Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
1997Ellipsometrisches Messverfahren
Zuber, A.
Patent
1996Perpendicular-incidence photometric ellipsometry of biaxial anisotropic thin films
Kaiser, N.; Zuber, A.; Jänchen, H.
Journal Article
1995Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
Zuber, A.; Kaiser, N.; Stehle, J.L.
Journal Article
1994Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
Kaiser, N.; Zuber, A.; Stehle, J.L.
Conference Paper
1993Evaluation of thin MgF2 films by spectroscopic ellipsometry
Kaiser, N.; Zuber, A.; Kaiser, U.
Journal Article