Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020Comparing Microwave Detected Photoconductance, Quasi Steady State Photoconductance and Photoluminiscence Imaging for Iron Analysis in Silicon
Pengerla, M.; Al-Hajjawi, S.; Kuruganti, V.; Haunschild, J.; Schüler, N.; Dornich, K.; Rein, S.
Konferenzbeitrag
2019Non-Destructive Approach for Measuring Base Resistivity of Emitter-Diffused, Partially-Processed Wafers Using Temperature-Stage QSSPC
Kuruganti, V.; Haunschild, J.; Brand, A.; Al-Hajjawi, S.; Rein, S.; Glunz, S.W.
Konferenzbeitrag
2018Inline Wafer Identification Using Optical Character Recognition (OCR)
Al-Hajjawi, S.; Hammer, T.; Haunschild, J.
Konferenzbeitrag
2017Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers
Al-Hajjawi, S.; Haunschild, J.; Zimmer, M.; Dannenberg, T.; Preu, R.
Konferenzbeitrag, Zeitschriftenaufsatz