Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. | | |
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| 2020 | Comparing Microwave Detected Photoconductance, Quasi Steady State Photoconductance and Photoluminiscence Imaging for Iron Analysis in Silicon
Pengerla, M.; Al-Hajjawi, S.; Kuruganti, V.; Haunschild, J.; Schüler, N.; Dornich, K.; Rein, S. | Konferenzbeitrag |
| 2019 | Non-Destructive Approach for Measuring Base Resistivity of Emitter-Diffused, Partially-Processed Wafers Using Temperature-Stage QSSPC
Kuruganti, V.; Haunschild, J.; Brand, A.; Al-Hajjawi, S.; Rein, S.; Glunz, S.W. | Konferenzbeitrag |
| 2018 | Inline Wafer Identification Using Optical Character Recognition (OCR)
Al-Hajjawi, S.; Hammer, T.; Haunschild, J. | Konferenzbeitrag |
| 2017 | Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers
Al-Hajjawi, S.; Haunschild, J.; Zimmer, M.; Dannenberg, T.; Preu, R. | Konferenzbeitrag, Zeitschriftenaufsatz |