann, H.; Bauer, A.J.; Erlbacher, T.; Frey, L.	Zeitschriftenaufsatz
2015	Tailoring the electrical properties of HfO2 MOS-devices by aluminum doping Paskaleva, Albena; Rommel, Mathias; Hutzler, Andreas; Spassov, Dencho; Bauer, Anton J.	Zeitschriftenaufsatz
2015	Temperature dependent characterization of bipolar injection field-effect-transistors (BiFET) for determining the short-circuit-capability Hürner, A.; Erlbacher, T.; Mitlehner, H.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2015	Thermal laser separation - a novel dicing technology fulfilling the demands of volume manufacturing of 4H-SiC devices Lewke, D.; Dohnke, K.O.; Zühlke, H.U.; Cerezuela Barret, M.; Schellenberger, M.; Bauer, A.; Ryssel, H.	Konferenzbeitrag
2014	Effect of shallow n-doping on field effect mobility in p-doped channels of 4H-SiC MOS field effect transistors Noll, S.; Rambach, M.; Grieb, M.; Scholten, D.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2014	Energetic evaluation of partly or fully automated assembly processes with regard to ergonomics Böhme, Jeannette; Bauer, Anna; Todtermuschke, Marcel	Konferenzbeitrag
2014	Experimental analysis of bipolar SiC-devices for future energy distribution systems Huerner, A.; Mitlehner, H.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2014	Hall factor calculation for the characterization of transport properties in n-channel 4H-SiC MOSFETs Uhnevionak, U.; Burenkov, A.; Strenger, C.; Mortet, V.; Bedel-Peireira, E.; Cristiano, F.; Bauer, A.J.; Pichler, Peter	Konferenzbeitrag
2014	High-mobility metal-oxide thin-film transistors by spray deposition of environmentally friendly precursors Oertel, S.; Jank, M.P.M.; Teuber, E.; Bauer, A.J.; Frey, L.	Konferenzbeitrag, Zeitschriftenaufsatz
2014	Impact of fabrication process on electrical properties and on interfacial density of states in 4H-SiC n-MOSFETs studied by hall effect Ortiz, Guillermo; Mortet, Vincent; Strenger, Christian; Uhnevionak, Viktoryia; Burenkov, Alexander; Bauer, Anton J.; Pichler, Peter; Cristiano, Fuccio; Bedel-Pereira, Elena	Konferenzbeitrag
2014	Influence of diverse post-trench processes on the electrical performance of 4H-SiC MOS structures Banzhaf, C.T.; Grieb, M.; Trautmann, A.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2014	Investigation of trenched and high temperature annealed 4H-SiC Banzhaf, C.T.; Grieb, M.; Trautmann, A.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2014	Large area fabrication of plasmonic color filters using UV-SCIL Rumler, Maximilian; Fader, R.; Förthner, M.; Haas, A.; Rommel, M.; Bauer, A.J.; Frey, L.	Vortrag
2014	Large area fabrication of plasmonic color filters using UV-SCIL Rumler, Maximilian; Fader, Robert; Förthner, Michael; Haas, Anke; Rommel, Mathias; Bauer, Anton; Frey, Lothar	Vortrag
2014	Methodology for creation a reference trajectory for energetic comparability of industrial robots in body shop Todtermuschke, Marcel; Findeisen, Mathias; Bauer, Anna	Zeitschriftenaufsatz, Konferenzbeitrag
2014	Nanoscale characterization of TiO2 films grown by atomic layer deposition on RuO2 electrodes Murakami, Katsuhisa; Rommel, Mathias; Hudec, Boris; Rosová, Alica; Hušeková, Krístina; Dobročka, Edmund; Rammula, Raul; Kasikov, Arne; Han, Jeong Hwan; Lee, Woongkyu; Song, Seul Ji; Paskaleva, Albena; Bauer, Anton J.; Frey, Lothar; Fröhlich, Karol; Aarik, Jaan; Hwang, Cheol Seong	Zeitschriftenaufsatz
2014	NanoSPV - SPM Technique for Measuring Minority Charge Carrier Diffusion Lengths with High Spatial Resolution Stumpf, Florian; Rommel, M.; Bauer, A.J.; Frey, L.; Hitzel, F.; Stadelmann, A.	Vortrag
2014	NanoSPV - SPM Technique for the Quantitative Measurement of Minority Charge Carrier Diffusion Lengths with High Spatial Resolution Stumpf, Florian; Rommel, Mathias; Bauer, Anton; Frey, Lothar; Hitzel, Frank; Stadelmann, Anja; Bartel, Til	Vortrag
2014	Optical polymers with tunable refractive index for nanoimprint technologies Landwehr, Johannes; Fader, Robert; Rumler, Maximilian; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar; Simon, B.; Fodor, B.; Petrik, Peter; Schiener, A.; Winter, Benjamin; Spiecker, Erdmann	Zeitschriftenaufsatz
2014	Optical polymers with tunable refractive index for nanoimprint technologies Fader, Robert; Landwehr, Johannes; Rumler, Maximilian; Förthner, Michael; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar; Simon, B.; Fodor, B.; Petrik, Peter; Winter, Benjamin; Spiecker, Erdmann	Poster
2014	Optical polymers with tunable refractive index for nanoimprint technologies Fader, Robert; Landwehr, Johannes; Rumler, Maximilian; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar; Simon, B.; Fodor, B.; Petrik, Peter; Schiener, A.; Winter, Benjamin; Spiecker, Erdmann	Poster
2014	Reliability of monolithic RC-snubbers in MOS-based power modules Erlbacher, T.; Schwarzmann, H.; Krach, F.; Bauer, A.J.; Berberich, S.E.; Kasko, I.; Frey, L.	Konferenzbeitrag
2014	Structure placement accuracy of wafer level stamps for substrate conformal imprint lithography Fader, Robert; Förthner, Michael; Rumler, Maximilian; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar; Verschuuren, Marc; Butschke, Jörg; Irmscher, Mathias; Storace, Eleonora; Ji, Ran; Schömbs, Ulrike	Poster
2014	Systematic analysis of the high- and low-field channel mobility in lateral 4H-SiC MOSFETs Strenger, C.; Uhnevionak, V.; Mortet, V.; Ortiz, G.; Erlbacher, T.; Burenkov, A.; Bauer, A.J.; Cristiano, F.; Bedel-Pereira, E.; Pichler, P.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2014	Temperature and electrical field dependence of the ambipolar mobility in n-doped 4H-SiC Hürner, A.; Bonse, C.; Clemmer, G.; Kallinger, B.; Heckel, T.; Erlbacher, T.; Mitlehner, H.; Häublein, V.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2014	Thickness mapping of high-k dielectrics at the nanoscale Trapnauskas, Justinas; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar	Zeitschriftenaufsatz
2013	Accuracy of wafer level alignment with substrate conformal imprint lithography Fader, Robert; Rommel, Mathias; Bauer, Anton J.; Rumler, Maximilian; Frey, Lothar; Verschuuren, Marcus Antonius; Laar, Robert van de; Ji, Ran; Schömbs, Ulrike	Zeitschriftenaufsatz, Konferenzbeitrag
2013	Accuracy of wafer level alignment with substrate conformal imprint lithography Fader, Robert; Rumler, M.; Rommel, M.; Bauer, A.J.; Frey, L.; Verschuuren, M.A.; Laar, R. van de; Ji, R.; Schömbs, U.	Vortrag
2013	Alloying of ohmic contacts to n-type 4H-SiC via laser irradiation Hürner, A.; Schlegl, T.; Adelmann, B.; Mitlehner, H.; Hellmann, R.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2013	Bimodal CAFM TDDB distributions in polycrystalline HfO2 gate stacks: The role of the interfacial layer and grain boundaries Iglesias, V.; Martin-Martinez, J.; Porti, M.; Rodriguez, R.; Nafria, M.; Aymerich, X.; Erlbacher, T.; Rommel, M.; Murakami, K.; Bauer, A.J.; Frey, L.; Bersuker, G.	Zeitschriftenaufsatz
2013	Characterization of diverse gate oxides on 4H-SiC 3D trench-MOS structures Banzhaf, C.T.; Grieb, M.; Trautmann, A.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2013	Comparative study of n-LIGBT and n-LDMOS structures on 4H-SiC Häublein, V.; Temmel, G.; Mitlehner, H.; Rattmann, G.; Strenger, C.; Hürner, A.; Bauer, A.J.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2013	Correlation of interface characteristics to electron mobility in channel-implanted 4H-SiC MOSFETs Strenger, C.; Uhnevionak, V.; Burenkov, A.; Bauer, A.J.; Mortet, V.; Bedel-Pereira, E.; Cristiano, F.; Krieger, M.; Ryssel, H.	Konferenzbeitrag
2013	Detailed leakage current analysis of metal-insulator-metal capacitors with ZrO2, ZrO2/SiO2/ZrO2, and ZrO2/Al2O3/ZrO2 as dielectric and TiN electrodes Weinreich, W.; Shariq, A.; Seidel, K.; Sundqvist, J.; Paskaleva, A.; Lemberger, M.; Bauer, A.J.	Zeitschriftenaufsatz, Konferenzbeitrag
2013	Electrical impact of the aluminum p-implant annealing on lateral MOSFET transistors on 4H-SiC n-epi Noll, S.; Scholten, D.; Grieb, M.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2013	Evaluation of resistless Ga+ beam lithography for UV NIL stamp fabrication Rumler, Maximilian; Fader, Robert; Haas, Anke; Rommel, Mathias; Bauer, Anton; Frey, Lothar	Zeitschriftenaufsatz
2013	Evaluation of UV-SCIL resists for structure transfer using plasma etching Rumler, Maximilian; Rusch, O.; Fader, Robert; Haas, Anke; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar; Brehm, Markus; Kraft, Andreas	Poster
2013	Functional epoxy polymer for direct nano-imprinting of micro-optical elements Fader, R.; Landwehr, J.; Rumler, M.; Rommel, M.; Bauer, A.J.; Frey, L.; Völkel, R.; Brehm, M.; Kraft, A.	Zeitschriftenaufsatz
2013	Hall effect characterization of 4H-SiC MOSFETs: Influence of nitrogen channel implantation Mortet, V.; Bedel-Pereira, E.; Bobo, J.F.; Cristiano, F.; Strenger, C.; Uhnevionak, V.; Burenkov, A.; Bauer, A.J.	Konferenzbeitrag
2013	Influence of ion implantation in SiC on the channel mobility in lateral n-channel MOSFETs Strenger, C.; Uhnevionak, V.; Burenkov, A.; Bauer, A.J.; Pichler, P.; Erlbacher, T.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2013	Influence of parasitic capacitances on conductive AFM I-V measurements and approaches for its reduction Rommel, Mathias; Jambreck, Joachim D.; Lemberger, Martin; Bauer, Anton J.; Frey, Lothar; Murakami, Katsuhisa; Richter, Christoph; Weinzierl, Philipp	Zeitschriftenaufsatz
2013	Laser alloying nickel on 4H-silicon carbide substrate to generate ohmic contacts Adelmann, B.; Hürner, A.; Schlegel, T.; Bauer, A.J.; Frey, L.; Hellmann, R.	Zeitschriftenaufsatz
2013	Life time of flexible PDMS stamps for UV-enhanced substrate conformal imprint lithography (SCIL) Fader, Robert; Rumler, M.; Rommel, M.; Bauer, A.J.; Frey, L.; Brehm, M.; Kraft, A.; Reboud, V.; Landis, S.	Vortrag
2013	On the temperature dependence of the hall factor in n-channel 4H-SiC MOSFETs Uhnevionak, V.; Burenkov, A.; Strenger, C.; Bauer, A.J.; Pichler, P.	Konferenzbeitrag
2013	Optimierungsverfahren für die ressourceneffiziente Planung von Montageanlagen Bauer, Anna	Diplomarbeit
2013	Patterning flat and tilted 4H-SiC by Ga+ resistless lithography and subsequent reactive ion etching Beuer, Susanne; Rommel, Mathias; Rumler, Maximilian; Haas, Anke; Bauer, Anton J.; Frey, Lothar	Poster
2013	Processing of silicon nanostructures by Ga+ resistless lithography and reactive ion etching Rommel, M.; Rumler, M.; Haas, A.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2013	Structural properties of as deposited and annealed ZrO2 influenced by atomic layer deposition, substrate, and doping Weinreich, W.; Wilde, L.; Müller, J.; Sundqvist, J.; Erben, E.; Heitmann, J.; Lemberger, M.; Bauer, A.J.	Zeitschriftenaufsatz
2013	Surface modification of flexible plain and microstructured hard and soft PDMS-thin films by plasma treatment and layer deposition for improved usability for biomedical applications Scharin, Marina; Rommel, Mathias; Dirnecker, Tobias; Rumler, Maximilian; Fader, Robert; Bauer, Anton J.; Frey, Lothar; Hermman, Martin	Poster
2013	Verification of near-interface traps models by electrical measurements on 4H-SiC n-channel MOSFETs Uhnevionak, V.; Strenger, C.; Burenkov, A.; Mortet, V.; Bedel-Pereira, E.; Cristiano, F.; Bauer, A.; Pichler, P.	Konferenzbeitrag
2012	4H-SiC MOSFETs with a stable protective coating for harsh environment applications Daves, W.; Krauss, A.; Häublein, V.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2012	Amplitude modulated resonant push-pull driver for piezoelectric transformers in switching power applications Schwarzmann, Holger; Erlbacher, Tobias; Bauer, Anton J.; Ryssel, Heiner; Frey, Lothar	Konferenzbeitrag
2012	Approaches for the reduction of the influence of parasitic capacitances on local IV characteristics for conductive AFM Rommel, Mathias; Jambreck, Joachim D.; Murakami, Katsuhisa; Lemberger, Martin; Richter, Christoph; Weinzierl, Philip; Bauer, Anton J.; Frey, Lothar	Vortrag
2012	Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy Rumler, Maximilian; Rommel, Mathias; Erlekampf, Jürgen; Azizi, Maral; Geiger, Tobias; Bauer, Anton J.; Meißner, Elke; Frey, Lothar	Zeitschriftenaufsatz
2012	Comparative study of electrical and microstructural properties of 4H-SiC MOSFETs Strenger, C.; Häublein, V.; Erlbacher, T.; Bauer, A.J.; Ryssel, H.; Beltran, A.M.; Schamm-Chardon, S.; Mortet, V.; Bedel-Pereira, E.; Lefebvre, M.; Cristiano, F.	Konferenzbeitrag
2012	Effect of HfO2 polycrystallinity on distribution of the CAFM-induced TDDB in high-k gate stacks Iglesias, V.; Erlbacher, T.; Rommel, M.; Murakami, K.; Bauer, A.J.; Frey, L.; Porti, M.; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Aymerich, X.; Bersuker, G.	Poster
2012	Electrical characterization of nanostructured p-silicon electrodes for bioimpedance measurements on single cell level Pliquett, Uwe; Westenthanner, Maximilian; Rommel, Mathias; Bauer, Anton J.; Beckmann, Dieter	Konferenzbeitrag
2012	Evaluation of resistless Ga+ beam lithography for UV-NIL stamp fabrication Rumler, Maximilian; Fader, Robert; Haas, Anke; Rommel, Matthias; Bauer, Anton J.; Frey, Lothar	Poster
2012	Fabrication and application of shielded probes for conductive AFM measurements Jambreck, Joachim D.; Rommel, Mathias; Richter, Christoph; Weinzierl, Philip; Bauer, Anton J.; Frey, Lothar	Poster
2012	Feasibility and limitations of anti-fuses based on bistable non-volatile switches for power electronic applications Erlbacher, T.; Huerner, A.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2012	Feasiblity and limitations of anti-fuses based on bistable non-volatile switches for power electronic applications Erlbacher, Tobias; Hürner A.; Bauer, Anton J.; Frey, Lothar	Zeitschriftenaufsatz
2012	Functional epoxy polymer for direct nano-imprinting of micro optical elements Fader, Robert; Landwehr Johannes; Rumler, Maximilian; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar; Völkel, Reinhard; Brehm, Markus; Kraft, Andreas	Poster
2012	Hall effect characterizations of 4H-SiC MOSFETs: Influence of nitrogen channel implantation Mortet, V.; Bedel-Pereira, E.; Bobo, J.; Strenger, C.; Uhnevionak, V.; Burenkov, A.; Cristiano, F.; Bauer, A.	Poster
2012	Improving module performance and reliability in power electronic applications by monolithic integration of RC-snubbers Erlbacher, Tobias; Schwarzmann, Holger; Bauer, Anton J.; Berberich, Sven E.; Dorp, Joachim vom; Frey, Lothar	Konferenzbeitrag
2012	Life time evaluation of PDMS stamps for UV-enhanced substrate conformal imprint lithography Schmitt, H.; Duempelmann, P.; Fader, R.; Rommel, M.; Bauer, A.J.; Frey, L.; Brehm, M.; Kraft, A.	Zeitschriftenaufsatz, Konferenzbeitrag
2012	Nano-analytical and electrical characterization of 4H-SiC MOSFETs Beltran, A.M.; Schamm-Chardon, S.; Mortet, V.; Lefebvre, M.; Bedel-Pereira, E.; Cristiano, F.; Strenger, C.; Häublein, V.; Bauer, A.J.	Konferenzbeitrag
2012	Nanoscale characterization of TiO2 films grown by atomic layer deposition Murakami, Katsuhisa; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar; Hudec, Boris; Rosova, A.; Hueková, K.; Fröhlich, Karol; Kasikov, A.; Ramula, R.; Aarik, J.; Han, J.H.; Han, S.; Lee, W.; Song, S.J.; Hwang, C.S.	Poster
2012	Novel organic polymer for UV-enhanced substrate conformal imprint lithography Fader, R.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.; Ji, R.; Hornung, M.; Brehm, M.; Vogler, M.	Zeitschriftenaufsatz, Konferenzbeitrag
2012	Ohmic and rectifying contacts on bulk AlN for radiation detector applications Erlbacher, Tobias; Bickermann, Matthias; Kallinger, Birgit; Meissner, Elke; Bauer, Anton J.; Frey, Lothar	Zeitschriftenaufsatz, Konferenzbeitrag
2012	Plasma-assisted atomic layer deposition of alumina at room temperature Lemberger, Martin; Fromm, Timo; Rommel, Mathias; Bauer, Anton J.; Frey, Lothar	Poster
2012	Reliability characterization of dielectrics in 200V trench capacitors Erlbacher, Tobias; Schwarzmann, Holger; Bauer, Anton J.; Dorp, Joachim vom; Frey, Lothar	Poster
2012	Significant on-resistance reduction of LDMOS devices by intermitted trench gates integration Erlbacher, Tobias; Bauer, Anton J.; Frey, Lothar	Zeitschriftenaufsatz
2012	Simple and efficient method to fabricate nano cone arrays by FIB milling demonstrated on planar substrates and on protruded structures Rommel, M.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2012	Structural and reliability analysis of ohmic contacts to SiC with a stable protective coating for harsh environment applications Daves, W.; Kraus, A.; Häublein, V.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2012	TiO2-based metal-insulator-metal structures for future DRAM storage capacitors Fröhlich, K.; Hudec, B.; Tapajna, M.; Hueková, K.; Rosova, A.; Eliá, P.; Aarik, J.; Rammula, R.; Kasikov, A.; Arroval, T.; Aarik, L.; Murakami, Katsuhisa; Rommel, Mathias; Bauer, Anton J.	Konferenzbeitrag
2012	Verification of near-interface traps by electrical measurements on 4H-SiC n-channel MOSFETs Uhnevionak, V.; Strenger, C.; Burenkov, A.; Mortet, V.; Bedel-Pereira, E.; Cristiano, F.; Bauer, A.; Pichler, P.	Vortrag
2011	4H-SiC n-MOSFET logic circuits for high temperature operation Le-Huu, M.; Grieb, M.; Schrey, F.F.; Schmitt, H.; Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2011	Amorphous silicon carbide thin films (a-SiC:H) deposited by plasma-enhanced chemical vapor deposition as protective coatings for harsh environment applications Daves, W.; Krauss, A.; Behnel, N.; Häublein, V.; Bauer, A.; Frey, L.	Zeitschriftenaufsatz
2011	Characterization of thickness variations of thin dielectric layers at the nanoscale using scanning capacitance microscopy Yanev, V.; Rommel, M.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	Comparative study on metallization and passivation materials for high temperature sensor applications Daves, W.; Krauss, A.; Le-Huu, M.; Kronmüller, S.; Häublein, V.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2011	A conceptual framework for automatic situation assessment Fischer, Yvonne; Bauer, Alexander; Beyerer, Jürgen	Konferenzbeitrag
2011	Current voltage characteristics through grains and grain boundaries of high-k dielectric thin films measured by tunneling atomic force microscopy Murakami, K.; Rommel, M.; Yanev, V.; Bauer, A.J.; Frey, L.	Poster
2011	Current voltage characteristics through grains and grain boundaries of high-k dielectric thin films measured by tunneling atomic force microscopy Murakami, Katsuhisa; Rommel, Mathias; Yanev, Vasil; Bauer, Anton J.; Frey, Lothar	Konferenzbeitrag
2011	Dielectric layers suitable for high voltage integrated trench capacitors Dorp, J. vom; Erlbacher, T.; Bauer, A.J.; Ryssel, H.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	Effect of increased oxide hole trap density due to nitrogen incorporation at the SiO2/SiC interface on F-N current degradation Strenger, C.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2011	Electrical characterization of lateral 4H-SiC MOSFETs in the temperature range of 25 to 600 °C for harsh environment applications Daves, W.; Krauss, A.; Häublein, V.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2011	Enhancement of the stability of Ti and Ni ohmic contacts to 4H-SiC with a stable protective coating for harsh environment applications Daves, W.; Krauss, A.; Häublein, V.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2011	Experiments and simulation of the diffusion and activation of the n-Type dopants P, As, and Sb implanted into germanium Koffel, S.; Kaiser, R.J.; Bauer, A.J.; Amon, B.; Pichler, P.; Lorenz, J.; Frey, L.; Scheiblin, P.; Mazzocchi, V.; Barnes, J.-P.; Claverie, A.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	Fluorine implantation for effective work function control in p-type metal-oxide-semiconductor high-k metal gate stacks Fet, A.; Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	Gate oxide reliability at the nano-scale evaluated by combining cAFM and CVS Erlbacher, T.; Yanev, V.; Rommel, M.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	Germanium substrate loss during thermal processing Kaiser, R.J.; Koffel, S.; Pichler, P.; Bauer, A.J.; Amon, B.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	High pressure oxidation of 4H-SiC in nitric acid vapor Kalai Selvi, K.; Sreenidhi, T.; Dasgupta, N.; Ryssel, H.; Bauer, A.	Zeitschriftenaufsatz
2011	A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers Murakami, M.; Rommel, M.; Yanev, V.; Erlbacher, T.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2011	Implication of oxygen vacancies on current conduction mechanisms in TiN/Zr1-xAlxO2/TiN metal-insulator-metal structures Paskaleva, A.; Lemberger, M.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2011	Influence of annealing parameters on surface roughness, mobility, and contact resistance of aluminium implanted 4H SiC Schmitt, H.; Häublein, V.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2011	Investigation of the reliability of 4H-SiC MOS devices for high temperature applications Le-Huu, M.; Schmitt, H.; Noll, S.; Grieb, M.; Schrey, F.F.; Bauer, A.J.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz
2011	Life time evaluation of PDMS stamps for UV-enhanced substrate conformal imprint lithography Schmitt, H.; Duempelmann, P.; Fader, R.; Rommel, M.; Bauer, A.J.; Frey, L.; Brehm, M.; Kraft, A.	Poster
2011	Light confinement by structured metal tips for antenna-based scanning near-field optical microscopy Jambreck, J.D.; Böhmler, M.; Rommel, M.; Hartschuh, A.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2011	Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	Monolithic RC-snubber for power electronic applications Dorp, Joachim vom; Berberich, Sven E.; Erlbacher, Tobias; Bauer, Anton J.; Ryssel, Heiner; Frey, Lothar	Konferenzbeitrag
2011	Novel polymers for UV-enhanced substrate conformal imprint lithography Fader, R.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.; Ji, R.; Hornung, M.; Brehm, M.; Vogler, M.	Poster
2011	A novel PWM control for a bi-directional full-bridge DC-DC converter with smooth conversion mode transitions Lorentz, V.R.H.; Schwarzmann, H.; März, M.; Bauer, A.J.; Ryssel, H.; Frey, L.; Poure, P.; Braun, F.	Zeitschriftenaufsatz
2011	Oberflächenstrukturieren von metallischen Werkzeugeinsätzen: innovative Designoberflächen durch Laserumschmelzen Bauer, A.	Zeitschriftenaufsatz
2011	Object-event graph matching for complex activity recognition Bauer, Alexander; Fischer, Yvonne	Konferenzbeitrag
2011	Reliability of nitrided gate oxides for N- and P-type 4H-SiC(0001) metal-oxide-semiconductor devices Noborio, M.; Grieb, M.; Bauer, A.J.; Peters, D.; Friedrichs, P.; Suda, J.; Kimoto, T.	Zeitschriftenaufsatz
2011	Run-time security traceability for evolving systems Bauer, A.; Jürjens, J.; Yu, Y.	Zeitschriftenaufsatz
2011	Simple and efficient method to fabricate nano-cone arrays by FIB milling demonstrated on planar substrates and on protruded structures Rommel, M.; Bauer, A.J.; Frey, L.	Poster
2011	Task-oriented sensor management for wide-area surveillance Fischer, Yvonne; Geisler, Jürgen; Bauer, Alexander	Konferenzbeitrag
2011	Traps and trapping phenomena and their implications on electrical behavior of high-k capacitor stacks Paskaleva, A.; Lemberger, M.; Atanassova, E.; Bauer, A.J.	Zeitschriftenaufsatz, Konferenzbeitrag
2011	UV-enhanced substrate conformal imprint lithography using an epoxy based polymer Fader, R.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.; Ji, R.; Hornung, M.; Brehm, M.; Kraft, A.	Poster
2010	Analysis of NbN thin film deposition by plasma-enhanced ALD for gate electrode application Hinz, J.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2010	Characterization of thickness variations of thin dielectric layers at a nanoscale using Scanning Capacitance Microscopy Yanev, V.; Rommel, M.; Bauer, A.J.; Frey, L.	Poster
2010	Comparison of the threshold-voltage stability of SiC MOSFETs with thermally grown and deposited gate oxides Grieb, M.; Noborio, M.; Peters, D.; Bauer, A.J.; Friedrichs, P.; Kimoto, T.; Ryssel, H.	Konferenzbeitrag
2010	Comprehensive study of focused ion beam induced lateral damage in silicon by scanning probe microscopy techniques Rommel, M.; Spoldi, G.; Yanev, V.; Beuer, S.; Amon, B.; Jambreck, J.; Petersen, S.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2010	Context-aware retrieval of learning units Mareth, N.; Streicher, A.; Bauer, A.; Roller, W.	Konferenzbeitrag
2010	Dealing with uncertain feature assessments in interactive object recognition Bauer, A.; Jürgens, V.; Angele, S.	Konferenzbeitrag
2010	Detection and electrical characterization of defects at the SiO2/4H-SiC interface Krieger, M.; Beljakow, S.; Zippelius, B.; Afanas´ev, V.V.; Bauer, A.J.; Nanen, Y.; Kimoto, T.; Pensl, G.	Konferenzbeitrag
2010	Direct imprinting, post processing, and characterization of functional UV-curing materials Schmitt, H.; Kett, F.; Fader, R.; Rommel, M.; Bauer, A.J.; Hornung, M.; Frey, L.	Poster
2010	Effective work function tuning in high-kappa dielectric metal-oxide-semiconductor stacks by fluorine and lanthanide doping Fet, A.; Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Zeitschriftenaufsatz
2010	Electrical and topographical characterization of aluminum implanted layers in 4H silicon carbide Rambach, M.; Bauer, A.J.; Ryssel, H.	Aufsatz in Buch
2010	Electrical characterization and reliability of nitrided-gate insulators for N- and P-type 4H-SiC MIS devices Noborio, M.; Grieb, M.; Bauer, A.J.; Peters, D.; Friedrichs, P.; Suda, J.; Kimoto, T.	Konferenzbeitrag
2010	Electrical scanning probe microscopy techniques for the detailed characterization of high-k dielectric layers Rommel, M.; Yanev, V.; Paskaleva, A.; Erlbacher, T.; Lemberger, M.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2010	Evaluation of NbN thin films grown by MOCVD and plasma-enhanced ALD for gate electrode application in high-k/SiO2 gate stacks Hinz, J.; Bauer, A.J.; Thiede, T.; Fischer, R.A.; Frey, L.	Zeitschriftenaufsatz
2010	Exploiting context for assisted aerial image interpretation Bauer, A.; Herschelmann, O.	Konferenzbeitrag
2010	Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2010	Full wafer microlens replication by UV imprint lithography Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.; Bich, A.; Eisner, M.; Völkel, R.; Hornung, M.	Konferenzbeitrag, Zeitschriftenaufsatz
2010	Honeycomb voids due to ion implantation in germanium Kaiser, R.J.; Koffel, S.; Pichler, P.; Bauer, A.J.; Amon, B.; Claverie, A.; Benassayag, G.; Scheiblin, P.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz, Konferenzbeitrag
2010	Influence of annealing parameters on surface roughness, mobility, and contact resistance of aluminum implanted 4H SiC Schmitt, H.; Häublein, V.; Bauer, A.J.; Frey, L.	Poster
2010	Influence of FIB patterning strategies on the shape of 3D structures: Comparison of experiments with simulations Rommel, M.; Jambreck, J.D.; Ebm, C.; Platzgummer, E.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz, Konferenzbeitrag
2010	Integrierbare Bauelemente zur Erhöhung der Betriebssicherheit elektronischer Systemkomponenten im Automobil Dorp, J. vom; Erlbacher, T.; Lorentz, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2010	Lanthanoid implantation for effective work function control in NMOS high-k/metal gate stacks Fet, A.; Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2010	Lossless average inductor current sensor for CMOS integrated DC-DC converters operating at high frequencies Lorentz, V.R.H.; Berberich, S.E.; März, M.; Bauer, A.J.; Ryssel, H.; Poure, P.; Braun, F.	Zeitschriftenaufsatz
2010	Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.	Poster
2010	Modeling of the effective work function instability in metal/high-kappa dielectric stacks Fet, A.; Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Zeitschriftenaufsatz
2010	Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.	Poster
2010	NMOS logic circuits using 4H-SiC MOSFETs for high temperature applications Le-Huu, M.; Schrey, F.F.; Grieb, M.; Schmitt, H.; Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Konferenzbeitrag
2010	Object-oriented sensor data fusion for wide maritime surveillance Fischer, Y.; Bauer, A.	Konferenzbeitrag
2010	Privacy-aware object representation for surveillance systems Vagts, H.; Bauer, A.	Konferenzbeitrag
2010	Probabilistic scene models for image interpretation Bauer, A.	Konferenzbeitrag
2010	Reduced on resistance in LDMOS devices by integrating trench gates into planar technology Erlbacher, T.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2010	Runtime verification of cryptographic protocols Bauer, A.; Jürjens, J.	Zeitschriftenaufsatz
2010	Silicon carbide and related materials 2009 : Bauer, A.J.; Friedrichs, P.; Krieger, M.; Pensl, G.; Rupp, R.; Seyller, T.	Tagungsband
2010	Task-oriented situation recognition Bauer, A.; Fischer, Y.	Konferenzbeitrag
2010	Trainingsmaßnahme "Führungskraft als Lerncoach" Bauer, Agnes; Hofmann, Josephine; Reiners, Dorothee	Buch
2010	Trainingsmaßnahme "selbst ständig lernen mit META-LL" Bauer, Agnes; Hofmann, Josephine; Reiners, Dorothee	Buch
2010	Trench gate integration into planar technology for reduced on-resistance in LDMOS devices Erlbacher, T.; Rattmann, G.; Bauer, A.J.; Frey, L.	Poster
2010	Trench gate integration into planar technology for reduced on-resistance in LDMOS devices Erlbacher, T.; Rattmann, G.; Bauer, A.J.; Frey, L.	Konferenzbeitrag
2010	Wettbewerbsfähigkeit durch Lernen : Bauer, Agnes; Korge, Axel; Korge, Gabriele; Reiners, Dorothee	Buch
2009	Advanced high-performance liquid chromatography method for highly polar nitroaromatic compounds in ground water samples from ammunition waste sites Preiss, A.; Bauer, A.; Berstermann, H.-M.; Gerling, S.; Haas, R.; Joos, A.; Lehmann, A.; Schmalz, L.; Steinbach, K.	Zeitschriftenaufsatz
2009	Analysis of the DC-arc behavior of a novel 3D-active fuse Dorp, J. vom; Berberich, S.E.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2009	Assisted interpretation of infrastructure facilities from aerial imagery Bauer, A.	Konferenzbeitrag
2009	Comparative study between conventional macroscopic IV techniques and advanced AFM based methods for electrical characterization of dielectrics at the nanoscale Yanev, V.; Erlbacher, T.; Rommel, M.; Bauer, A.J.; Frey, L.	Zeitschriftenaufsatz
2009	Comparative study between conventional macroscopic IV techniques and advanced AFM based methods for electrical characterization of dielectrics at the nanoscale Yanev, V.; Erlbacher, T.; Rommel, M.; Bauer, A.J.; Frey, L.	Poster
2009	Correlation of microscopic and macroscopic electrical characteristics of high-k ZrSixO2-x thin films using tunneling atomic force microscopy Weinreich, W.; Wilde, L.; Kücher, P.; Lemberger, M.; Yanev, V.; Rommel, M.; Bauer, A.J.; Erben, E.; Heitmann, J.; Schröder, U.; Oberbeck, L.	Konferenzbeitrag, Zeitschriftenaufsatz
2009	Decision support to facilitate cost-optimal response in time- and safety-critical situations Ott, Jonathan; Hild, Jutta; Bauer, Alexander	Konferenzbeitrag
2009	Deposition of niobium nitride thin films from Tert-Butylamido-Tris-(Diethylamido)-Niobium by a modified industrial MOCVD reactor Thiede, T.B.; Parala, H.; Reuter, K.; Passing, G.; Kirchmeyer, S.; Hinz, J.; Lemberger, M.; Bauer, A.J.; Barreca, D.; Gasparotto, A.; Fischer, R.A.	Zeitschriftenaufsatz
2009	Effective work function engineering by lanthanide ion implantation of metal-oxide semiconductor gate stacks Fet, A.; Häublein, V.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2009	Electrical characterization of MOS structures with deposited oxides annealed in N2O or NO Grieb, M.; Noborio, M.; Peters, D.; Bauer, A.J.; Friedrichs, P.; Kimoto, T.; Ryssel, H.	Konferenzbeitrag
2009	Experimental observation of FIB induced lateral damage on silicon samples Spoldi, G.; Beuer, S.; Rommel, M.; Yanev, V.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2009	Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L.	Poster
2009	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2008 : Bauer, A.; Flock, S.	Jahresbericht
2009	Full wafer microlens replication by UV imprint lithography Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.; Bich, A.; Eisner, M.; Voelkel, R.; Hornung, M.	Poster
2009	Impact of interface variations on J-V and C-V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1-x)AlxO2 films Weinreich, W.; Reiche, R.; Lemberger, M.; Jegert, G.; Müller, J.; Wilde, L.; Teichert, S.; Heitmann, J.; Erben, E.; Oberbeck, L.; Schröder, U.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2009	Influence of FIB patterning strategies on the shape of 3D structures: Comparison of experiments with simulations Rommel, M.; Jambreck, J.; Ebm, C.; Platzgummer, E.; Bauer, A.; Frey, L.	Poster
2009	Influence of N2 and NH3 annealing on the nitrogen incorporation and k-value of thin ZrO2 layers Weinreich, W.; Ignatova, V.A.; Wilde, L.; Teichert, S.; Lemberger, M.; Bauer, A.J.; Reiche, R.; Erben, E.; Heitmann, J.; Oberbeck, L.; Schröder, U.	Zeitschriftenaufsatz
2009	Influence of the amorphous/crystalline phase of Zr1-xAlxO2 high-k layers on the capacitance performance of metal insulator metal stacks Pakaleva, A.; Lemberger, M.; Bauer, A.J.; Weinreich, W.; Heitmann, J.; Erben, E.; Schröder, U.; Oberbeck, L.	Zeitschriftenaufsatz
2009	Influence of the oxidation temperature and atmosphere on the reliability of thick gate oxides on the 4H-SiC C(000-1) face Grieb, M.; Peters, D.; Bauer, A.J.; Friedrichs, P.; Ryssel, H.	Konferenzbeitrag
2009	Lanthanum implantation for threshold voltage control in metal/high-k devices Fet, A.; Häublein, V.; Bauer, A.J.; Ryssel, H.; Frey, L.	Konferenzbeitrag, Zeitschriftenaufsatz
2009	Light-load efficiency increase in high-frequency integrated DC–DC converters by parallel dynamic width controlling Lorentz, V.; Berberich, S.; März, M.; Bauer, A.; Ryssel, H.; Poure, P.; Braun, F.	Zeitschriftenaufsatz
2009	Object-oriented world model for surveillance systems Bauer, A.; Emter, T.; Vagts, H.; Beyerer, J.	Konferenzbeitrag
2009	Privacy enforcement in surveillance systems Vagts, H.; Bauer, A.; Emter, T.; Beyerer, J.	Konferenzbeitrag
2009	Probabilistic reasoning on object occurrence in complex scenes Bauer, A.	Konferenzbeitrag
2009	Properties of TaN thin films produced using PVD linear dynamic deposition technique Kozlowska, M.; Oechsner, R.; Pfeffer, M.; Bauer, A.J.; Meissner, E.; Pfitzner, L.; Ryssel, H.; Maass, W.; Langer, J.; Ocker, B.; Schmidbauer, S.; Gonchond, J.-P.	Zeitschriftenaufsatz, Konferenzbeitrag
2009	Search for future high-k dielectrics, boundary conditions and examples Bauer, A.J.; Lemberger, M.; Erlbacher, T.; Weinreich, W.	Konferenzbeitrag
2009	Silicon based trench hole power capacitor Berberich, S.E.; Dorp, J. vom; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2009	Suppression of parasitic electron injection in SONOS-type memory cells using high-k capping layers Erlbacher, T.; Graf, T.; DasGupta, N.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2009	UV nanoimprint lithography process optimization for electron device manufacturing on nanosized scale Schmitt, H.; Amon, B.; Beuer, S.; Petersen, S.; Rommel, M.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2008	Custom-specific UV nanoimprint templates and life-time of antisticking layers Schmitt, H.; Zeidler, M.; Rommel, M.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2008	DC-arc behavior of a novel active fuse Dorp, J. vom; Berberich, S.E.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2008	Decision support for object recognition from multi-sensor data Bauer, A.; Geisler, J.	Konferenzbeitrag
2008	Detailed carrier lifetime analysis of iron-contaminated boron-doped silicon by comparison of simulation and measurement Rommel, M.; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2008	Electrical AFM techniques for the advanced characterization of materials in semiconductor technology Yanev, V.; Rommel, M.; Spoldi, G.; Beuer, S.; Amon, B.; Petersen, S.; Lugstein, A.; Steiger, A.; Bauer, A.J.; Ryssel, H.	Poster
2008	Electrical and topographical characterization of aluminum implanted layers in 4H silicon carbide Rambach, M.; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2008	Evaluation of MOCVD grown niobium nitride films as gate electrode for advanced CMOS technology Thiede, T.; Parala, H.; Reuter, K.; Passing, G.; Kirchmeyer, S.; Hinz, J.; Lemberger, M.; Bauer, A.J.; Fischer, R.A.	Konferenzbeitrag
2008	Experimental observation of FIB induced lateral damage on silicon samples Spoldi, G.; Beuer, S.; Rommel, M.; Yanev, V.; Bauer, A.J.; Ryssel, H.	Poster
2008	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2007 : Bauer, A.; Flock, S.	Jahresbericht
2008	HfSiO/SiO2- and SiO2/HfSiO/SiO2-gate stacks for non-volatile memories Erlbacher, T.; Jank, M.P.M.; Lemberger, M.; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2008	High-k: Latest developments and perspectives Bauer, A.J.; Lemberger, M.; Erlbacher, T.; Weinreich, W.	Aufsatz in Buch
2008	Hightech-Materialien für die Elektronik von morgen Jank, M.P.; Bauer, A.J.; Fischer, B.; Slama, A.; Potinecke, T.	Aufsatz in Buch
2008	Improved insight in charge trapping of high-k ZrO2/SiO2 stacks by use of tunneling atomic force microscopy Paskaleva, A.; Yanev, V.; Rommel, M.; Lemberger, M.; Bauer, A.J.	Zeitschriftenaufsatz
2008	Morphological skin ageing criteria by multiphoton laser scanning tomography Koehler, M.J.; Hahn, S.; Preller, A.; Elsner, P.; Ziemer, M.; Bauer, A.; König, K.; Bückle, R.; Fluhr, J.W.; Kaatz, M.	Zeitschriftenaufsatz
2008	N.E.S.T. - Network Enabled Surveillance and Tracking - Towards next generation surveillance systems Bauer, A.; Eckel, S.; Emter, T.; Laubenheimer, A.; Monari, E.; Moßgraber, J.; Reinert, F.	Konferenzbeitrag
2008	Recent improvements in the integration of field emitters into scanning probe microscopy sensors Beuer, S.; Rommel, M.; Petersen, S.; Amon, B.; Sulzbach, T.; Engl, W.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2008	A semantic approach to the efficient integration of interactive and automatic target recognition systems for the analysis of complex infrastructure from aerial imagery Bauer, A.; Peinsipp-Byma, E.	Konferenzbeitrag
2008	SSRM characterisation of FIB induced damage in silicon Beuer, S.; Yanev, V.; Rommel, M.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2008	Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics Yanev, V.; Rommel, M.; Lemberger, M.; Petersen, S.; Amon, B.; Erlbacher, T.; Bauer, A.J.; Ryssel, H.; Paskalev, A.; Weinreich, W.; Fachmann, C.; Heitmann, J.; Schroeder, U.	Zeitschriftenaufsatz
2008	UV nanoimprint lithography process optimization for electron device manufacturing on nanosized scale Schmitt, H.; Amon, B.; Petersen, S.; Rommel, M.; Bauer, A.J.; Ryssel, H.	Poster
2007	Accurate parameter extraction for the simulation of direct structuring by ion beams Beuer, S.; Rommel, M.; Lehrer, C.; Platzgummer, E.; Kvasnica, S.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2007	Chemical vapor deposition of tantalum nitride films for metal gate application using TBTDET and novel single-source MOCVD precursors Lemberger, M.; Baunemann, A.; Bauer, A.J.	Zeitschriftenaufsatz
2007	Custom-specific UV nanoimprint templates and life-time of antisticking layers Schmitt, H.; Zeidler, M.; Rommel, M.; Bauer, A.J.; Ryssel, H.	Poster
2007	Detailed photocurrent analysis of iron contaminated boron doped silicon by comparison of simulation and measurement Rommel, M.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2007	Electrical characterization of low dose focused ion beam induced damage in silicon by scanning spreading resistance microscopy Beuer, S.; Yanev, V.; Rommel, M.; Bauer, A.J.; Ryssel, H.	Poster
2007	Fate of extrahepatic human stem and precursor cells after transplantation into mouse livers Brulport, M.; Schormann, W.; Bauer, A.; Hermes, M.; Elsner, C.; Hammersen, F.J.; Beerheide, W.; Spitkovsky, D.; Härtig, W.; Nussler, A.; Horn, L.C.; Edelmann, J.; Pelz-Ackermann, O.; Petersen, J.; Kamprad, M.; Mach, M. von; Lupp, A.; Zulewski, H.; Hengstler, J.G.	Zeitschriftenaufsatz
2007	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2006 : Bauer, A.; Flock, S.	Jahresbericht
2007	Hafnium silicate as control oxide in non-volatile memories Erlbacher, T.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2007	High temperature implantation of aluminum in 4H silicon carbide Rambach, M.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2007	High voltage 3D-capacitor Berberich, S.E.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2007	MOCVD of hafnium silicate films obtained from a single-source precursor on silicon and germanium for gate-dielectric applications Lemberger, M.; Schön, F.; Dirnecker, T.; Jank, M.P.M.; Frey, L.; Ryssel, H.; Paskaleva, A.; Zürcher, S.; Bauer, A.J.	Zeitschriftenaufsatz
2007	MOCVD of TaN Using the All-Nitrogen-Coordinated Precursors [Ta(NEtMe)3(N-tBu)], [Ta(NEtMe)(N-tBu){C(N-iPr)2(NEtMe)}2] and [Ta(NMeEt)2(N-tBu){Me2N-N(SiMe3)}] Baunemann, A.; Lemberger, M.; Bauer, A.J.; Parala, H.; Fischer, R.A.	Zeitschriftenaufsatz
2007	MOCVD of tantalum nitride thin films from TBTEMT single source precursor as metal electrodes in CMOS applications Lemberger, M.; Thiemann, S.; Baunemann, A.; Parala, H.; Fischer, R.A.; Hinz, J.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2007	Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers Paskaleva, A.; Lemberger, M.; Bauer, A.J.	Zeitschriftenaufsatz
2007	Quantitative oxide charge determination by photocurrent analysis Rommel, M.; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2007	Recent improvements in the integration of field emitters into scanning probe microscopy sensors Beuer, S.; Rommel, M.; Petersen, S.; Amon, B.; Sulzbach, T.; Engl, W.; Bauer, A.J.; Ryssel, H.	Poster
2007	Stress induced leakage current mechanism in thin Hf-silicate layers Paskaleva, A.; Lemberger, M.; Bauer, A.J.	Zeitschriftenaufsatz
2007	Thermal stability of thin ALD ZrO2 layers as dielectrics in deep trench DRAM devices annealed in N2 and NH3 Weinreich, W.; Lemberger, M.; Erben, E.; Heitmann, J.; Wilde, L.; Ignatova, V.A.; Teichert, S.; Schröder, U.; Oberbeck, L.; Bauer, A.J.; Ryssel, H.; Kücher, P.	Poster
2007	Verification of grain boundaries in annealed thin ZrO2 films by electrical AFM technique Yanev, V.; Paskaleva, A.; Weinreich, W.; Lemberger, M.; Petersen, S.; Rommel, M.; Bauer, A.J.; Ryssel, H.	Poster
2006	Accurate parameter extraction for the simulation of direct structuring by ion beams Beuer, S.; Rommel, M.; Lehrer, C.; Platzgummer, E.; Kvasnica, S.; Bauer, A.J.; Ryssel, H.	Poster
2006	Active Fuse Berberich, S.E.; März, M.; Bauer, A.J.; Beuer, S.; Ryssel, H.	Konferenzbeitrag
2006	Correlation between defects, leakage currents and conduction mechanisms in thin high-k dielectric layers Paskaleva, A.; Atanassova, E.; Lemberger, M.; Bauer, A.J.	Konferenzbeitrag
2006	Extracting activation and compensation ratio from aluminum implanted 4H-SiC by modeling of resistivity measurements Rambach, M.; Frey, L.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2006	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2005 : Bauer, A.; Flock, S.	Jahresbericht
2006	High temperature implantation of aluminum in 4H silicon carbide Rambach, M.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2006	Mercury-free cure shrinkage and thermal expansion measurements Chowdhury, Y.; Bauer, A.; Müller, J.; Bauer, M.	Konferenzbeitrag
2006	Stress induced leakage currents and charge trapping in thin Zr- and Hf-silicate layers Paskaleva, A.; Lemberger, M.; Bauer, A.J.	Konferenzbeitrag
2006	Systematic interpretation of microarray data using experiment annotations Fellenberg, K.; Busold, C.H.; Witt, O.; Bauer, A.; Beckmann, B.; Hauser, N.C.; Frohme, M.; Winter, S.; Dippon, J.; Hoheisel, J.D.	Zeitschriftenaufsatz
2005	Annealing of aluminum implanted 4H-SiC Rambach, M.; Bauer, A.J.; Frey, L.; Friedrichs, P.; Ryssel, H.	Konferenzbeitrag
2005	An asymmetry of conduction mechanisms and charge trapping in thin high-k Hf(x)Ti(y)Si(z)O films Paskaleva, A.; Bauer, A.J.; Lemberger, M.	Zeitschriftenaufsatz
2005	Characterization of interface state densities by photocurrent analysis. Comparison of results for different insulator layers Rommel, M.; Groß, M.; Ettinger, A.; Bauer, A.J.; Frey, L.; Ryssel, H.	Poster
2005	Characterization of interface state densities by photocurrent analysis: Comparison of results for different insulator layers Rommel, M.; Groß, M.; Ettinger, A.; Lemberger, M.; Bauer, A.J.; Frey, L.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2005	Chemische Dampfphasenabscheidung von neuen Materialien für Sub-50-nm-Transistoren Frey, L.; Bauer, A.; Ryssel, H.	Zeitschriftenaufsatz
2005	Chemistry of mixed ligand all nitrogen coordinated Ta, Hf, and W precursors for metal nitride MOCVD Baunemann, A.; Rische, D.; Kim, Y.; Parala, H.; Bauer, A.J.; Lemberger, M.; Fischer, R.A.	Poster
2005	Conduction mechanisms and an evidence for phonon-assisted conduction process in thin high-k Hf(x)Ti(y)Si(z)O films Paskaleva, A.; Bauer, A.; Lemberger, M.	Zeitschriftenaufsatz
2005	Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor Lemberger, M.; Paskaleva, A.; Zurcher, S.; Bauer, A.J.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz, Konferenzbeitrag
2005	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2004 : Bauer, A.; Flock, S.	Jahresbericht
2005	High-k hafnium silicate films on silicon and germanium wafers by MOCVD using a single-source precursor Lemberger, M.; Schön, F.; Dirnecker, T.; Jank, M.P.M.; Paskaleva, A.; Bauer, A.J.; Frey, L.; Ryssel, H.	Konferenzbeitrag
2005	Implantation and annealing of aluminum in 4H silicon carbide Rambach, M.; Frey, L.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2005	Integration of GO annotations in correspondence analysis: Facilitating the interpretation of microarray data Busold, C.H.; Winter, S.; Hauser, N.C.; Bauer, A.; Dippon, J.; Hoheisel, D.; Fellenberg, K.	Zeitschriftenaufsatz
2005	MOCVD of conductive cubic HfN thin films from Hf(NR2)4 and N,N-dimethylhydrazine Kim, Y.; Parala, H.; Bauer, A.J.; Lemberger, M.; Baunemann, A.; Fischer, R.A.	Konferenzbeitrag
2005	MOCVD of cunductive cubic HfN thin films from Hf(NR2)4 and N,N-dimethylhydrazine Kim, Y.; Parala, H.; Bauer, A.J.; Lemberger, M.; Baunemann, A.; Fischer, R.A.	Konferenzbeitrag
2005	Thin Hf(x)Ti(y)Si(z)O films with varying Hf to Ti contents as candidates for high-k dielectrics Bauer, A.J.; Paskaleva, A.; Lemberger, M.; Frey, L.; Ryssel, H.	Konferenzbeitrag
2005	Triple trench gate IGBTs Berberich, S.E.; Bauer, A.J.; Frey, L.; Ryssel, H.	Konferenzbeitrag
2005	Wafer scale characterization of interface state densities without test structures by photocurrent analysis Rommel, M.; Groß, M.; Frey, L.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2004	Different current conduction mechanisms through thin high-k Hf(x)Ti(y)Si(z)O films due to the varying Hf to Ti ratio Paskaleva, A.; Bauer, A.J.; Lemberger, M.; Zurcher, S.	Zeitschriftenaufsatz
2004	Electrical characterization and reliability aspects of zirconium silicate films obtained from novel MOCVD precursors Lemberger, M.; Paskaleva, A.; Zurcher, S.; Bauer, A.J.; Frey, L.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2004	Electrical properties and conduction mechanisms in Hf(x)Ti(y)Si(z)O films obtained from novel MOCVD precursors Paskaleva, A.; Lemberger, M.; Zürcher, S.; Bauer, A.J.	Konferenzbeitrag
2004	Evaluation von Wissensbewertungsmethoden für lernende Softwareorganisationen Bauer, A. : Rombach, H.D.; Rech, J.	Bericht
2004	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2003 : Bauer, A.; Flock, S.	Jahresbericht
2004	Investigation of rapid thermal annealed pn-junctions in SiC Rambach, M.; Weiss, R.; Frey, L.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2003	Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors Lemberger, M.; Paskaleva, A.; Zürcher, S.; Bauer, A.J.; Frey, L.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2003	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2002 : Bauer, A.; Loosen, P.; Flock, S.	Jahresbericht
2003	Hafnium titanium silicate high-k dielectric films deposited by MOCVD using novel single source precursors Zürcher, S.; Morstein, M.; Lemberger, M.; Bauer, A.J.	Konferenzbeitrag
2003	Influence of antenna shape and resist patterns on charging damage during ion implantation Dirnecker, T.; Bauer, A.J.; Beyer, A.; Frey, L.; Henke, D.; Ruf, A.; Ryssel, H.	Konferenzbeitrag
2003	Investigation of implantation-induced defects in thin gate oxides using low field tunnel currents Jank, M.; Frey, L.; Bauer, A.J.; Ryssel, H.	Konferenzbeitrag
2003	Surface properties and electrical characteristics of rapid thermal annealed 4H-SiC Bauer, A.J.; Rambach, M.; Frey, L.; Weiss, R.; Rupp, R.; Friedrichs, P.; Schörner, R.; Peters, D.	Konferenzbeitrag
2003	Trench sidewall doping for lateral power devices Berberich, S.E.; Bauer, A.J.; Frey, L.; Ryssel, H.	Konferenzbeitrag
2003	Zirconium silicate films obtained from novel MOCVD precursors Lemberger, M.; Paskaleva, A.; Zürcher, S.; Bauer, A.J.; Frey, L.; Ryssel, H.	Konferenzbeitrag, Zeitschriftenaufsatz
2002	Effect of barium contamination on gate oxide integrity in high-k DRAM Boubekeur, H.; Mikolajick, T.; Nagel, N.; Bauer, A.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz
2002	Fraunhofer-Institut für Lasertechnik. Leistungen und Ergebnisse. Jahresbericht 2001 : Poprawe, R.; Bauer, A.; Croll, A.	Jahresbericht
2002	Influence of photoresist pattern on charging damage during high current ion implantation Dirnecker, T.; Ruf, A.; Frey, L.; Beyer, A.; Bauer, A.J.; Henke, D.; Ryssel, H.	Konferenzbeitrag
2002	Lagermodellierung für logistische Netze: Das "modulare Knotenmodell" als Konzept zur dynamischen Abbildung von Lagern in Netzen Bauer, A.	Dissertation
2002	Long distance traffic networks Bauer, A.	Zeitschriftenaufsatz
2002	MOCVD of titanium dioxide on the basis of new precursors Leistner, T.; Lehmbacher, K.; Härter, P.; Schmidt, C.; Bauer, A.J.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz
2002	New single-source precursors for the MOCVD of high-kappa dielectric zirconium silicates to replace SiO2 in semiconducting devices Zürcher, S.; Morstein, M.; Spencer, N.D.; Lemberger, M.; Bauer, A.	Zeitschriftenaufsatz
2002	Wie der richtige Standort gefunden wird, ohne die Folgekosten zu vergessen Bauer, A.	Zeitschriftenaufsatz
2001	5. Workshop Föderierte Datenbanken (FDBS 2001) und GI-Arbeitstreffen "Konzepte des Data Warehousing". Proceedings Bauer, A.; Busse, S.; Kutsche, R.-D.; Lehner, W.	Tagungsband
2001	Barium, strontium and bismuth contamination in CMOS processes Boubekeur, H.; Mikolajick, T.; Höpfner, J.; Dehm, C.; Pamler, W.; Steiner, J.; Kilian, G.; Kolbesen, B.O.; Bauer, A.; Frey, L.; Ryssel, H.	Konferenzbeitrag
2001	Electrical reliability aspects of through the gate implanted MOS-structures with thin oxides Jank, M.; Lemberger, M.; Bauer, A.J.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz
2001	Hybrid polymer/silica vertical coupler switches Keil, N.; Yao, H.H.; Zawadzki, C.; Lösch, K.; Satzke, K.; Wischmann, W.; Wirth, J. von; Schneider, J.; Bauer, A.; Bauer, J.; Bauer, M.	Konferenzbeitrag
2001	Impact of platinum contamination on ferroelectric memories Boubekeur, H.; Mikolajick, T.; Nagel, N.; Dehm, C.; Pamler, W.; Bauer, A.; Frey, L.; Ryssel, H.	Zeitschriftenaufsatz
2001	New precursors for MOCVD of high-k metal silicates as alternative to SiO2 in semiconducting devices Zürcher, S.; Morstein, M.; Bauer, A.J.; Lemberger, M.	Poster
2001	Reliability of ultra-thin N2O-nitrided oxides grown by RTP under low-pressure in different gas atmospheres Beichele, M.; Bauer, A.J.; Herden, M.; Ryssel, H.	Zeitschriftenaufsatz
2001	Reliability of ultrathin nitrided oxides grown in low- pressure N2O ambient Beichele, M.; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2001	Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode Herden, M.; Bauer, A.J.; Beichele, M.; Ryssel, H.	Zeitschriftenaufsatz
2001	Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode in PMOS devices Strobel, S.; Bauer, A.J.; Beichele, M.; Ryssel, H.	Zeitschriftenaufsatz
2000	Mechanische Charakterisierung von Polymeren Bauer, A.	Zeitschriftenaufsatz
2000	Reliability of ultra-thin N2O-nitrided oxides grown by RTP under low pressure and in different gas atmospheres Beichele, M.; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2000	Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode of PMOS devices Herden, M.; Bauer, A.J.; Ryssel, H.	Zeitschriftenaufsatz
2000	Triazine based Dendrimers Dreyer, C.; Blume, A.; Bauer, A.; Bauer, M.; Neumann-Rodekirch, J.	Konferenzbeitrag
1999	Characterization of oxide etching and wafer cleaning using vapor phase anhydrous hydrofluoric acid and ozone Bauer, A.J.; Froeschle, B.; Beichele, M.; Ryssel, H.	Konferenzbeitrag
1999	Einführung einer neuen Produktionstechnologie Westkämper, E.; Bauer, A.; Zahn, A.	Zeitschriftenaufsatz
1999	Forming nitrided gate oxides by nitrogen implantation into the substrate before gate oxidation by RTO Bauer, A.J.; Mayer, P.; Frey, L.; Häublein, V.; Ryssel, H.	Konferenzbeitrag
1999	Impact of nitrogen implantation into polysilicon to reduce boron penetration through the gate oxide Bauer, A.J.; Mayer, P.; Frey, L.; Häublein, V.; Ryssel, H.	Konferenzbeitrag
1999	Reliability of ultra-thin gate oxides grown in low-pressure N20 ambient or on nitrogen-implanted silicon Bauer, A.J.; Beichele; Herden, M.; Ryssel, H.	Konferenzbeitrag
1998	4 nm gate dielectrics prepared by RTP low pressure oxidation in O2 and N2O atmosphere Bauer, A.J.; Burte, E.P.; Ryssel, H.	Zeitschriftenaufsatz
1998	Contacting fine pitch SMT components with anisotropic or non-filled adhesives Gesang, T.; Schäfer, H.; Hennemann, O.-D.; Harder, T.; Bornholdt, O.; Bauer, A.	Konferenzbeitrag
1998	Flexible Cellulosefasern mit reduziertem Modul und vermindertem NMR-Ordnungsgrad und deren Herstellung Weigel, P.; Gensrich, J.; Frigge, K.; Wagenknecht, W.; Bauer, A.	Patent
1998	Die mechanische Charakterisierung von Polymeren und verstärkten Polymeren Bauer, A.; Ganster, J.	Konferenzbeitrag
1998	Schnelle thermische Niederdruckoxidation Bauer, A.J.	Konferenzbeitrag
1997	Characterization of oxide etching and wafer cleaning using vapor-phase anhydrous HF and ozone Froeschle, B.; Deutschmann, L.; Bauer, A.J.; Burte, E.P.	Konferenzbeitrag
1997	Characterization of ultrathin on stacked layers consisting of thermally grown bottom oxide and deposited silicon nitride Bauer, A.J.; Burte, E.P.; Ryssel, H.	Zeitschriftenaufsatz
1997	Cleaning process optimization in a gate oxide cluster tool using an in-line XPS module Froeschle, B.; Glowacki, F.; Bauer, A.J.; Kasko, I.; Öchsner, R.; Schneider, C.	Konferenzbeitrag
1997	Electrically conductive contacting fine-pinch devices with unfilled adhesive Gesang, T.; Schäfer, H.; Hennemann, O.-D.; Bauer, A.; Bornholdt, O.; Harder, T.	Zeitschriftenaufsatz
1997	Elektrisch leitfähiges Kontaktieren von Fine-Pinch-Bauelementen mit nicht-gefüllten Klebstoffen Gesang, T.; Schäfer, H.; Hennemann, O.-D.; Bauer, A.; Bornhold, O.; Harder, T.	Zeitschriftenaufsatz
1997	Elektrisch leitfähiges Kontaktieren von Fine-Pinch-Bauelementen mit nicht-gefüllten Klebstoffen Gesang, T.; Schäfer, H.; Hennemann, O.-D.; Bauer, A.; Bornhold, O.; Harder, T.	Zeitschriftenaufsatz
1997	Integrated vapor-phase cleaning and pure NO nitridation for gate stack formation Glowacki, F.; Froeschle, B.; Deutschmann, L.; Sagnes, I.; Laviale, D.; Bensahel, D.; Galimaoui, A.; Martin, F.; Bauer, A.J.	Konferenzbeitrag
1997	Laserresonator für Laser-Medien mit ringförmigem Querschnitt Habich, U.; Du, K.; Bauer, A.; Plum, H.D.; Loosen, P.	Patent
1997	Die mechanische Charakterisierung von Polymeren und Metall-Polymer-Verbunden, experimentelle Probleme und theoretische Hintergründe Bauer, A.; Ganster, J.	Konferenzbeitrag
1997	Möglichkeiten und Grenzen eines Virtual Reality (VR) Trainingssimulators für die chirurgische Ausbildung Müller, W.K.; Bauer, A.; Soldner, E.H.; Ziegler, R.	Konferenzbeitrag
1997	Präzisionsdispensen von Leitklebstoff: Erfahrungen im industriellen Umfeld Bauer, A.; Novotny, M.; Schwaab, G.; Gramann, U.	Konferenzbeitrag
1997	Vom Exoten zum Standardwerkzeug Poprawe, R.; Loosen, P.; Gillner, A.; Bauer, A.	Zeitschriftenaufsatz
1996	Characterization of ultrathin on stacked layers consisting of thermally grown bottom oxide and deposited silicon nitride Bauer, A.J.; Burte, E.P.; Ryssel, H.	Zeitschriftenaufsatz
1996	Grenzdehnung von Polymeren und mechanische Eigenschaften charakterisierender Strukturparameter Bauer, A.	Konferenzbeitrag
1996	High quality 4 nm gate dielectrics prepared at low pressure in oxygen oxide atmospheres Bauer, A.J.; Burte, E.P.	Konferenzbeitrag
1996	Das Mehrschichtverbundsystem Leiterplatte. Wichtige Einflußparameter auf die Anwendungseigenschaften. Teil 1. Einflüsse durch Klebstofftyp und Feuchte bei Lagerung Bauer, A.; Bischof, C.	Zeitschriftenaufsatz
1996	Das Mehrschichtverbundsystem Leiterplatte. Wichtige Einflußparameter auf die Anwendungseigenschaften. Teil 2 Bauer, A.; Bischof, C.	Zeitschriftenaufsatz
1996	Virtual Reality in the surgical arthroscopic training Bauer, A.; Soldner, E.H.; Ziegler, R.; Müller, W.K.	Konferenzbeitrag
1996	Virtual Reality in the surgical arthroscopical training Bauer, A.; Soldner, E.H.; Ziegler, R.; Müller, W.K.	Konferenzbeitrag
1995	4 nm gate dielectrics prepared by RTP low pressure oxidation in O2 and N2O atmosphere Bauer, A.J.; Burte, E.P.; Ryssel, H.	Konferenzbeitrag
1995	Schnelle thermische Prozessierung und Charakterisierung dünner nitridierter Oxide Bauer, A.J.	Dissertation
1995	Das Spannungs-Dehnungs-Verhalten der Polymerschichten im Metall-Polymer-Verbund Bauer, A.	Konferenzbeitrag
1995	Structural and electrical properties of thin SiO2 layers grown by RTP in a mixture of N2O and O2 Bauer, A.J.; Burte, E.P.	Zeitschriftenaufsatz
1995	Virtual Reality in the surgical arthroscopical training Bauer, A.; Soldner, E.H.; Ziegler, R.; Müller, W.K.	Konferenzbeitrag
1994	Successful transfer of key technologies from research centres into industry Bauer, A.	Aufsatz in Buch
1991	Resonators for coaxial slow-flow-CO2 lasers Habich, U.; Bauer, A.; Plum, H.-D.	Konferenzbeitrag
1990	Multipass-resonators for compact CO2-lasers. Bauer, A.; Märten, O.	Konferenzbeitrag
1989	Endothelial cells are a major source of gastric mucosal PGE2-synthesis in Guinea pigs Schwenk, M.; Bauer, A.; Pfaff, T.; Radziejowsky, I.; Sewing, K.-F.; Thiedemann, K.-U.	Konferenzbeitrag
1985	Rationelle Datenverarbeitung mit Mikrocomputer auch in kleinen Betrieben Bauer, A.; Kaempf, R.; Kuehnle, H.	Zeitschriftenaufsatz