Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2000Critical issues on the assessment of laser induced damage thresholds of fluoride multilayer coatings at 193 nm
Thielsch, R.; Heber, J.; Kaiser, N.; Martin, S.; Welsch, E.
Conference Paper
2000Pulsed top-hat beam thermal lens: a simple and sensitive tool for in situ measurement on ultraviolet dielectric components
Li, B.C.; Martin, S.; Welsch, E.; Thielsch, R.; Heber, J.; Kaiser, N.
Conference Paper
1999Influence of thermal substrate properties on the damage threshold of UV coatings
Blaschke, H.; Martin, S.; Morak, A.; Königsdörfer, C.; Roth, M.; Bincheng, L.; Welsch, E.; Thielsch, R.; Kaiser, N.
Conference Paper
1999Laser resistivity and causes of damage in coating materials for 193 nm by photothermal methods
Blaschke, H.; Thielsch, R.; Heber, J.; Kaiser, N.; Martin, S.; Welsch, E.
Conference Paper
1997Investigation of the absorption induced damage in ultraviolet dielectric thin films
Welsch, E.; Ettrich, K.; Blaschke, H.; Schäfer, D.; Kaiser, N.; Thomsen-Schmidt, P.
Journal Article
1996Excimer laser interaction with dielectric thin films
Kaiser, N.; Welsch, E.; Ettrich, K.; Blaschke, H.
Journal Article
1996Interaction of UV-laser-radiation with dielectric thin films
Kaiser, N.; Welsch, E.; Ettrich, K.; Blaschke, H.; Schäfer, D.; Thomsen-Schmidt, P.
Journal Article
1994Micrometer resolved inspection of defects and laser damage sites in UV high-reflecting coatings by photothermal displacement microscopy
Kaiser, N.; Bodemann, A.; Reichling, M.; Welsch, E.
Journal Article
1994Photothermal absorption microscopy of defects in ZrO2 and MgF2 single-layer films
Duparre, A.; Reichling, M.; Welsch, E.; Matthias,E.
Journal Article
1994Photothermal microscopy of defects and laser damage morphology in Al2O3/SiO2 dielectric mirror coatings for 248 nm
Kaiser, N.; Reichling, M.; Bodemann, A.; Welsch, E.
Conference Paper
1993Laterally and depth resolved photothermal absorption measurements on ZrO2 and MgF2 single-layer films
Reichling, M.; Welsch, E.; Duparre, A.; Matthias, E.
Conference Paper